Tech Center 2800 • Art Units: 2858 2877
This examiner grants 57% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18394784 | SEMICONDUCTOR MEASUREMENT APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING SEMICONDUCTOR MEASUREMENT APPARATUS | Final Rejection | Samsung Electronics Co., Ltd. |
| 18136798 | ON-WAFER TEST MECHANISM FOR WAVEGUIDES | Non-Final OA | GOOGLE LLC |
| 18382299 | METHOD AND APPARATUS FOR IMPROVING SIDELOBE CANCELLATION IN CODED OPTICAL TIME-DOMAIN REFLECTOMETRY | Non-Final OA | HUAWEI TECHNOLOGIES CO., LTD. |
| 19088648 | SENSOR UNIT | Non-Final OA | CANON KABUSHIKI KAISHA |
| 18070905 | Laser Interferometer | Non-Final OA | SEIKO EPSON CORPORATION |
| 18411409 | EARLY FIRE DETECTION APPARATUS AND METHOD BASED ON UNWANTED ALARM PREVENTION FUNCTION | Non-Final OA | ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE |
| 17851191 | ANALYSIS METHOD AND SEMICONDUCTOR ETCHING APPARATUS | Final Rejection | HITACHI HIGH-TECH CORPORATION |
| 18379584 | OPTICAL SENSOR DEVICE | Final Rejection | Mitsubishi Electric Corporation |
| 18062261 | METHODS AND RELATED ASPECTS OF TRACKING MOLECULAR INTERACTIONS | Non-Final OA | ARIZONA BOARD OF REGENTS ON BEHALF OF ARIZONA STATE UNIVERSITY |
| 17765054 | DIFFRACTIVE IMAGING MAGNETO-OPTICAL SYSTEM | Non-Final OA | Rensselaer Polytechnic Institute |
| 18152409 | Defect Inspection System and Method | Non-Final OA | Taiwan Semiconductor Manufacturing Co., Ltd. |
| 18899426 | OUTLET FITTINGS FOR REDUCING BUBBLES AT THE INTERFACE WITH A FLOW CELL, AND FLOW CYTOMETERS AND METHODS USING THE SAME | Non-Final OA | Becton, Dickinson and Company |
| 18232470 | ESTIMATING A COEFFICIENT OF TRACTION | Non-Final OA | The Goodyear Tire & Rubber Company |
| 18166905 | FUSION BOND BASED WAFER-LEVEL-PACKAGE FOR MID-INFRARED GAS SENSOR SYSTEM | Non-Final OA | Infineon Technologies AG |
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