Technology area: Semiconductors, Circuits & Optics
7 pending office actions • 3 art units • 6 examiners • 0 of 7 (0%) have an AI response strategy ready • 6 patents granted in the last 365 days
Nova Ltd. is currently handling 5 pending office actions within the Semiconductors, Circuits & Optics technology area. These actions are spread across 3 distinct art units, showing a range of technical focuses within the semiconductor field. The company is interacting with 5 distinct examiners, which indicates that each pending action is assigned to a different individual. This distribution means that no single examiner has a dominant influence over the current pending portfolio.
The busiest examiner for Nova Ltd. is PHILLIPS, RUFUS L, who manages 1 pending office action. Since each of the 5 examiners holds only 1 pending action, the portfolio's prosecution is fully distributed. This lack of examiner overlap across the 3 distinct art units suggests that Nova Ltd. must navigate various examination styles for its 5 pending matters. Practitioners should be prepared for 5 different perspectives on the company's semiconductor and optics innovations. The involvement of 3 distinct art units further indicates that the company's filings are being reviewed by several specialized technical groups, each with its own set of standards.
Based on the USPTO statutory response window for each pending office action. 1 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.
Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.
| Bucket | Cases |
|---|---|
| §101 only | 1 (14%) |
| §101 + other | 1 (14%) |
| §103 only | 1 (14%) |
| §112 only | 1 (14%) |
| Multi-statute (no §101) | 3 (43%) |
How the docket's pending cases split across USPTO tech-center bands.
Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.
| Examiner | Apps on this docket | Allow rate | Interview lift |
|---|---|---|---|
| AYUB, HINA F | 2 | 85.0% | +17.2% |
| PHILLIPS, RUFUS L | 1 | 62.7% | +32.5% |
| GRAY, SUNGHEE Y | 1 | 82.9% | +11.4% |
| SOHN, SEUNG C | 1 | 87.1% | +9.0% |
| MENDOZA, ALEXANDRIA ARELLANO | 1 | 68.8% | +28.0% |
| SINGLETARY, MICHAEL J | 1 | 83.9% | +6.0% |
Cases in front of an examiner with an allow rate of 80%+ where the difficulty is Easy or Medium. The top 2 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 19267487 | SYSTEMS AND METHODS FOR OPTICAL METROLOGY | AYUB, HINA F | — |
| 18879240 | EVALUATION OF ABNORMALITIES OF A SAMPLE | GRAY, SUNGHEE Y | — |
Multi-statute / §101-driven matters, or cases in front of an examiner with an allow rate under 30%. The top 5 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18566919 | METROLOGY TECHNIQUE FOR SEMICONDUCTOR DEVICES | MENDOZA, ALEXANDRIA ARELLANO | 22d |
| 19254051 | HYBRID METROLOGY METHOD AND SYSTEM | AYUB, HINA F | — |
| 18879248 | OPTICAL CRITICAL DIMENSIONS (OCD) METROLOGY FOR THICK STACKS | PHILLIPS, RUFUS L | — |
| 18872867 | MOVING APPARATUS ALONG MULTIPLE AXES | SOHN, SEUNG C | — |
| 18260036 | EVALUATING X-RAY SIGNALS FROM A PERTURBED OBJECT | SINGLETARY, MICHAEL J | — |
Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 5 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18566919 | METROLOGY TECHNIQUE FOR SEMICONDUCTOR DEVICES | MENDOZA, ALEXANDRIA ARELLANO | 22d |
| 19267487 | SYSTEMS AND METHODS FOR OPTICAL METROLOGY | AYUB, HINA F | — |
| 19254051 | HYBRID METROLOGY METHOD AND SYSTEM | AYUB, HINA F | — |
| 18879248 | OPTICAL CRITICAL DIMENSIONS (OCD) METROLOGY FOR THICK STACKS | PHILLIPS, RUFUS L | — |
| 18879240 | EVALUATION OF ABNORMALITIES OF A SAMPLE | GRAY, SUNGHEE Y | — |
| Art Unit | Apps |
|---|---|
| 2877 | 5 |
| 2878 | 1 |
| 2857 | 1 |
| App # | Title | Examiner | Art Unit | Statutes | Status | Due in | AI | Filed |
|---|---|---|---|---|---|---|---|---|
| 19267487 | SYSTEMS AND METHODS FOR OPTICAL METROLOGY | AYUB, HINA F | 2877 | §103 | Non-Final OA | — | Pending | Jul 11, 2025 |
| 19254051 | HYBRID METROLOGY METHOD AND SYSTEM | AYUB, HINA F | 2877 | §101§102Other | Non-Final OA | — | Pending | Jun 30, 2025 |
| 18879248 | OPTICAL CRITICAL DIMENSIONS (OCD) METROLOGY FOR THICK STACKS | PHILLIPS, RUFUS L | 2877 | §102§103 | Non-Final OA | — | Pending | Dec 27, 2024 |
| 18879240 | EVALUATION OF ABNORMALITIES OF A SAMPLE | GRAY, SUNGHEE Y | 2877 | §112 | Non-Final OA | — | Pending | Dec 26, 2024 |
| 18872867 | MOVING APPARATUS ALONG MULTIPLE AXES | SOHN, SEUNG C | 2878 | §102§103 | Non-Final OA | — | Pending | Dec 09, 2024 |
| 18566919 | METROLOGY TECHNIQUE FOR SEMICONDUCTOR DEVICES | MENDOZA, ALEXANDRIA ARELLANO | 2877 | §103§112 | Non-Final OA | 22d | Pending | Dec 04, 2023 |
| 18260036 | EVALUATING X-RAY SIGNALS FROM A PERTURBED OBJECT | SINGLETARY, MICHAEL J | 2857 | §101 | Final Rejection | — | Pending | Jun 30, 2023 |
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Start Free TrialNova Ltd. has 7 pending office actions as of October 2026, spread across 3 art units and 6 examiners.
Hina F Ayub has the most, with 2 of Nova Ltd.'s pending office actions.
Mostly Semiconductors, Circuits & Optics (USPTO Tech Center 2800), based on where its pending office actions are examined.
