Prosecution Insights
Last updated: October 02, 2026

Examiner: TRAN, JUDY DAO

Tech Center 2800 • Art Units: 1742 2877

This examiner grants 79% of resolved cases

Analysis

Judy Dao Tran is an examiner in Art Unit 1742, part of Tech Center 2800, with 84 resolved cases. The allowance rate is 78.6 percent, which is a strong and favorable figure for applicants. The median days to allowance is 991 days, suggesting a prosecution cycle that lasts a specific duration. This 991-day median is a baseline for planning and budgeting during the examination process in Art Unit 1742.

The interview lift of 19.5 percent indicates that interviews can provide a significant advantage. For the 84 resolved cases, the 19.5 percent lift shows that the examiner is responsive to direct communication. Practitioners in Tech Center 2800 should consider interviews as a way to further solidify their chances of success, especially if they encounter initial rejections. The 991-day timeline remains a factor, but the 19.5 percent lift offers a way to potentially expedite the process.

Overall, the 78.6 percent allowance rate and 991-day median to allowance make this examiner a favorable one for many applicants. The 84 resolved cases provide a statistical foundation for these metrics. By understanding the 19.5 percent interview lift, practitioners can refine their approach in Art Unit 1742 to ensure an efficient path through Tech Center 2800.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

78.6%
Allow Rate
+10.6% vs TC avg
102
Total Applications
+19.5%
Interview Lift
991
Avg Prosecution Days
Based on 84 resolved cases, 2023–2026

Rejection Statute Breakdown

2.1%
§101 Eligibility
18.3%
§102 Novelty
52.1%
§103 Obviousness
24.9%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18691147 MATERIAL ESTIMATION DEVICE, MATERIAL ESTIMATION SYSTEM, AND MATERIAL ESTIMATION METHOD Final Rejection NEC Corporation
18683772 THERMOGRAPHIC INSPECTION APPARATUS AND INSPECTION METHOD Non-Final OA RICOH COMPANY, LTD.
18995479 END-FACE OBSERVATION DEVICE FOR OPTICAL FIBER AND METHOD OF OBSERVING END FACE OF OPTICAL FIBER Non-Final OA SUMITOMO ELECTRIC INDUSTRIES, LTD.
19202622 INSPECTION DEVICE WITH METASURFACE POLARIZATION BEAM SPLITTER Non-Final OA CORNING INCORPORATED
18977795 Methods And Systems For Reflectometry Based Measurements Of Deep, Large Pitch Semiconductor Structures Non-Final OA KLA Corporation
18941459 POSITION FEEDBACK SENSOR USING OUT-OF-BAND WAVELENGTHS Non-Final OA KLA CORPORATION
18941011 DETECTION DEVICE, OPTICAL SYSTEM INCLUDING THE SAME, AND METHOD FOR DETECTING CONCENTRATION USING THE SAME Non-Final OA VisEra Technologies Company Limited

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