Listed by the USPTO as MENDOZA, ALEXANDRIA ARELLANO
Tech Center 2800 • Art Units: 1713 2877
This examiner grants 69% of resolved cases
MENDOZA, ALEXANDRIA ARELLANO is assigned to Tech Center 2800 and Art Unit 1713. The record has 32 resolved cases, an allowance rate of 68.8%, an interview lift of 28.0%, and a median time to allowance of 923 days. The limited case volume warrants caution in drawing broad conclusions, but the interview measure supports considering a well-prepared discussion of claim scope and the examiner’s cited art.
The listed companies are Mitsubishi Electric Corporation, Bayerische Motoren Werke Aktiengesellschaft, and Washington University. The listed firms are Muncy, Geissler, Olds & Lowe, P.C., ALSTON & BIRD LLP, and BakerHostetler. Counsel can use these names to locate related prosecution matters, while giving greater weight to the specific office action record in any individual application.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 19100510 | DEFLECTOMETRY METHOD AND ASSOCIATED SYSTEM | Non-Final OA | CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE |
| 18833986 | Method for the Discrete Calculation of HUD Optics and Evaluation of the HUD Performance of a Vehicle Window | Non-Final OA | Bayerische Motoren Werke Aktiengesellschaft |
| 18918267 | MACHINE TOOL | Non-Final OA | Mitsubishi Electric Corporation |
| 17988036 | APPARATUS FOR MEASURING OPTOFLUIDIC DROPLET FLUORESCENCE AND MANUFACTURING METHOD THEREOF | Final Rejection | ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE |
| 17829103 | CARGO CONTAINER SENSOR | Non-Final OA | GOODRICH CORPORATION |
| 18875342 | METHOD, DEVICE, AND INFORMATION PROCESSING PROGRAM FOR DETERMINING NECROSIS CELL REGION | Final Rejection | HAMAMATSU PHOTONICS K.K. |
| 18691002 | SOURCE SELECTION MODULE AND ASSOCIATED METROLOGY AND LITHOGRAPHIC APPARATUSES | Non-Final OA | ASML NETHERLANDS B.V. |
| 18648644 | OPTICAL SYSTEM FOR A METROLOGY SYSTEM AND METROLOGY SYSTEM WITH SUCH AN OPTICAL SYSTEM | Non-Final OA | Carl Zeiss SMT GmbH |
| 18693003 | METHOD FOR CALIBRATING A SPECTROMETER DEVICE | Non-Final OA | TRINAMIX GMBH |
| 18887461 | Electrical Performance Prediction Based On Structural Measurements Of Partially Fabricated Semiconductor Devices | Non-Final OA | KLA Corporation |
IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.
Build Your Strategy68.8% of resolved applications examined by Alexandria Arellano Mendoza were allowed (32 resolved cases), compared with 62.4% across Art Unit 1713 over the last five years.
This examiner's interview lift is +28.0 percentage points: the difference in allowance rate between resolved applications that had an examiner interview and those that did not.
Applications allowed by Alexandria Arellano Mendoza took 923 days on average from filing to allowance.
Alexandria Arellano Mendoza examines applications in Art Unit 1713 in Tech Center 2800 (Semiconductors, Circuits & Optics).
