Tech Center 3700 • Art Units: 2881 3791
This examiner grants 81% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18566484 | IMAGING DEVICE AND METHOD OF OPERATING THE SAME | Non-Final OA | Sony Group Corporation |
| 18279545 | Remote Chamber And Dart-MS System Using Same | Final Rejection | LG Chem, Ltd. |
| 18380448 | ION SOURCE WITH WIRE FORM METAL DOPANT | Final Rejection | Applied Materials, Inc. |
| 18508669 | ION SOURCE APPARATUS AND MASS SPECTROMETER | Final Rejection | SHIMADZU CORPORATION |
| 18559166 | TIME-OF-FLIGHT MASS SPECTROMETER AND TIME-OF-FLIGHT MASS SPECTROMETRY METHOD | Non-Final OA | Shimadzu Corporation |
| 18390046 | Processor System, Correction Method, and Correction Program | Non-Final OA | Hitachi High-Tech Corporation |
| 18061338 | CHARGED PARTICLE BEAM GENERATION | Non-Final OA | Microchip Technology Incorporated |
| 18148003 | ELECTROMAGNETIC WAVE ABSORBING MATERIAL, PREPARING METHOD THEREOF AND COMPOSITE STRUCTURE FOR SUPPRESSING ELECTROMAGNETIC INTERFERENCE | Final Rejection | Industrial Technology Research Institute |
| 18548062 | ELECTRONIC TWEEZERS | Final Rejection | ZHEJIANG UNIVERSITY |
| 18375512 | IMAGING THOUSANDS OF ELECTRON BEAMS DURING WORKPIECE INSPECTION | Non-Final OA | KLA Corporation |
| 18273914 | Pressure Control in Vacuum Chamber of Mass Spectrometer | Final Rejection | DH Technologies Development Pte. Ltd. |
| 18546528 | ION SOURCE NEBULISER | Final Rejection | Micromass UK Limited |
| 17998289 | NEUTRON BEAM SHIELDING GYPSUM-BASED BUILDING BOARD AND METHOD OF MANUFACTURING NEUTRON BEAM SHIELDING GYPSUM-BASED BUILDING BOARD | Non-Final OA | YOSHINO GYPSUM CO., LTD. |
| 18485133 | DRY ELECTRON SOURCE ENVIRONMENT | Non-Final OA | FEI Company |
| 18453978 | DIFFERENTIAL PHASE CONTRAST MICROANALYSIS USING ENERGY LOSS SPECTROMETERS | Final Rejection | FEI Company |
| 17969512 | DEVICES TO REDUCE RADIATION EXPOSURE | Non-Final OA | Egg Medical, Inc. |
| 18466766 | TUNING A MASS SPECTROMETER FILTER | Non-Final OA | Thermo Fisher Scientific (Bremen) GmbH |
| 18519810 | CHARGED PARTICLE BEAM APPARATUS | Non-Final OA | KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE |
| 18466925 | SYSTEM FOR ANALYZING A SAMPLE | Non-Final OA | Analytik Jena GmbH+Co. KG |
| 18429943 | MOBILE UVC LIGHT PROJECTION UNIT | Non-Final OA | UVC Science, Inc. |
| 18116036 | JET IMPINGEMENT COOLING ASSEMBLY FOR PLASMA WINDOWS POSITIONED IN A BEAM ACCELERATOR SYSTEM | Non-Final OA | SHINE Technologies, LLC |
| 18205711 | METHOD AND SYSTEM FOR INDEXING ELECTRON DIFFRACTION PATTERNS | Non-Final OA | Oxford Instruments Nanotechnology Tools Limited |
| 18210169 | Electron Spectrometer and Analytical Method | Final Rejection | JEOL Ltd. |
| 17966026 | MULTI-BEAM CHARGED PARTICLE BEAM SYSTEM WITH ANISOTROPIC FILTERING FOR IMPROVED IMAGE CONTRAST | Non-Final OA | Carl Zeiss MultiSEM GmbH |
| 18571186 | SYSTEM AND METHOD FOR ADJUSTING BEAM CURRENT USING A FEEDBACK LOOP IN CHARGED PARTICLE SYSTEMS | Non-Final OA | HERMES MICROVISION CO. LTD. (BEIJING) |
| 18230260 | NEUTRON-CAPTURE THERAPY SYSTEM | Non-Final OA | NEUBORON THERAPY SYSTEM LTD. |
| 18235469 | METHOD AND DEVICE FOR SAMPLE INTRODUCTION FOR MASS SPECTROMETRY | Non-Final OA | JP Scientific Limited |
| 17300329 | STRUCTURED WAVE GENERATOR AND DEVICE FOR DIFFRACTING A NEUTRON BEAM INTO A STRUCTURED WAVE | Non-Final OA | INCOHERENT VISION INC. |
| 18042811 | MAGNETIC SECTOR WITH A SHUNT FOR A MASS SPECTROMETER | Final Rejection | LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST) |
| 18015057 | ELECTROSTATIC DEFLECTION CONVERGENCE-TYPE ENERGY ANALYZER, IMAGING-TYPE ELECTRON SPECTROSCOPIC DEVICE, REFLECTING IMAGING-TYPE ELECTRON SPECTROSCOPIC DEVICE, AND SPIN VECTOR DISTRIBUTION IMAGING DEVICE | Non-Final OA | INTER-UNIVERSITY RESEARCH INSTITUTE CORPORATION NATIONAL INSTITUTE OF NATURAL SCIENCES |
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