Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2852 2877 2881
This examiner grants 89% of resolved cases
NGUYEN, KIET TUAN operates within Tech Center 2800 and Art Unit 2852, where they have managed 685 resolved cases. This volume of cases indicates the examiner's level of experience in handling patent applications within this technology sector. The examiner maintains an allowance rate of 88.9 percent, which provides a baseline for the probability of securing a patent grant. This percentage suggests the likelihood that an application reaching a final disposition will be allowed. Practitioners can use this figure to gauge the general receptivity of the examiner to patentable subject matter.
The data shows an interview lift of 0.0 percent, indicating how direct communication correlates with the probability of success. The interview lift of 0.0 percent is lower than the 88.9 percent allowance rate, which helps determine the relative impact of verbal engagement. The median days to allowance stands at 763, providing a timeline expectation for the prosecution process from filing to grant. This duration reflects the typical pendency for successful applications. Understanding these metrics allows for a more informed strategy when navigating the examination process with this examiner.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18730841 | MASS SPECTROMETRY DEVICE AND RF TUNING METHOD OF MASS SPECTROMETRY DEVICE | Non-Final OA | HITACHI HIGH-TECH CORPORATION |
| 18784525 | APPARATUS AND METHOD FOR GENERATING EXTREME ULTRAVIOLET RADIATION | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18535477 | METHOD AND APPARATUS FOR MONITORING AN EXTREME ULTRAVIOLET RADIATION SOURCE | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18782095 | ION IMPLANTATION SYSTEM | Non-Final OA | TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LIMITED |
| 18793576 | ION PROBE WITH COUPLING TO PLASMA | Non-Final OA | APPLIED MATERIALS, INC. |
| 18687849 | Device for Disinfecting a Surface Using a Light Source | Non-Final OA | Becton, Dickinson and Company |
| 18277643 | MASS SPECTROMETRY DEVICE AND MASS SPECTROMETRY METHOD | Non-Final OA | HAMAMATSU PHOTONICS K.K. |
| 18428340 | ION GUIDE ELECTRODE CONFIGURATIONS FOR ION TRANSPORT AND CONFINEMENT | Non-Final OA | Thermo Fisher Scientific (Bremen) GmbH |
| 18738393 | SYSTEMS AND METHODS OF SEM INSPECTION USING SELECTIVE SCAN APPROACH | Non-Final OA | KLA Corporation |
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