Prosecution Insights
Prosecution Insights
Tech Center 4100 • Art Units: 2800 2881 2884 3753 4100
This examiner grants 64% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18194608 | RADIATION THERAPY DEVICES, PHOTOFLASH THERAPY SYSTEMS, AND ULTRA-HIGH ENERGY ELECTRON FLASH THERAPY SYSTEMS | Final Rejection | SHANGHAI UNITED IMAGING HEALTHCARE CO., LTD. |
| 18087269 | DETECTION CELL, FAIMS DEVICE, AND PROGRAM | Non-Final OA | Sharp Display Technology Corporation |
| 18292640 | Charged Particle Beam Apparatus and Sample Analysis Method | Final Rejection | Hitachi High-Tech Corporation |
| 18572830 | Charged Particle Beam Device | Non-Final OA | Hitachi High-Tech Corporation |
| 18013060 | MASS SPECTROMETRY METHOD AND MASS SPECTROMETER | Non-Final OA | HITACHI HIGH-TECH CORPORATION |
| 17855550 | EUV LIGHT SOURCE AND APPARATUS FOR LITHOGRAPHY | Final Rejection | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
| 17716010 | PROCESSING APPARATUS AND METHOD OF MANUFACTURE | Non-Final OA | Taiwan Semiconductor Manufacturing Company Limited |
| 18387987 | XRAY DIFFRACTION ANGLE VERIFICATION IN AN ION IMPLANTER | Non-Final OA | Applied Materials, Inc. |
| 18367003 | ION MOBILITY ANALYSIS APPARATUS | Non-Final OA | Shimadzu Corporation |
| 18015649 | MASS SPECTROMETRY METHOD AND MASS SPECTROMETER | Final Rejection | SHIMADZU CORPORATION |
| 18188458 | PARTICLE BEAM IRRADIATION APPARATUS | Final Rejection | SUMITOMO HEAVY INDUSTRIES, LTD. |
| 17976967 | INTEGRATED MICROFLUIDIC PROBE (iMFP) AND METHODS OF USE THEREOF | Final Rejection | Purdue Research Foundation |
| 17609114 | INTEGRATED MICROFLUIDIC PROBE (IMFP) AND METHODS OF USE THEREOF | Final Rejection | Purdue Research Foundation |
| 18269318 | ACTIVE ENERGY IRRADIATION DEVICE AND ACTIVE ENERGY IRRADIATION SYSTEM | Non-Final OA | HAMAMATSU PHOTONICS K.K. |
| 18018314 | SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD | Final Rejection | HAMAMATSU PHOTONICS K.K. |
| 18121722 | APPARATUS FOR ANALYZING AND/OR PROCESSING A SAMPLE WITH A PARTICLE BEAM AND METHOD | Final Rejection | Carl Zeiss SMT GmbH |
| 18178205 | Surface Hydration with an Ion Beam | Non-Final OA | Wisconsin Alumni Research Foundation |
| 18257146 | METHOD FOR EVALUATING COMPATIBILITY OF THERMOSETTING RESIN COMPOSITION, THERMOSETTING RESIN COMPOSITION, PREPREG, RESIN FILM, LAMINATED PLATE, MULTILAYER PRINTED WIRING BOARD, AND SEMICONDUCTOR PACKAGE | Non-Final OA | Resonac Corporation |
| 18686385 | METHOD FOR ENHANCING INFORMATION IN DDA MASS SPECTROMETRY | Non-Final OA | DH Technologies Development Pte. Ltd. |
| 18685537 | System and Method of Driving Radio Frequency for Multipole Ion Processing Device | Non-Final OA | DH Technologies Development Pte. Ltd. |
| 18019546 | Systems and Methods for Separating Compounds of Similar Mass by Differential Mobility Spectrometry | Non-Final OA | DH Technologies Development Pte. Ltd. |
| 18016173 | Electron Activation Dissociation Reaction Device with Ion Isolation Functionality in Mass Spectrometry | Non-Final OA | DH Technologies Development Pte. Ltd. |
| 17999814 | MASS ANALYSIS | Non-Final OA | DH TECHNOLOGIES DEVELOPMENT PTE. LTD. |
| 17755597 | Method of Mass Analysis - SWATH with Orthogonal Fragmentation Methodology | Non-Final OA | DH TECHNOLOGIES DEVELOPMENT PTE. LTD. |
| 18635723 | BLANKING APERTURE ARRAY SYSTEM AND CHARGED PARTICLE BEAM WRITING APPARATUS | Final Rejection | NuFlare Technology, Inc. |
| 18595532 | ELECTRONIC COMPONENT AND CHARGED PARTICLE BEAM IRRADIATION APPARATUS | Non-Final OA | NuFlare Technology, Inc. |
| 18148052 | SIDE-BAND COOLING CONFIGURATION FOR TRAPPED IONS | Final Rejection | IonQ, Inc. |
| 18108429 | ION IMPLANTER AND ION IMPLANTATION METHOD | Non-Final OA | Sumitomo Heavy Industries Material Solutions Co., Ltd. |
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