Prosecution Insights
Last updated: April 19, 2026
Application No. 17/507,201

LIGHT EMITTING DIODE PACKAGES

Final Rejection §102§103
Filed
Oct 21, 2021
Examiner
LI, MEIYA
Art Unit
2811
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Creeled Inc.
OA Round
6 (Final)
69%
Grant Probability
Favorable
7-8
OA Rounds
3y 8m
To Grant
95%
With Interview

Examiner Intelligence

Grants 69% — above average
69%
Career Allow Rate
628 granted / 912 resolved
+0.9% vs TC avg
Strong +26% interview lift
Without
With
+26.0%
Interview Lift
resolved cases with interview
Typical timeline
3y 8m
Avg Prosecution
52 currently pending
Career history
964
Total Applications
across all art units

Statute-Specific Performance

§101
0.1%
-39.9% vs TC avg
§103
34.3%
-5.7% vs TC avg
§102
26.5%
-13.5% vs TC avg
§112
36.0%
-4.0% vs TC avg
Black line = Tech Center average estimate • Based on career data from 912 resolved cases

Office Action

§102 §103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 The text of those sections of Title 35, U.S. Code not included in this action can be found in a prior Office action. Claim(s) 1-6, 9 and 11-13 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Yamada al. (2016/0260873). As for claim 1, Yamada et al. show in Fig. 8 and related text a light emitting diode (LED) package 600, comprising: an LED chip 14 comprising a first face, a second face, and a chip sidewall therebetween, and a first contact 13 (left) and a second contact 13 (right); a lead frame 12 comprising a first lead frame portion 12 (left) and a second lead frame portion 12 (right), wherein the first contact is attached to the first lead frame portion and the second contact is attached to the second lead frame portion; an insulating material 11 at least partially surrounding the lead frame, the insulating material forming a recess with recess sidewalls such that the LED chip resides within the recess; a underfill material 16 arranged between the LED chip and the lead frame, wherein an interface between the first contact and the first lead frame portion and another interface between the second contact and the second lead frame portion are devoid of the underfill material, and wherein the underfill material covers a portion of the chip sidewall and extends from the chip sidewall to the recess sidewalls; and an encapsulant material 17/18/19/20 arranged on the LED chip and the underfill material, the encapsulant material filling the recess between the underfill material and the recess sidewalls. As for claim 2, Yamada et al. show the first contact of the LED chip is flip-chip mounted to the first lead frame portion, and the second contact of the LED chip is flip-chip mounted to the second lead frame portion (Fig. 8; [0077]). As for claim 3, Yamada et al. show the underfill material is arranged between the first lead frame portion and the second lead frame portion (Fig. 8). As for claim 4, Yamada et al. show the underfill material is arranged between the first contact of the LED chip and the second contact of the LED chip (Fig. 8). As for claim 5, Yamada et al. show the underfill material is arranged between lateral edges of the LED chip and the lead frame (Fig. 8). As for claim 6, Yamada et al. show the underfill material is configured to redirect light from the LED chip away from the lead frame ([0082]). As for claim 9, Yamada et al. show the underfill material comprises epoxy ([0086]). As for claim 11, Yamada et al. show the underfill material comprises a material with a durometer value on a Shore D hardness scale of at least 40 ([0081]; note: the durometer value on a Shore D hardness scale of epoxy is in range from 70-90). As for claim 12, Yamada et al. show the durometer value is in a range from 40 to 100 ([0081]; note: the durometer value on a Shore D hardness scale of epoxy is in range from 70-90). As for claim 13, Yamada et al. show recess sidewalls comprise reflective sidewalls (Fig. 8; [0161]). Claim Rejections - 35 USC § 103 The text of those sections of Title 35, U.S. Code not included in this action can be found in a prior Office action. Claim(s) 7 and 8 is/are rejected under 35 U.S.C. 103 as being unpatentable over Yamada et al. (2016/0260873) in view of Ikeda et al. (2017/0092817). As for claim 7, Yamada et al. disclosed substantially the entire claimed invention, as applied to claim 1 above, except the underfill material comprises titanium dioxide (TiO2). Ikeda et al. teach in Fig. 11 and related text the underfill material 205 comprises titanium dioxide (TiO2) ([0150]). Yamada et al. and Ikeda et al. are analogous art because they are directed to a semiconductor package and one of ordinary skill in the art would have had a reasonable expectation of success to modify Yamada et al. with the specified feature(s) of Ikeda et al. because they are from the same field of endeavor. It would have been obvious to one of ordinary