Tech Center 2800 • Art Units: 2877 2886
This examiner grants 79% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 17886946 | METHOD AND DEVICE WITH OPERATION MODE DEPENDENT DEFECT DETECTION | Final Rejection | Samsung Electronics Co., Ltd. |
| 17898155 | FLOW CELLS WITH NANO-PADS AND A HYDROPHOBIC BARRIER | Final Rejection | ILLUMINA, INC. |
| 18692176 | PARTICLE SORTING DEVICE, ORIFICE UNIT FOR PARTICLE SORTING DEVICE, AND PARTICLE SORTING METHOD | Non-Final OA | Sony Group Corporation |
| 18398723 | INTEGRATED OPTICAL SENSOR CONTROLLER FOR DEVICEMANUFACTURING MACHINES | Non-Final OA | Applied Materials, Inc. |
| 18671625 | CALIBRATION OF SCANNING 3-D PERCEPTION SYSTEMS | Non-Final OA | Summer Robotics, Inc. |
| 18710778 | MULTIPLEX CARS MICROSCOPY DEVICE | Final Rejection | Centre National de la Recherche Scientifique |
| 18787119 | MASK CHARACTERIZATION METHODS AND APPARATUSES | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 17954362 | INSPECTION APPARATUS AND INSPECTION METHOD WHICH USES MULTIPLE IMAGE PROCESSING ALGORITHMS TO ANALYZE A SEALING PORTION | Final Rejection | RICOH COMPANY, LTD. |
| 18917680 | OPTICAL TIME-DOMAIN REFLECTOMETER AND PROGRAM | Non-Final OA | Yokogawa Test & Measurement Corporation |
| 18909189 | LAYER THICKNESS DETERMINATION BY FOUR-WAVE-MIXING SPECTROSCOPY | Non-Final OA | Monstr Sense Technologies, LLC |
| 18699503 | RECALIBRATION OF A 3D DETECTOR BASED ON STRUCTURED LIGHT | Non-Final OA | TRINAMIX GMBH |
| 18696343 | METHOD AND HEMATOLOGY ANALYZER FOR OPTICALLY ANALYZING BLOOD CELLS | Non-Final OA | Siemens Healthcare Diagnostics Inc. |
| 18178944 | SEMICONDUCTOR STRUCTURE, INSPECTION METHOD AND INSPECTION SYSTEM | Non-Final OA | Winbond Electronics Corp. |
| 18587703 | SIDE-BY-SIDE OFF-CENTER DIE OVERLAY TARGET | Non-Final OA | KLA Corporation |
| 18608363 | METHOD AND DEVICE OF INSPECTING SURFACE OF INTERCONNECT STRUCTURE | Final Rejection | CHENG MEI INSTRUMENT TECHNOLOGY CO., LTD. |
| 18711291 | METHOD AND APPARATUS FOR MEASURING THE THICKNESS OF ONE OR MORE LAYERS OF A MULTI-LAYER FILM | Non-Final OA | SYNCRO S.R.L. |
| 18648774 | Optical Radiation Measurement Method and Device | Non-Final OA | HANGZHOU EVERFINE PHOTO-E-INFO CO., LTD. |
| 18699884 | INSTRUMENT AND METHOD FOR MEASURING THE CURVATURE OF A SURFACE OF A SAMPLE | Final Rejection | RIBER |
| 17889056 | CABLE PROCESSING DEVICE AND METHOD | Final Rejection | MD Elektronik GmbH |
| 17955559 | OPTICAL IMAGING SYSTEM FOR PRESENTING IMAGE OF PARTICLE | Final Rejection | FlowVIEW Tek |
| 17895329 | SURFACE DEFECT DETECTION APPARATUS AND METHOD | Non-Final OA | Laon People Inc. |
IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.
Build Your Strategy