Prosecution Insights
Prosecution Insights
Tech Center 2100 • Art Units: 2142
This examiner grants 75% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18542890 | METHOD AND APPARATUS FOR INFERRING SEMICONDUCTOR MEASUREMENT RESULTS BASED ON ARTIFICIAL INTELLIGENCE | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18133203 | ELECTRONIC APPARATUS AND CONTROLLING METHOD THEREOF | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 17690310 | METHOD AND DEVICE FOR PREDICTING PROCESS ANOMALIES | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 17557754 | METHOD AND APPARATUS FOR COLLECTING DATA OF ARTIFICIAL INTELLIGENCE SYSTEM | Non-Final OA | ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE |
| 17679001 | TRAINING METHOD, STORAGE MEDIUM, AND TRAINING DEVICE | Final Rejection | FUJITSU LIMITED |
| 18159036 | SYSTEMS AND METHODS FOR MODEL-BASED META-LEARNING | Final Rejection | Salesforce, Inc. |
| 17644077 | FEDERATED LEARNING OF MACHINE LEARNING MODEL FEATURES | Non-Final OA | INTERNATIONAL BUSINESS MACHINES CORPORATION |
| 17735293 | METHOD FOR CONTROLLING IMPLANTING TOOL | Final Rejection | NANYA TECHNOLOGY CORPORATION |
| 17695299 | SEMICONDUCTOR MANUFACTURING PROCESS PREDICTION METHOD AND SEMICONDUCTOR MANUFACTURING PROCESS PREDICTION DEVICE | Final Rejection | UNITED MICROELECTRONICS CORP. |
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