Prosecution Insights
Last updated: October 02, 2026

Examiner: KIM, KIHO

Tech Center 2800 • Art Units: 2877 2884

This examiner grants 85% of resolved cases

Analysis

Kiho Kim is an examiner in Tech Center 2800, working within Art Unit 2877. He has a history of 1690 resolved cases, which provides a large data set for analysis. His allowance rate is 85.4 percent, and the median days to allowance for his cases is 674. This pendency of 674 days suggests the timeline applicants can expect when seeking an allowance from this examiner. The 1690 resolved cases offer a stable statistical basis for these observations.

The data shows an interview lift of 4.5 percent for Kiho Kim. This indicates that applications involving an interview have a higher probability of success than the 85.4 percent baseline allowance rate. For practitioners, this 4.5 percent lift is a metric to consider when planning their strategy in Art Unit 2877. The combination of an 85.4 percent allowance rate and a 674 day median pendency characterizes his examination profile in Tech Center 2800.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

85.4%
Allow Rate
+17.4% vs TC avg
1,698
Total Applications
+4.5%
Interview Lift
674
Avg Prosecution Days
Based on 1690 resolved cases, 2023–2026

Rejection Statute Breakdown

3.9%
§101 Eligibility
22.9%
§102 Novelty
56.0%
§103 Obviousness
12.8%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18873279 APPARATUS AND METHOD FOR INSPECTING CONTAINER BY X-RAY RADIATION Non-Final OA KRONES AG
18959448 HEAT AND VOLATILE-ORGANIC-COMPOUNDS DETECTING SYSTEMS Non-Final OA Lam Research Corporation
19057550 Scanner Utilizing Beam Computed Tomography And Antiscatter Grid Non-Final OA The Regents of the University of Colorado, a body corporate
19021362 RADIATION IMAGE SCANNER Non-Final OA J. MORITA MFG. CORP.
18866904 MULTI-COMPONENT RARE-EARTH GARNET SCINTILLATORS Final Rejection University of Tennessee Research Foundation
19035311 SYSTEMS AND METHODS FOR REDUCING SCATTERING AND IMPROVING OPTICAL POWER DENSITY IN CELLULAR MATRICES Non-Final OA The Charles Stark Draper Laboratory, Inc.
19034831 X-RAY FLUORESCENT SCREEN, X-RAY DETECTOR, AND X-RAY INSPECTION DEVICE USING SAME Non-Final OA Niterra Materials Co., Ltd.

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