skill in the art, before the effective filing date of the claimed invention to include the underfill material comprising titanium oxide, as taught by Ikeda et al., in Yamada et al.’s device, in order to improve the light extraction efficiency of the device. As for claim 8, the combined device shows the underfill material further comprises silicone (Yamada: [0081]; Ikeda: [0150]). Claim Rejections - 35 USC § 102/103 The text of those sections of Title 35, U.S. Code not included in this action can be found in a prior Office action. Claim(s) 10 is/are rejected under 35 U.S.C. 102(a)(1) as anticipated by or, in the alternative, under 35 U.S.C. 103 as obvious over Yamada et al. (2016/0260873) in view of Puschner et al. (2006/0049532). Yamada et al. disclose the underfill material comprises a material with a durometer value on a Shore D hardness scale that is higher than a durometer value of the encapsulant material ([0081]: epoxy; [0085]: phenyl silicone; note: epoxy has a higher durometer value on a Shore D hardness than phenyl silicone). Alternatively, Puschner et al. teach in Fig. 1 and related text the underfill material 3 comprises a material with a durometer value on a Shore D hardness scale that is higher than a durometer value of the encapsulant material 6 ([0019], [0022], [0033] and [0040]). Yamada et al. and Puschner et al. are analogous art because they are directed to a semiconductor package and one of ordinary skill in the art would have had a reasonable expectation of success to modify Yamada et al. with the specified feature(s) of Puschner et al. because they are from the same field of endeavor. It would have been obvious to one of ordinary skill in the art, before the effective filing date of the claimed invention to include the underfill material comprising a material with a durometer value on a Shore D hardness scale that being higher than a durometer value of the encapsulant material, as taught by Puschner et al., in Yamada et al.'s device, in order to provide a better flexibility, prevent the device from cracking and improve the performance of the device. Response to Arguments Applicant’s arguments with respect to claim(s) 1-13 have been considered but are moot because the new ground of rejection does not rely on any reference applied in the prior rejection of record for any teaching or matter specifically challenged in the argument. Conclusion Applicant's amendment necessitated the new ground(s) of rejection presented in this Office action. Accordingly, THIS ACTION IS MADE FINAL. See MPEP § 706.07(a). Applicant is reminded of the extension of time policy as set forth in 37 CFR 1.136(a). A shortened statutory period for reply to this final action is set to expire THREE MONTHS from the mailing date of this action. In the event a first reply is filed within TWO MONTHS of the mailing date of this final action and the advisory action is not mailed until after the end of the THREE-MONTH shortened statutory period, then the shortened statutory period will expire on the date the advisory action is mailed, and any nonprovisional extension fee (37 CFR 1.17(a)) pursuant to 37 CFR 1.136(a) will be calculated from the mailing date of the advisory action. In no event, however, will the statutory period for reply expire later than SIX MONTHS from the mailing date of this final action. Any inquiry concerning this communication or earlier communications from the examiner should be directed to MEIYA LI whose telephone number is (571)270-1572. The examiner can normally be reached Monday-Friday 7AM-3PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, LYNNE GURLEY can be reached on (571)272-1670. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /MEIYA LI/Primary Examiner, Art Unit 2811
Read full office action

Prosecution Timeline

Oct 21, 2021
Application Filed
Oct 21, 2022
Non-Final Rejection — §102, §103
Jan 24, 2023
Response Filed
Feb 07, 2023
Final Rejection — §102, §103
Mar 30, 2023
Response after Non-Final Action
May 09, 2023
Request for Continued Examination
May 21, 2023
Response after Non-Final Action
May 02, 2024
Non-Final Rejection — §102, §103
Jul 22, 2024
Response Filed
Oct 25, 2024
Final Rejection — §102, §103
Dec 19, 2024
Response after Non-Final Action
Jan 27, 2025
Request for Continued Examination
Jan 29, 2025
Response after Non-Final Action
Nov 05, 2025
Non-Final Rejection — §102, §103
Feb 05, 2026
Examiner Interview Summary
Feb 05, 2026
Applicant Interview (Telephonic)
Feb 06, 2026
Response Filed
Feb 24, 2026
Final Rejection — §102, §103 (current)

Precedent Cases

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

7-8
Expected OA Rounds
69%
Grant Probability
95%
With Interview (+26.0%)
3y 8m
Median Time to Grant
High
PTA Risk
Based on 912 resolved cases by this examiner. Grant probability derived from career allow rate.

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