Prosecution Insights
Last updated: July 05, 2026
Application No. 18/156,960

MULTIPLE DIE STRUCTURE AND METHOD OF FABRICATING THEREOF

Final Rejection §112
Filed
Jan 19, 2023
Priority
Sep 13, 2022 — provisional 63/375,401
Examiner
BERRY, PAUL ANTHONY
Art Unit
2898
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Taiwan Semiconductor Manufacturing Company, Ltd.
OA Round
2 (Final)
92%
Grant Probability
Favorable
3-4
OA Rounds
0m
Est. Remaining
97%
With Interview

Examiner Intelligence

Grants 92% — above average
92%
Career Allowance Rate
35 granted / 38 resolved
+24.1% vs TC avg
Moderate +5% lift
Without
With
+5.3%
Interview Lift
resolved cases with interview
Typical timeline
3y 3m
Avg Prosecution
33 currently pending
Career history
90
Total Applications
across all art units

Statute-Specific Performance

§103
91.9%
+51.9% vs TC avg
§102
3.3%
-36.7% vs TC avg
§112
4.8%
-35.2% vs TC avg
Black line = Tech Center average estimate • Based on career data from 38 resolved cases

Office Action

§112
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Specification Specification amendments of Para [0010] made in Applicant Arguments dated 01/30/2026 are accepted. Response to Arguments Applicant’s arguments with respect to claim(s) 10 and 12-15 have been considered but are moot because the new ground of rejection does not rely on any reference applied in the prior rejection of record for any teaching or matter specifically challenged in the argument. Applicant’s arguments, see Applicant Arguments, filed 01/30/2026, with respect to amended claims 1 and 3-9 have been fully considered and are persuasive. The rejection of claims 1 and 3-9 has been withdrawn. Claim Rejections - 35 USC § 112 The following is a quotation of 35 U.S.C. 112(b): (b) CONCLUSION.—The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the inventor or a joint inventor regards as the invention. The following is a quotation of 35 U.S.C. 112 (pre-AIA ), second paragraph: The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the applicant regards as his invention. Claims 10 and 12-15 are rejected under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor (or for applications subject to pre-AIA 35 U.S.C. 112, the applicant), regards as the invention. Regarding Claim 10, starting in the 17th line, it recites the limitation “after the dicing process, providing the wafer having the first die separated from the third die and the first die connected by the bridge to the third die to a pick and place operation”. It is unclear how the first die can be separated from the third die and at the same time be connected by the bridge to the third die. As there only prior reference to a bridge is a bridge between the first and third die, Examiner is unsure how to interpret this limitation. Claim 10 recites the limitation "…mounting the first die and the second die connected by the bridge…" in the 19th and 20th lines of the claim. There is insufficient antecedent basis for this limitation in the claim. A bridge between the first and third die is cited in the claim but there is no prior recitation of a bridge between the first and second die. Allowable Subject Matter Claims 1, 3-9 and 26-32 are allowed. The following is a statement of reasons for the indication of allowable subject matter: Regarding Claim 1, Allowable subject matter has been indicated because the closest prior art of record, either alone or in combination, fails to teach or fairly suggest the feature: “after performing the partial cut on the first scribe line and the partial cut on the second scribe line, performing a full cut on the second scribe line to remove the another bridge and singulate the third die; after performing the partial cut, using a first pick and place process for mounting the first die and the second die on a substrate, wherein the first die and the second die are connected by a portion of the first scribe line the bridge during the mounting; and after the full cut, using a second pick and place process for mounting the third die” along with the rest of the limitations of said claim. Closest prior art of record, Wu et al. (US 2013/0049195 A1), teaches a wafer of die, and a dicing process to make partial cuts on scribe lines between the die to form a bridge connecting die. However Wu et al. fails to disclose performing a second full cut to separate sets of dies and after the partial cut using a pick and place method to mount die singulated die connected by the bridge and after the full cut using a second pick and place process to mount a third die. Closest prior art of record, Chinnusamy (US 2017/0032981 A1), also teaches a wafer of die, and a dicing process to make partial cuts on scribe lines between the die to form a bridge connecting die. However Chinnusamy fails to disclose performing a second full cut to separate sets of dies and after the partial cut using a pick and place method to mount die singulated die