Listed by the USPTO as TON, TRI T
Tech Center 2800 • Art Units: 1645 2800 2877
This examiner grants 86% of resolved cases
TON, TRI T works in tech center 2800 and art unit 1645. The record includes 1201 resolved cases, an 86.1% allowance rate, and a median of 761 days to allowance. Interviews are associated with a 10.5% lift, which is a measurable consideration but not the defining feature of the profile's prosecution results.
Representative companies are Kabushiki Kaisha Toshiba, Taiwan Semiconductor Manufacturing Company, Ltd., and Becton, Dickinson and Company. The listed firms are CANTOR COLBURN LLP, FINNEGAN, HENDERSON, FARABOW, GARRETT & DUNNER, and MYERS BIGEL, P.A. The large record provides a substantial basis for reviewing expected treatment in this art unit.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18910356 | SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD | Non-Final OA | Samsung Display Co., LTD. |
| 18643002 | UTILITY POLE DETERIORATION DETECTION SYSTEM, UTILITY POLE DETERIORATION DETECTION APPARATUS, UTILITY POLE DETERIORATION DETECTION METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUM | Non-Final OA | NEC Corporation |
| 19176158 | Spectrometer | Non-Final OA | THALES |
| 19073640 | P-TYPE SILICON WAFER SCATTERING SUBSTRATE | Non-Final OA | KING FAHD UNIVERSITY OF PETROLEUM AND MINERALS |
| 18855662 | ELECTROMAGNETIC WAVE DETECTOR AND ELECTROMAGNETIC WAVE DETECTOR ARRAY | Final Rejection | Mitsubishi Electric Corporation |
| 19019194 | WAFER PROCESSING SYSTEMS, WAFER TRANSPORT DEVICES, AND RELATED METHODS | Non-Final OA | Micron Technology, Inc. |
| 18913285 | OBJECT THICKNESS MEASURING APPARATUS AND METHOD | Final Rejection | Samsung SDI Co., Ltd. |
| 18962220 | METHOD FOR INSPECTING PATTERN DEFECTS | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18792873 | SURFACE INSPECTION TOOL FOR TRANSFER TOOLS AND METHODS OF USING THE SAME | Final Rejection | Taiwan Semiconductor Manufacturing Company Limited |
| 18805013 | Droplet Sorting Decision Modules, Systems and Methods of Use Thereof | Final Rejection | Becton, Dickinson and Company |
| 18232344 | Method for determining a quality of a cable surface | Non-Final OA | NEXANS |
IP Author analyzes examiner patterns and generates tailored response strategies with the highest chance of allowance.
Build Your Strategy86.1% of resolved applications examined by Tri T Ton were allowed (1,201 resolved cases), compared with 49.5% across Art Unit 1645 over the last five years.
This examiner's interview lift is +10.5 percentage points: the difference in allowance rate between resolved applications that had an examiner interview and those that did not.
Applications allowed by Tri T Ton took 761 days on average from filing to allowance.
Tri T Ton examines applications in Art Unit 1645 in Tech Center 2800 (Semiconductors, Circuits & Optics).
