Tech Center 2800 • Art Units: 1737 2681 2800 2877 2886
This examiner grants 83% of resolved cases
Sunghee Y. Gray is an examiner in Tech Center 2800, assigned to Art Unit 1737. She has resolved 535 cases, providing a substantial dataset for understanding her examination patterns. The examiner maintains an allowance rate of 83.2%, which is a strong indicator of a favorable environment for applicants. Furthermore, the data reveals a 10.7% interview lift, suggesting that oral advocacy can play a helpful role in securing an allowance.
The median days to allowance for applications under her review is 909. This 909-day timeline provides a clear expectation for the duration of the prosecution process in Art Unit 1737. The 10.7% interview lift, while modest, still offers a meaningful boost to the 83.2% allowance rate. With 535 resolved cases, the examiner's history is well-documented and offers a reliable basis for strategic planning in Tech Center 2800.
In this environment, the 83.2% allowance rate and 909-day median pendency suggest an efficient and generally positive experience for patent applicants. Practitioners should consider the 10.7% interview lift as a useful tool to address any remaining concerns. By understanding these metrics, applicants can better prepare their cases and navigate the specific requirements of Examiner Gray.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18879346 | IMAGE PICK-UP DEVICE AND IMAGE PICK-UP METHOD | Non-Final OA | Panasonic Intellectual Property Management Co., Ltd. |
| 18610384 | INSPECTION CUVETTE AND SYSTEM FOR USE IN THE OPTICAL INSPECTION OF AN OPHTHALMIC LENS | Non-Final OA | Alcon Inc. |
| 18325706 | APPARATUS AND METHOD FOR GENERATING HOLOGRAM | Non-Final OA | Electronics and Telecommunications Research Institute |
| 18969335 | NOZZLE HAVING REAL TIME INSPECTION FUNCTIONS | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. |
| 18796542 | MARKER, METHOD FOR MANUFACTURING MARKER, AND DETECTION TARGET | Non-Final OA | DAI NIPPON PRINTING CO., LTD. |
| 18558910 | METROLOGY APPARATUS AND LITHOGRAPHIC APPARATUS | Non-Final OA | ASML Netherlands B.V. |
| 18453531 | Metrology Apparatus and a Method of Determining a Characteristic of Interest | Non-Final OA | ASML Netherlands B.V. |
| 18327981 | Multimodal Proximity and Visuotactile Sensing Through Transmissive Membrane | Final Rejection | The Trustees of the University of Pennsylvania |
| 18981070 | Line-field OCT System with K Space Calibration | Non-Final OA | KineoLabs, Inc. |
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