Technology area: Semiconductors, Circuits & Optics
4 pending office actions • 4 art units • 4 examiners • 0 of 4 (0%) have an AI response strategy ready • 4 patents granted in the last 365 days
Femtometrix Inc. has 4 pending office actions in Semiconductors, Circuits & Optics. Each matter is associated with a distinct examiner and a distinct art unit, producing a fully distributed examination profile.
LAU, TUNG S is the busiest examiner, with 1 pending matter. No examiner controls the broader docket, so counsel should organize prosecution by individual action and technical assignment.
Based on the USPTO statutory response window for each pending office action. 1 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.
Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.
| Bucket | Cases |
|---|---|
| §101 + other | 1 (25%) |
| §103 only | 2 (50%) |
| Multi-statute (no §101) | 1 (25%) |
How the docket's pending cases split across USPTO tech-center bands.
Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.
| Examiner | Apps on this docket | Allow rate | Interview lift |
|---|---|---|---|
| LAU, TUNG S | 1 | 83.0% | +14.5% |
| STOCK JR, GORDON J | 1 | 81.6% | +17.4% |
| MCDONNOUGH, COURTNEY G | 1 | 81.7% | +17.9% |
| MCCORMACK, JASON L | 1 | 84.7% | +8.1% |
Cases in front of an examiner with an allow rate of 80%+ where the difficulty is Easy or Medium. The top 2 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18350643 | METHOD AND APPARATUS FOR NON-INVASIVE SEMICONDUCTOR TECHNIQUE FOR MEASURING DIELECTRIC/SEMICONDUCTOR INTERFACE TRAP DENSITY USING SCANNING ELECTRON MICROSCOPE CHARGING | MCCORMACK, JASON L | 70d |
| 18350250 | APPARATUS AND METHOD OF INCREASING PRECISION CONTROL OF CHARGE DEPOSITION ONTO A SEMICONDUCTOR WAFER SUBSTRATE | MCDONNOUGH, COURTNEY G | — |
Multi-statute / §101-driven matters, or cases in front of an examiner with an allow rate under 30%. The top 2 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18641170 | SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS | LAU, TUNG S | — |
| 18462208 | METHOD AND APPARATUS FOR SEPARATION OF THE SECOND HARMONIC GENERATION COMPONENTS, THROUGH VARIATION IN THE INPUT PROBING LASER POLARIZATION | STOCK JR, GORDON J | — |
Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 3 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18641170 | SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS | LAU, TUNG S | — |
| 18462208 | METHOD AND APPARATUS FOR SEPARATION OF THE SECOND HARMONIC GENERATION COMPONENTS, THROUGH VARIATION IN THE INPUT PROBING LASER POLARIZATION | STOCK JR, GORDON J | — |
| 18350250 | APPARATUS AND METHOD OF INCREASING PRECISION CONTROL OF CHARGE DEPOSITION ONTO A SEMICONDUCTOR WAFER SUBSTRATE | MCDONNOUGH, COURTNEY G | — |
| Art Unit | Apps |
|---|---|
| 2857 | 1 |
| 2877 | 1 |
| 2858 | 1 |
| 2881 | 1 |
| App # | Title | Examiner | Art Unit | Statutes | Status | Due in | AI | Filed |
|---|---|---|---|---|---|---|---|---|
| 18641170 | SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS | LAU, TUNG S | 2857 | §101§112 | Non-Final OA | — | Pending | Apr 19, 2024 |
| 18462208 | METHOD AND APPARATUS FOR SEPARATION OF THE SECOND HARMONIC GENERATION COMPONENTS, THROUGH VARIATION IN THE INPUT PROBING LASER POLARIZATION | STOCK JR, GORDON J | 2877 | §102§103 | Final Rejection | — | Pending | Sep 06, 2023 |
| 18350250 | APPARATUS AND METHOD OF INCREASING PRECISION CONTROL OF CHARGE DEPOSITION ONTO A SEMICONDUCTOR WAFER SUBSTRATE | MCDONNOUGH, COURTNEY G | 2858 | §103 | Final Rejection | — | Pending | Jul 11, 2023 |
| 18350643 | METHOD AND APPARATUS FOR NON-INVASIVE SEMICONDUCTOR TECHNIQUE FOR MEASURING DIELECTRIC/SEMICONDUCTOR INTERFACE TRAP DENSITY USING SCANNING ELECTRON MICROSCOPE CHARGING | MCCORMACK, JASON L | 2881 | §103 | Final Rejection | 70d | Pending | Jul 11, 2023 |
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Start Free TrialFemtometrix Inc. has 4 pending office actions as of October 2026, spread across 4 art units and 4 examiners.
Tung S Lau has the most, with 1 of Femtometrix Inc.'s pending office actions.
Mostly Semiconductors, Circuits & Optics (USPTO Tech Center 2800), based on where its pending office actions are examined.
