Tech Center 2800 • Art Units: 2877
This examiner grants 74% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 17790350 | TURBIDITY SENSOR AND METHOD FOR CONTROLLING TURBIDITY SENSOR | Final Rejection | LG ELECTRONICS INC. |
| 18805150 | IN-SITU FILM GROWTH RATE MONITORING APPARATUS, SYSTEMS, AND METHODS FOR SUBSTRATE PROCESSING | Non-Final OA | Applied Materials, Inc. |
| 17277862 | EXCREMENT MANAGEMENT SYSTEM, EXCRETION INFORMATION MANAGEMENT METHOD, COMPUTER PROGRAM, EDGE SERVER, AND TOILET SEAT DEVICE | Non-Final OA | TOTO LTD. |
| 18432275 | SEMICONDUCTOR MANUFACTURING APPARATUS AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD | Non-Final OA | Kioxia Corporation |
| 18712007 | OPTICAL FIBER CHARACTERISTIC MEASUREMENT DEVICE AND OPTICAL FIBER CHARACTERISTIC MEASUREMENT METHOD | Non-Final OA | Yokogawa Electric Corporation |
| 18471167 | FLUID COMPOSITION SENSOR DEVICE AND METHOD OF USING THE SAME | Final Rejection | Honeywell International Inc. |
| 18683649 | METHOD AND APPARATUS FOR BONDING OF OPTICAL SURFACES BY ACTIVE ALIGNMENT | Non-Final OA | LUMUS LTD. |
| 18615783 | DEVICE WITH A MEASURING CELL FOR MEASURING A MEASURED VARIABLE OF A MEDIUM FLOWING THROUGH A MEASURING CELL | Non-Final OA | Endress+Hauser Conducta GmbH+Co. KG |
| 18292709 | CUVETTE FOR A PHOTOMETRIC MEASUREMENT OF A SAMPLE, METHOD FOR A PHOTOMETRIC MEASUREMENT OF A SAMPLE, SYSTEM FOR A PHOTOMETRIC ANALYSIS OF A SAMPLE AND METHOD FOR A PHOTOMETRIC ANALYSIS OF A SAMPLE | Final Rejection | HACH LANGE GMBH |
| 18685602 | ESTIMATION METHOD, MEASUREMENT METHOD, AND INFORMATION PROCESSING DEVICE | Non-Final OA | FUJIKURA LTD. |
| 18819095 | METHOD AND APPARATUS FOR SPECTRAL IMAGING | Non-Final OA | Teknologian tutkimuskeskus VTT Oy |
| 18197952 | PARTICLE ANALYSIS USING LIGHT MICROSCOPE AND MULTI-PIXEL POLARIZATION FILTER | Final Rejection | Carl Zeiss Microscopy GmbH |
| 18438678 | METHOD AND DEVICE FOR PHOTONIC SAMPLING OF A TEST WAVE-FORM | Non-Final OA | Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. |
| 18011176 | MEASURING SYSTEM AND METHOD FOR MEASURING LIGHT SOURCES | Final Rejection | Instrument Systems GmbH |
| 18024518 | ANALYZER AND METHOD FOR ANALYZING A SAMPLE | Final Rejection | i-Abra Limited |
| 17928665 | METHOD FOR DETERMINING AT LEAST ONE CHARACTERISTIC VARIABLE OF A PARTICLE SIZE DISTRIBUTION AND A DEVICE COMPRISING A MEASURING APPARATUS | Non-Final OA | TEWS Elektronik GmbH & Co. KG |
| 17996625 | METHOD AND SYSTEM FOR DETERMINING ONE OR MORE DIMENSIONS OF ONE OR MORE STRUCTURES ON A SAMPLE SURFACE | Non-Final OA | TERANOVA B.V. |
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