Prosecution Insights
Last updated: August 17, 2026
Application No. 19/251,693

TEMPERATURE SENSOR CIRCUITS AND CONTROL CIRCUITS AND METHOD FOR TEMPERATURE SENSOR CIRCUITS

Non-Final OA §102§DP
Filed
Jun 26, 2025
Priority
May 26, 2022 — provisional 63/365,330 +2 more
Examiner
O NEILL, PATRICK
Art Unit
2842
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Taiwan Semiconductor Manufacturing Company, Ltd.
OA Round
1 (Non-Final)
83%
Grant Probability
Favorable
1-2
OA Rounds
10m
Est. Remaining
99%
With Interview

Examiner Intelligence

Grants 83% — above average
83%
Career Allowance Rate
481 granted / 577 resolved
+15.4% vs TC avg
Strong +18% interview lift
Without
With
+17.5%
Interview Lift
resolved cases with interview
Fast prosecutor
2y 0m
Avg Prosecution
14 currently pending
Career history
585
Total Applications
across all art units

Statute-Specific Performance

§101
1.4%
-38.6% vs TC avg
§103
28.7%
-11.3% vs TC avg
§102
35.9%
-4.1% vs TC avg
§112
26.3%
-13.7% vs TC avg
Black line = Tech Center average estimate • Based on career data from 577 resolved cases

Office Action

§102 §DP
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claims 1-5, 8 and 15 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Sato et al. (US Pub. No. 2019/0113393). a) regarding claim 1: Sato et al. discloses a temperature sensing circuit (Figure 7), comprising: a temperature sensor (702); and a control circuit (703) coupled to the temperature sensor and comprising: a sampling circuit coupled to the temperature sensor and configured to obtain a first voltage information and a second voltage information from the temperature sensor (paragraph [0046], “In this manner the first and second sample and hold capacitors are charged to the voltages at node 710 when currents I1 and I2 flow through stand 702, respectively.”); and a computing circuit coupled to the sampling circuit and configured to generate a sensing result corresponding to a difference between the second voltage information and the first voltage information (paragraph [0046], “The first and second sample and hold capacitors can be connected to respective inputs of the differential amplifier, so that the differential amplifier generates analog Vout as a difference between the voltages held by the first and second sample and hold capacitors, respectively. An ADC can be provided that generates a digital equivalent of Vout for subsequent processing by a CPU to yield a digital value for T based on equation (3) above.”). b) regarding claim 2: Sato et al. discloses the temperature sensing circuit of claim 1, wherein the temperature sensor comprises a diode connected bipolar junction transistor (BJT) (206). c) regarding claim 3: Sato et al. discloses the temperature sensing circuit of claim 2, wherein the first voltage information and the second voltage information comprise voltage differences across the diode connected BJT when a first current and a second current are respectively provided to the temperature sensor in different time periods (paragraph [0046]). d) regarding claim 4: Sato et al. discloses the temperature sensing circuit of claim 1, wherein a voltage level of the sensing result corresponds to a temperature sensed by the temperature sensor (paragraph [0046]). e) regarding claim 5: Sato et al. discloses the temperature sensing circuit of claim 1, wherein the computing circuit comprises a voltage subtractor (differential amplifier) configured to generate the sensing result by subtracting the second voltage information from the first voltage information (paragraph [0046]). f) regarding claim 8: Sato et al. discloses (Figure 7) a control circuit (703) for controlling a temperature sensor (702), the control circuit comprising: a sampling circuit coupled to the temperature sensor and configured to obtain a first voltage information and a second voltage information from the temperature sensor (paragraph [0046], “In this manner the first and second sample and hold capacitors are charged to the voltages at node 710 when currents I1 and I2 flow through stand 702, respectively.”); and a computing circuit coupled to the sampling circuit and configured to generate a sensing result corresponding to a difference between the second voltage information and the first voltage information (paragraph [0046], “The first and second sample and hold capacitors can be connected to respective inputs of the differential amplifier, so that the differential amplifier generates analog Vout as a difference between the voltages held by the first and second sample and hold capacitors, respectively. An ADC can be provided that generates a digital equivalent of Vout for subsequent processing by a CPU to yield a digital value for T based on equation (3) above.”). g) regarding claim 15: Sato et al. discloses a method for obtaining temperature information about a circuit (Figure 7), the method comprising: providing a first current (302) and a second current (304) in different time periods to a temperature sensor (702) associated with the circuit; obtaining a first voltage information and a second voltage information from the temperature sensor when the first current and second current are respectively provided (paragraph [0046], “In this manner the first and second sample and hold capacitors are charged to the voltages at node 710 when currents I1 and I2 flow through stand 702, respectively.”); and generating the temperature information based on the first and second voltage information (paragraph [0046], “The first and second sample and hold capacitors can be connected to respective inputs of the differential amplifier, so that the differential amplifier generates analog Vout as a difference between the voltages held by the first and second sample and hold capacitors, respectively. An ADC can be provided that generates a digital equivalent of Vout for subsequent processing by a CPU to yield a digital value for T based on equation (3) above.”). Double Patenting The nonstatutory double patenting rejection is based on a judicially created doctrine grounded in public policy (a policy reflected in the statute) so as to prevent the unjustified or improper timewise extension of the “right to exclude” granted by a patent and to prevent possible harassment by multiple assignees. A nonstatutory double patenting rejection is appropriate where the conflicting claims are not identical, but at least one examined application claim is not patentably distinct from the reference claim(s) because the examined application claim is either anticipated by, or would have been obvious over, the reference claim(s). See, e.g., In re Berg, 140 F.3d 1428, 46 USPQ2d 1226 (Fed. Cir. 1998); In re Goodman, 11 F.3d 1046, 29 USPQ2d 2010 (Fed. Cir. 1993); In re Longi, 759 F.2d 887, 225 USPQ 645 (Fed. Cir. 1985); In re Van Ornum, 686 F.2d 937, 214 USPQ 761 (CCPA 1982); In re Vogel, 422 F.2d 438, 164 USPQ 619 (CCPA 1970); In re Thorington, 418 F.2d 528, 163 USPQ 644 (CCPA 1969). A timely filed terminal disclaimer in compliance with 37 CFR 1.321(c) or 1.321(d) may be used to overcome an actual or provisional rejection based on nonstatutory double patenting provided the reference application or patent either is shown to be commonly owned with the examined application, or claims an invention made as a result of activities undertaken within the scope of a joint research agreement. See MPEP § 717.02 for applications subject to examination under the first inventor to file provisions of the AIA as explained in MPEP § 2159. See MPEP § 2146 et seq. for applications not subject to examination under the first inventor to file provisions of the AIA . A terminal disclaimer must be signed in compliance with 37 CFR 1.321(b). The filing of a terminal disclaimer by itself is not a complete reply to a nonstatutory double patenting (NSDP) rejection. A complete reply requires that the terminal disclaimer be accompanied by a reply requesting reconsideration of the prior Office action. Even where the NSDP rejection is provisional the reply must be complete. See MPEP § 804, subsection I.B.1. For a reply to a non-final Office action, see 37 CFR 1.111(a). For a reply to final Office action, see 37 CFR 1.113(c). A request for reconsideration while not provided for in 37 CFR 1.113(c) may be filed after final for consideration. See MPEP §§ 706.07(e) and 714.13. The USPTO Internet website contains terminal disclaimer forms which may be used. Please visit www.uspto.gov/patent/patents-forms. The actual filing date of the application in which the form is filed determines what form (e.g., PTO/SB/25, PTO/SB/26, PTO/AIA /25, or PTO/AIA /26) should be used. A web-based eTerminal Disclaimer may be filled out completely online using web-screens. An eTerminal Disclaimer that meets all requirements is auto-processed and approved immediately upon submission. For more information about eTerminal Disclaimers, refer to www.uspto.gov/patents/apply/applying-online/eterminal-disclaimer. Claims 1-20 are rejected on the ground of nonstatutory double patenting as being unpatentable over claims 1-20 of U.S. Patent No. 12,416,529 (hereinafter ‘529 patent). Although the claims at issue are not identical, they are not patentably distinct from each other because other because the present claims are a broader recitation of the '529 patent. It would have been obvious to one of ordinary skill in the art at the time of the invention was made to use the teachings of claims 1-20 of the '529 patent as general teachings of a temperature sensor circuit as claimed in the present application. The instant claims obviously encompass the claimed invention in the '529 patent and differ only in terminology. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to Patrick O'Neill whose telephone number is (571)270-1677. The examiner can normally be reached Monday- Friday 9AM-5PM EST. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Taelor Kim can be reached at (571)270-7166. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /PATRICK O NEILL/Primary Examiner, Art Unit 2836
Read full office action

