Prosecution Insights
Last updated: April 19, 2026
Application No. 19/199,586

SCANNING SIGNAL LINE DRIVE CIRCUIT AND DISPLAY DEVICE PROVIDED WITH SAME

Non-Final OA §102
Filed
May 06, 2025
Examiner
MA, CALVIN
Art Unit
2629
Tech Center
2600 — Communications
Assignee
Sharp Display Technology Corporation
OA Round
1 (Non-Final)
76%
Grant Probability
Favorable
1-2
OA Rounds
2y 8m
To Grant
89%
With Interview

Examiner Intelligence

Grants 76% — above average
76%
Career Allow Rate
551 granted / 728 resolved
+13.7% vs TC avg
Moderate +14% lift
Without
With
+13.5%
Interview Lift
resolved cases with interview
Typical timeline
2y 8m
Avg Prosecution
17 currently pending
Career history
745
Total Applications
across all art units

Statute-Specific Performance

§101
1.8%
-38.2% vs TC avg
§103
60.8%
+20.8% vs TC avg
§102
32.1%
-7.9% vs TC avg
§112
2.2%
-37.8% vs TC avg
Black line = Tech Center average estimate • Based on career data from 728 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Allowable Subject Matter Claims 2-5 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Claim Rejections - 35 USC § 102 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(2) the claimed invention was described in a patent issued under section 151, or in an application for patent published or deemed published under section 122(b), in which the patent or application, as the case may be, names another inventor and was effectively filed before the effective filing date of the claimed invention. Claims 1 and 6-9 are rejected under 35 U.S.C. 102(a)(2) as being anticipated by Lin et al. (US Pub: 2005/0104836 A1). As to claim 1, Lin discloses a scanning signal line drive circuit configured to drive a plurality of scanning signal lines arranged in a display portion of a display device (i.e. as seen in figure 3a and 6, Lin shows element 10 scanning driver being integrated on the TFT type LCD display where the display pixel area 1 is arranged along the G1 … Gn scanning signal lines) (see Fig. 6, 3a, [0043-0046]), the scanning signal line drive circuit comprising: a plurality of unit circuits connected in cascade to form a shift register (i.e. the shift register as demonstrated in figure 5a is said to be part of the display driving system of figure 6) (see Fig. 5a, 6, [0034-0046]), wherein each unit circuit is configured to determine a state of the unit circuit based on a set signal and a reset signal provided as input signals (i.e. as seen in figure 5a the shift register of Lin uses the SR set reset design) (see Fig. 5a, [0034-0042]), and includes an internal node configured to selectively hold voltages of first and second logic levels indicating states of each unit circuit (i.e. the internode Q as seen in figure 3A which serves as the control node) (see Fig. 3a) (see Fig. 3a, [0028-0031]), a set circuit configured to apply a voltage of the first logic level to the internal node when the set signal is active (i.e. the set circuit is the circuit as seen in figure 3a including P3 and P1 which allows the IN set input to apply a voltage VDD to the internal node Q) (see Fig. 3a, [0028-0031]), and a reset circuit configured to apply a voltage of the second logic level to the internal node when the reset signal is active (i.e. the reset circuit is the circuit shown in figure 3a which include P4 and P2 which apply a second logic level as the reset function in the SR register node implies) (see Fig. 3a, [0028-0031]), the reset circuit includes a reset transistor including a drain terminal connected to the internal node (i.e. the transistor P4 has a drain terminal that is connected to internal node Q via P2 and P5) (see Fig. 3a, [0028-0031]), a source terminal, and a gate terminal to which the reset signal is supplied (i.e. P4 is gate connected to RESET signal line) (see Fig. 3a, [0028-0031]), and the shift register is configured such that, in each unit circuit, a voltage signal is supplied to the source terminal of the reset transistor as a reset state voltage signal (i.e. as seen in figure 3a and 5a the SR register of Lin is designed to function in the waveform state of figure 3B which allow the SR register to properly store states) (see Fig. 3a, 3b, 5a, [0028-0042]), the voltage signal maintaining an active voltage level corresponding to an active state of the reset signal when the reset signal changes from an inactive state to an active state (i.e. as seen in figure 3b the voltage signal is maintained in the state) (see Fig. 3a 3b, [0028-0032]), and changing from the active voltage level to the second logic level before the reset signal changes from the active state to the inactive state (i.e. as seen in figure 3b the state table shows that change in the output from active level of high to the second level during the reset signal change from high to low) (see Fig. 3b, [0032]). As to claim 6, Lin teaches the scanning signal line drive circuit according to claim 1, wherein the set circuit includes a transistor of a diode connection configuration including a drain terminal and a gate terminal that are supplied with the set signal and including a source terminal connected to the internal node (i.e. as seen in figure 3A the transistor P3 is diode connected and apply control to the internal node Q) (see Fig. 3A, [0028-0031]). As to claim 7, Lin teaches the scanning signal line drive circuit according to claim 1, wherein the reset transistor is a thin film transistor (i.e. the transistor of Lin are all said to be TFT in structure) (see Fig. 3a, [0028]). As to claim 8, Lin teaches the scanning signal line drive circuit according to claim 7, wherein the reset transistor is a thin film transistor including a channel layer formed of an oxide semiconductor (i.e. as seen in figure 3A the transistor of Lin is said to be of MOS design with is a metal oxide type with channel layer formed of an oxide semiconductor) (see Fig. 3a, [0028]). As to claim 9, Lin teaches a display device comprising the scanning signal line drive circuit according to claim 1, wherein the scanning signal line drive circuit and the display portion are integrally formed on an identical substrate (i.e. as seen in figure 6 embodiment Lin the TFT integrated type of display substrate design shows that the circuitry and display area are of identical TFT implementation where a singular base substrate is applied) (see Fig. 6, [0043-0046]). Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. The prior art Enami (US Patent 10,199,001 B2) is cited to teach another type of TFT display with active control elements in figure 1-3 embodiments. The prior art Nishi et al. (US Pub: 2022/0189409 A1) is cited to teach integrate TFT display with scanning line control as seen in figure 1-6 embodiments. Any inquiry concerning this communication or earlier communications from the examiner should be directed to CALVIN C. MA whose telephone number is (571)270-1713. The examiner can normally be reached 8:00AM-5:00PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Benjamin C. Lee can be reached on 571-272-2963. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /CALVIN C MA/Primary Examiner, Art Unit 2693 January 24, 2026
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Prosecution Timeline

May 06, 2025
Application Filed
Jan 24, 2026
Non-Final Rejection — §102 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
76%
Grant Probability
89%
With Interview (+13.5%)
2y 8m
Median Time to Grant
Low
PTA Risk
Based on 728 resolved cases by this examiner. Grant probability derived from career allow rate.

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