Prosecution Insights
Last updated: April 19, 2026
Application No. 17/860,392

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE WITH FIXING FEATURE ON WHICH BONDING WIRE IS DISPOSED

Final Rejection §102
Filed
Jul 08, 2022
Examiner
SUN, YU-HSI DAVID
Art Unit
2817
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Nanya Technology Corporation
OA Round
4 (Final)
77%
Grant Probability
Favorable
5-6
OA Rounds
2y 9m
To Grant
85%
With Interview

Examiner Intelligence

Grants 77% — above average
77%
Career Allow Rate
648 granted / 845 resolved
+8.7% vs TC avg
Moderate +8% lift
Without
With
+8.4%
Interview Lift
resolved cases with interview
Typical timeline
2y 9m
Avg Prosecution
27 currently pending
Career history
872
Total Applications
across all art units

Statute-Specific Performance

§101
3.0%
-37.0% vs TC avg
§103
45.9%
+5.9% vs TC avg
§102
25.5%
-14.5% vs TC avg
§112
16.6%
-23.4% vs TC avg
Black line = Tech Center average estimate • Based on career data from 845 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claims 1-3, 5-7, 9, 10 and 13-17 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by OH et al. (US PG Pub 2012/0049386, hereinafter Oh). Regarding claim 1, figure 1 of Oh discloses a method of manufacturing a semiconductor device, comprising: providing a substrate (110); attaching an electronic component (120) to the substrate; attaching a fixing feature (140) to an upper surface of the electronic component, wherein the fixing feature extends along the upper surface of the electric component and includes a portion extends beyond a lateral surface of the electronic component; and forming a bonding wire (150) connecting the substrate and the electronic component, wherein the bonding wire is at least partially disposed on the fixing feature, and the fixing feature is disposed between the bonding wire and the exposed area of the substrate, and an end of the portion of the fixing feature is in contact with the bonding wire. Regarding claim 2, figure 1 of Oh discloses the fixing feature (140) is spaced apart from the lateral surface of the electronic component (120). Regarding claim 3, figure 1 of Oh discloses the portion of the fixing feature (140) is slanted with respect to the lateral surface of the electronic component (120). Regarding claim 5, figure 1 of Oh discloses a method of manufacturing a semiconductor device, comprising: providing a substrate (110); disposing an electronic component (120) on the substrate; forming a bonding wire (150) comprising a first terminal connected to the electronic component and a second terminal connected to the substrate; and forming a fixing feature (140) on the substrate, wherein the bonding wire is at least partially on the fixing feature, and the fixing feature extends along an upper surface of the electric component; wherein the fixing feature has a first portion over an upper surface of the electronic component and a second portion spaced apart from the upper surface of the electronic component and extending beyond a lateral surface of the electronic component, and an end of the second portion of the fixing feature is in contact with the bonding wire. Regarding claim 6, figure 1 of Oh discloses the fixing feature (140) is spaced apart from the lateral surface of the electronic component (120). Regarding claim 7, figure 1 of Oh discloses forming an encapsulant (160) encapsulating the electronic component (120), wherein the fixing feature (140) is spaced apart from the lateral surface of the electronic component by the encapsulant. Regarding claim 9, figure 1 of Oh discloses the second portion of the fixing feature (140) is slanted with respect to the lateral surface of the electronic component (120). Regarding claim 10, figure 1 of Oh discloses the second portion of the fixing feature (140) is spaced apart from an upper surface of the substrate (120). Regarding claim 13, figure 1 of Oh discloses the bonding wire (150) is conformally on the second portion of the fixing feature (140). Regarding claim 14, figure 1 of Oh discloses the bonding wire (150) is spaced apart from the first portion of the fixing feature (140). Regarding claim 15, figure 1 of Oh discloses the fixing feature (140) extends from the first terminal of the bonding wire (150) to the second terminal of the bonding wire. Regarding claim 16, figure 1 of Oh discloses the bonding wire (150) is against a corner of the electronic component (120), wherein the corner of the electronic component is defined by an upper surface and a lateral surface of the electronic component. Regarding claim 17, figure 1 of Oh discloses the fixing feature (140) is in contact with an upper surface of the electronic component (120). Response to Arguments Applicant's arguments filed 10/23/2025 have been fully considered but they are not persuasive. Applicants argue that Oh shows the end of the contact-preventing portion 144 is not in contact with the conductive connecting member 150. However, the claimed “portion” of the fixing feature can be interpreted such that an “end of the portion” coincides with the section that is in contact with the wire 150. The claim does not specifically delineate where the “portion” starts and ends. For at least the aforementioned reasons, the rejection is deemed proper and made final. Conclusion Applicant's amendment necessitated the new ground(s) of rejection presented in this Office action. Accordingly, THIS ACTION IS MADE FINAL. See MPEP § 706.07(a). Applicant is reminded of the extension of time policy as set forth in 37 CFR 1.136(a). A shortened statutory period for reply to this final action is set to expire THREE MONTHS from the mailing date of this action. In the event a first reply is filed within TWO MONTHS of the mailing date of this final action and the advisory action is not mailed until after the end of the THREE-MONTH shortened statutory period, then the shortened statutory period will expire on the date the advisory action is mailed, and any nonprovisional extension fee (37 CFR 1.17(a)) pursuant to 37 CFR 1.136(a) will be calculated from the mailing date of the advisory action. In no event, however, will the statutory period for reply expire later than SIX MONTHS from the mailing date of this final action. Any inquiry concerning this communication or earlier communications from the examiner should be directed to YU-HSI DAVID SUN whose telephone number is (571)270-5773. The examiner can normally be reached Mon-Fri 8am-4pm ET. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Marlon Fletcher can be reached on 571-272-2063. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /YU-HSI D SUN/ Primary Examiner, Art Unit 2817
Read full office action

Prosecution Timeline

Jul 08, 2022
Application Filed
Feb 10, 2025
Non-Final Rejection — §102
Apr 15, 2025
Response Filed
Jun 02, 2025
Final Rejection — §102
Jul 28, 2025
Request for Continued Examination
Jul 31, 2025
Response after Non-Final Action
Sep 08, 2025
Non-Final Rejection — §102
Oct 23, 2025
Response Filed
Dec 15, 2025
Final Rejection — §102 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12604693
METHOD OF MANUFACTURING CHIPS
2y 5m to grant Granted Apr 14, 2026
Patent 12598821
CHIP PACKAGE STRUCTURE AND METHOD FOR PRODUCING THE SAME
2y 5m to grant Granted Apr 07, 2026
Patent 12593717
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
2y 5m to grant Granted Mar 31, 2026
Patent 12581982
BONDING WIRE FOR SEMICONDUCTOR DEVICES
2y 5m to grant Granted Mar 17, 2026
Patent 12582016
SEMICONDUCTOR DEVICE
2y 5m to grant Granted Mar 17, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

5-6
Expected OA Rounds
77%
Grant Probability
85%
With Interview (+8.4%)
2y 9m
Median Time to Grant
High
PTA Risk
Based on 845 resolved cases by this examiner. Grant probability derived from career allow rate.

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