Prosecution Timeline

Jun 26, 2025
Application Filed
Aug 06, 2026
Non-Final Rejection mailed — §102, §DP (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12706612
SEMICONDUCTOR INTEGRATED CIRCUIT AND RECEIVER DEVICE
2y 1m to grant Granted Aug 11, 2026
Patent 12681524
ADAPTIVE CLOCK GATING FOR IMPROVING WEAR OUT-INDUCED DUTY CYCLE SHIFT IN COMPUTER CLOCK NETWORK
3y 8m to grant Granted Jul 14, 2026
Patent 12683611
Semiconductor Device Including a Level Shifter and Method of Mitigating a Delay Between Input and Output Signals
1y 11m to grant Granted Jul 14, 2026
Patent 12665581
Semiconductor devices and multi-bit flip-flop circuits having an asymmetrical row structure
3y 7m to grant Granted Jun 23, 2026
Patent 12665599
ELECTRONIC CIRCUIT
1y 11m to grant Granted Jun 23, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

Strategy Recommendation AI-generated — please review before filing

Get a prosecution strategy drawn from examiner precedents, rejection analysis, and claim mapping.
Typically takes 5-10 seconds — AI-generated, attorney review required before filing

Prosecution Projections

1-2
Expected OA Rounds
83%
Grant Probability
99%
With Interview (+17.5%)
2y 0m (~10m remaining)
Median Time to Grant
Low
PTA Risk
Based on 577 resolved cases by this examiner. Grant probability derived from career allowance rate.

Sign in with your work email

Enter your email to receive a magic link. No password needed.

Personal email addresses (Gmail, Yahoo, etc.) are not accepted.

Free tier: 3 strategy analyses per month