Prosecution Insights
Last updated: April 19, 2026

Examiner: LEE, HWA S

Tech Center 2800 • Art Units: 2877 2886

This examiner grants 72% of resolved cases

Performance Statistics

72.1%
Allow Rate
+4.1% vs TC avg
768
Total Applications
+3.0%
Interview Lift
1123
Avg Prosecution Days
Based on 718 resolved cases, 2023–2026

Rejection Statute Breakdown

4.5%
§101 Eligibility
25.2%
§102 Novelty
31.7%
§103 Obviousness
30.5%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18662402 Systems and Methods for 1-Micron Frequency Comb Optical Coherence Tomography Final Rejection The Regents of the University of California
18675680 THERMOMECHANICAL INFRARED DETECTOR WITH METAMATERIAL ABSORBER Non-Final OA Saudi Arabian Oil Company
18666058 SYSTEM AND METHOD FOR EVALUATING LIFE SAFETY DETECTION DEVICES Final Rejection Carrier Corporation
18700512 System and Methods for Measuring Stimulated Raman Scattering Non-Final OA Google LLC
17997012 METHOD AND DEVICE ENHANCED CONTAINER INSPECTION USING COMBINED SENSOR DATA AND NEURAL NETWORK ANALYSIS Non-Final OA KRONES AG
18810230 SHARED SET OF OBJECT REGISTRATIONS FOR SURGICAL DEVICES USING INDEPENDENT REFERENCE PLANES Non-Final OA Cilag GmbH International
18710644 DISPLACEMENT MEASUREMENT APPARATUS, NON-CONTACT INPUT APPARATUS, AND BIOLOGICAL MICROMOTION MEASUREMENT APPARATUS Non-Final OA RICOH COMPANY, LTD.
18780127 APPARATUS AND METHODS FOR MONITORING OPTICAL FIBER SYSTEM INTEGRITY Non-Final OA OneSubsea IP UK Limited
18863040 SPECTROSCOPIC ANALYSIS DEVICE Non-Final OA HAMAMATSU PHOTONICS K.K.
18672196 TELESCOPE AND SPACECRAFT SYSTEM Non-Final OA CANON DENSHI KABUSHIKI KAISHA
18838745 OPTICAL APPARATUS Non-Final OA RENISHAW PLC
17869550 SYSTEM AND METHOD USING A SET OF MULTI-STEP DEFECT DETECTION TESTS WITH DIFFERENT SENSITIVITY Final Rejection ASML NETHERLANDS B.V.
17846056 PHOTONIC CHIP FOR MONITORING ACTIVITIES OF LIVING CELLS Non-Final OA THE UNIVERSITY OF HONG KONG
18817594 PURGE-FREE OPEN-PATH SYSTEM AND METHOD FOR CAVITY ENHANCED SPECTROSCOPY Non-Final OA Nikira Labs Inc.
18814441 METHOD AND APPARATUS FOR CHECKING A KIT OF SURGICAL INSTRUMENTS Non-Final OA PROMEDITAL S.R.L.
18840843 Device and Method for Measuring Wafers Non-Final OA PRECITEC OPTRONIK GMBH
18812128 VIA DETECTION DEVICE AND METHOD FOR THROUGH GLASS VIA SUBSTRATE Non-Final OA KUN-HSIEN CHENG
18839668 OPTICAL FIBRE INTERFEROMETER AND METHOD FOR MEASURING A MAGNETIC FIELD OR AN ELECTRICAL CURRENT BASED ON SAID INTERFEROMETER Non-Final OA EXAIL
18326018 TEST SYSTEM AND TEST METHOD TO WAFERS Non-Final OA NANYA TECHNOLOGY CORPORATION
18649427 INTERFEROMETRIC ELEMENT, DEVICE FOR DETECTING A COMPOUND COMPRISING AN INTERFEROMETRIC ELEMENT AND METHOD FOR DETECTING A COMPOUND Final Rejection COMMISSARIAT A L’ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
18259459 ACOUSTIC INFLUENCE MAP BASED FLAW SIZE IMAGING Final Rejection Evident Canada, INC.
18137756 PROPULSOR BLADE IMAGING ASSEMBLY FOR AN AIRCRAFT PROPULSION SYSTEM Final Rejection Raytheon Technologies Corporation
18258395 OPTICAL SENSOR AND PHYSICAL QUANTITY MEASUREMENT DEVICE Final Rejection NAGANO KEIKI CO., LTD.
18316502 HOLOGRAPHIC IMAGE PROCESSING AND DATA EXTRACTION Non-Final OA ELITechGroup Inc.
17758901 Semi-finished Product for the Construction of a Gyroscope and Gyroscope Including the Semi-finished Product Non-Final OA CIVITANAVI SYSTEMS SPA
16972910 METHOD AND APPARATUS FOR MONITORING A DRIVE MECHANISM OF AN AUTOMATED INSPECTION SYSTEM FOR INDUCING MOTION TO A CONTAINER PARTIALLY FILLED WITH A LIQUID Final Rejection WILCO AG
16609693 VEHICLE COLOR MEASUREMENT METHODS AND DEVICES Final Rejection X-Rite Switzerland GmbH

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