Tech Center 2800 • Art Units: 2882 2884
This examiner grants 87% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18749191 | VOLUMETRIC SILICON META-OPTICS FOR COMPACT AND LOW-POWER TERAHERTZ SPECTROMETERS | Non-Final OA | California Institute of Technology |
| 18643687 | SPECTRALLY RESOLVED X-RAY IMAGING | Non-Final OA | Siemens Healthineers AG |
| 18553283 | NONDESTRUCTIVE INSPECTING DEVICE | Non-Final OA | RIKEN |
| 18725845 | OPTICAL MEMBER, OPTICAL ELEMENT AND METHOD FOR PRODUCING OPTICAL MEMBER | Non-Final OA | HAMAMATSU PHOTONICS K.K. |
| 18669893 | System And Method For Imaging A Subject | Non-Final OA | Medtronic Navigation, Inc. |
| 18586409 | SYSTEMS AND METHODS FOR DRIVING LEAVES IN A MULTI-LEAF COLLIMATOR | Non-Final OA | SHANGHAI UNITED IMAGING HEALTHCARE CO., LTD. |
| 18648897 | High-Definition Broad-Band Visible-shortwave Infrared (SWIR) Sensors for Laser Detection | Non-Final OA | SWIR Vision Systems Inc. |
| 18637764 | TRIGGERED TREATMENT SYSTEMS AND METHODS | Non-Final OA | Siemens Healthineers International AG. |
| 18394623 | METHOD AND SYSTEM FOR MONITORING DEPOSITION PROCESS | Non-Final OA | NOVA MEASURING INSTRUMENTS, INC. |
| 18453266 | FEED-FORWARD OF MULTI-LAYER AND MULTI-PROCESS INFORMATION USING XPS AND XRF TECHNOLOGIES | Final Rejection | NOVA MEASURING INSTRUMENTS INC. |
| 18711014 | ELECTRIC FIELD EMISSION DEVICE | Non-Final OA | WASEDA UNIVERSITY |
| 18527721 | MONOCHROMATIC X-RAY IMAGING SYSTEMS AND METHODS | Non-Final OA | Imagine Scientific, Inc. |
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