Technology areas: Communications • Semiconductors, Circuits & Optics
19 pending office actions • 11 art units • 18 examiners • 0 of 19 (0%) have an AI response strategy ready • 48 patents granted in the last 365 days
Applied Materials Israel Ltd. has 20 pending office actions in Semiconductors, Circuits & Optics. The matters span 19 distinct examiners and 12 distinct art units, indicating broad distribution across the examination system and a substantial coordination requirement.
LI, LARRY is the busiest examiner, with 2 pending matters. The limited concentration means that portfolio management should focus on consistent internal positions across many separate examiner relationships. Counsel should maintain centralized oversight of claim terminology, technical disclosures, and response timing while adapting arguments and amendments to each art unit.
Based on the USPTO statutory response window for each pending office action. 4 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.
Every pending office action with a known statutory deadline, placed on a days-until-due axis. Dots left of Today are overdue; the further right, the more runway. Cases that share a deadline window stack vertically. 4 of the docket's apps have a known mailing date.
Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.
| Bucket | Cases |
|---|---|
| §101 + other | 3 (16%) |
| §103 only | 5 (26%) |
| §102 only | 1 (5%) |
| §112 only | 3 (16%) |
| Multi-statute (no §101) | 7 (37%) |
How the docket's pending cases split across USPTO tech-center bands.
Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.
| Examiner | Apps on this docket | Allow rate | Interview lift |
|---|---|---|---|
| LI, LARRY | 2 | 66.7% | +66.7% |
| WILLIAMS, REBECCA COLETTE | 1 | 50.0% | +58.3% |
| MARIAM, DANIEL G | 1 | 90.6% | +10.3% |
| FATIMA, UROOJ | 1 | 75.0% | +0.0% |
| GASSEN, CHRISTOPHER J | 1 | 80.3% | +24.1% |
| COCHRAN, BRIANNA RENAE | 1 | 45.5% | +66.7% |
| KALISZEWSKI, ALINA ROSE | 1 | 84.6% | +23.3% |
| OYER, ANDREW J | 1 | 79.2% | +16.8% |
| FORRISTALL, JOSHUA L | 1 | 65.8% | +15.3% |
| GERMICK, JOHNATHAN R | 1 | 45.7% | +31.3% |
Cases in front of an examiner with an allow rate of 80%+ where the difficulty is Easy or Medium. The top 1 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18912493 | FITTING ROUNDED QUADRILATERAL SHAPES IN SEM IMAGING | MARIAM, DANIEL G | — |
Multi-statute / §101-driven matters, or cases in front of an examiner with an allow rate under 30%. The top 8 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18528737 | CALIBRATION OF AN EXAMINATION SYSTEM | SMITH, DAVID E | 19d |
| 18774820 | AN ARTIFICIAL INTELLIGENCE BASED METHOD FOR PRESENTING DATA RELATED TO DEFECTS DISCOVERED BY AN INSPECTION SYSTEM | COCHRAN, BRIANNA RENAE | 26d |
| 18888033 | NOTCH FILTER FOR HIGH THROUGHPUT X-RAY PHOTON SPECTROSCOPY | GASSEN, CHRISTOPHER J | — |
| 18673251 | DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN | KALISZEWSKI, ALINA ROSE | — |
| 18615998 | POTTING MATERIALS AND METHODS OF PRODUCING THEREOF | OYER, ANDREW J | — |
| 18599138 | ELECTROSTATIC ENERGY FILTER MODULE | LI, LARRY | — |
| 18443236 | OPTIMIZATION OF A METROLOGY ALGORITHM FOR EXAMINATION OF SEMICONDUCTOR WAFERS | FORRISTALL, JOSHUA L | — |
| 18439748 | TRAINING AND USING A NEURAL NETWORK FOR DEFECT DETECTION | GERMICK, JOHNATHAN R | — |
Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 8 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18774820 | AN ARTIFICIAL INTELLIGENCE BASED METHOD FOR PRESENTING DATA RELATED TO DEFECTS DISCOVERED BY AN INSPECTION SYSTEM | COCHRAN, BRIANNA RENAE | 26d |
| 19031183 | IDENTIFICATION OF AN ARRAY IN A SEMICONDUCTOR SPECIMEN | WILLIAMS, REBECCA COLETTE | — |
| 18912493 | FITTING ROUNDED QUADRILATERAL SHAPES IN SEM IMAGING | MARIAM, DANIEL G | — |
| 18888033 | NOTCH FILTER FOR HIGH THROUGHPUT X-RAY PHOTON SPECTROSCOPY | GASSEN, CHRISTOPHER J | — |
| 18673251 | DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN | KALISZEWSKI, ALINA ROSE | — |
| 18630957 | PROTECTING A DETECTOR WHILE DISCHARGING A REGION OF A SAMPLE | LI, LARRY | — |
| 18615998 | POTTING MATERIALS AND METHODS OF PRODUCING THEREOF | OYER, ANDREW J | — |
| 18599138 | ELECTROSTATIC ENERGY FILTER MODULE | LI, LARRY | — |
| Art Unit | Apps |
|---|---|
| 2881 | 5 |
| 2857 | 3 |
| 2122 | 2 |
| 2677 | 1 |
| 2675 | 1 |
| 2676 | 1 |
| 2615 | 1 |
| 2666 | 1 |
| 2667 | 1 |
| 2828 | 1 |
| App # | Title | Examiner | Art Unit | Statutes | Status | Due in | AI | Filed |
|---|---|---|---|---|---|---|---|---|
| 19031183 | IDENTIFICATION OF AN ARRAY IN A SEMICONDUCTOR SPECIMEN | WILLIAMS, REBECCA COLETTE | 2677 | §103 | Non-Final OA | — | Pending | Jan 17, 2025 |
| 18912493 | FITTING ROUNDED QUADRILATERAL SHAPES IN SEM IMAGING | MARIAM, DANIEL G | 2675 | §112 | Non-Final OA | — | Pending | Oct 10, 2024 |
| 18893821 | MACHINE LEARNING BASED GENERATION OF SYNTHETIC FAULT IMAGES OF SEMICONDUCTOR SPECIMENS | FATIMA, UROOJ | 2676 | §103 | Non-Final OA | — | Pending | Sep 23, 2024 |
| 18888033 | NOTCH FILTER FOR HIGH THROUGHPUT X-RAY PHOTON SPECTROSCOPY | GASSEN, CHRISTOPHER J | 2881 | §102§103§112 | Non-Final OA | — | Pending | Sep 17, 2024 |
| 18774820 | AN ARTIFICIAL INTELLIGENCE BASED METHOD FOR PRESENTING DATA RELATED TO DEFECTS DISCOVERED BY AN INSPECTION SYSTEM | COCHRAN, BRIANNA RENAE | 2615 | §103§112 | Final Rejection | 26d | Pending | Jul 16, 2024 |
| 18673251 | DEFECT DEPTH ESTIMATION FOR A SEMICONDUCTOR SPECIMEN | KALISZEWSKI, ALINA ROSE | 2881 | §102§103§112 | Non-Final OA | — | Pending | May 23, 2024 |
| 18630957 | PROTECTING A DETECTOR WHILE DISCHARGING A REGION OF A SAMPLE | LI, LARRY | 2881 | §103 | Final Rejection | — | Pending | Apr 09, 2024 |
| 18615998 | POTTING MATERIALS AND METHODS OF PRODUCING THEREOF | OYER, ANDREW J | — | §102§112 | Non-Final OA | — | Pending | Mar 25, 2024 |
| 18599138 | ELECTROSTATIC ENERGY FILTER MODULE | LI, LARRY | 2881 | §103§112 | Final Rejection | — | Pending | Mar 07, 2024 |
| 18443236 | OPTIMIZATION OF A METROLOGY ALGORITHM FOR EXAMINATION OF SEMICONDUCTOR WAFERS | FORRISTALL, JOSHUA L | 2857 | §101§103§112 | Final Rejection | — | Pending | Feb 15, 2024 |
| 18439748 | TRAINING AND USING A NEURAL NETWORK FOR DEFECT DETECTION | GERMICK, JOHNATHAN R | 2122 | §101§102§103§112 | Non-Final OA | — | Pending | Feb 12, 2024 |
| 18411009 | DETERMINATION OF UNDERCUT SIDEWALLS BASED ON AN IMAGE OF A SEMICONDUCTOR SPECIMEN | WILBURN, MOLLY K | 2666 | §112 | Non-Final OA | 6d | Pending | Jan 11, 2024 |
| 18537693 | AUTOMATIC SEGMENTATION OF AN IMAGE OF A SEMICONDUCTOR SPECIMEN AND USAGE IN METROLOGY | CAMMARATA, MICHAEL ROBERT | 2667 | §102 | Non-Final OA | — | Pending | Dec 12, 2023 |
| 18528737 | CALIBRATION OF AN EXAMINATION SYSTEM | SMITH, DAVID E | 2881 | §102§103 | Final Rejection | 19d | Pending | Dec 04, 2023 |
| 18383007 | NON-DESTRUCTIVE THREE-DIMENSIONAL PROBING AND CHARACTERIZATION OF SPECIMENS | ISHIZUKA, YOSHIHISA | 2857 | §112 | Non-Final OA | — | Pending | Oct 23, 2023 |
| 18488888 | MACHINE LEARNING BASED DEFECT EXAMINATION AND RANKING FOR SEMICONDUCTOR SPECIMENS | HELCO, NICHOLAS JOHN | 2122 | §101§103 | Non-Final OA | — | Pending | Oct 17, 2023 |
| 18231567 | DEPTH-PROFILING OF SAMPLES BASED ON X-RAY MEASUREMENTS | BARBEE, MANUEL L | 2857 | §103 | Final Rejection | 22d | Pending | Aug 08, 2023 |
| 18231221 | PULSE STRETCHER SYSTEM AND METHOD | KING, JOSHUA | 2828 | §103 | Non-Final OA | — | Pending | Aug 07, 2023 |
| 18122646 | HIGH VOLTAGE NOISE CANCELLATION | POOS, JOHN W | 2843 | §102§103 | Non-Final OA | — | Pending | Mar 16, 2023 |
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Start Free TrialApplied Materials Israel Ltd. has 19 pending office actions as of October 2026, spread across 11 art units and 18 examiners.
Larry Li has the most, with 2 of Applied Materials Israel Ltd.'s pending office actions.
Mostly Semiconductors, Circuits & Optics (USPTO Tech Center 2800), based on where its pending office actions are examined.