connected by the bridge and after the full cut using a second pick and place process to mount a third die. The following is a statement of reasons for the indication of allowable subject matter: Regarding Claim 26, Allowable subject matter has been indicated because the closest prior art of record, either alone or in combination, fails to teach or fairly suggest the feature: “after performing the first pass, performing a second pass with the saw blade to perform a full cut within each of a first subset of the plurality of scribe lines while maintaining the partial cut in a second subset of the plurality of scribe lines; and after performing the dicing process, providing the diced wafer to a pick and place operation, wherein the provided diced wafer has a plurality of singulated die adjacent the first subset of the plurality of scribe lines and a plurality of die groups including the second subset of the plurality of scribe lines, wherein each die group includes at least two die separated by one scribe line of the second subset of scribe lines” along with the rest of the limitations of said claim. Closest prior art of record, Wu et al. (US 2013/0049195 A1), teaches a wafer of die, and a dicing process to make partial cuts on scribe lines between the die. However Wu et al. fails to disclose “after performing the first pass, performing a second pass with the saw blade to perform a full cut within each of a first subset of the plurality of scribe lines while maintaining the partial cut in a second subset of the plurality of scribe lines; and after performing the dicing process, providing the diced wafer to a pick and place operation, wherein the provided diced wafer has a plurality of singulated die adjacent the first subset of the plurality of scribe lines and a plurality of die groups including the second subset of the plurality of scribe lines, wherein each die group includes at least two die separated by one scribe line of the second subset of scribe lines”. Closest prior art of record, Chinnusamy (US 2017/0032981 A1), also teaches a wafer of die, and a dicing process to make partial cuts on scribe lines between the die. However Chinnusamy fails to disclose “after performing the first pass, performing a second pass with the saw blade to perform a full cut within each of a first subset of the plurality of scribe lines while maintaining the partial cut in a second subset of the plurality of scribe lines; and after performing the dicing process, providing the diced wafer to a pick and place operation, wherein the provided diced wafer has a plurality of singulated die adjacent the first subset of the plurality of scribe lines and a plurality of die groups including the second subset of the plurality of scribe lines, wherein each die group includes at least two die separated by one scribe line of the second subset of scribe lines”. Conclusion THIS ACTION IS MADE FINAL. Applicant is reminded of the extension of time policy as set forth in 37 CFR 1.136(a). A shortened statutory period for reply to this final action is set to expire THREE MONTHS from the mailing date of this action. In the event a first reply is filed within TWO MONTHS of the mailing date of this final action and the advisory action is not mailed until after the end of the THREE-MONTH shortened statutory period, then the shortened statutory period will expire on the date the advisory action is mailed, and any nonprovisional extension fee (37 CFR 1.17(a)) pursuant to 37 CFR 1.136(a) will be calculated from the mailing date of the advisory action. In no event, however, will the statutory period for reply expire later than SIX MONTHS from the mailing date of this final action. Any inquiry concerning this communication or earlier communications from the examiner should be directed to PAUL A. BERRY whose telephone number is (703)756-5637. The examiner can normally be reached M-F 8-5 EST. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Julio Maldonado can be reached at 571-272-1864. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /PAUL A BERRY/Examiner, Art Unit 2898 /JULIO J MALDONADO/Supervisory Patent Examiner, Art Unit 2898
Read full office action

Prosecution Timeline

Jan 19, 2023
Application Filed
Oct 29, 2025
Non-Final Rejection mailed — §112
Jan 30, 2026
Response Filed
Apr 30, 2026
Final Rejection mailed — §112 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12666655
METHOD FOR MANUFACTURING TELLURIUM-BASED SEMICONDUCTOR DEVICE, TELLURIUM-BASED SEMICONDUCTOR DEVICE MANUFACTURED THEREBY, AND THIN FILM TRANSISTOR
3y 4m to grant Granted Jun 23, 2026
Patent 12641793
NONVOLATILE MEMORY DEVICE
3y 9m to grant Granted May 26, 2026
Patent 12604537
HIGH MOBILITY TRANSISTOR ELEMENT RESULTING FROM IGTO OXIDE SEMICONDUCTOR CRYSTALLIZATION, AND PRODUCTION METHOD FOR SAME
2y 9m to grant Granted Apr 14, 2026
Patent 12604724
VERTICAL SEMICONDUCTOR DEVICE
2y 11m to grant Granted Apr 14, 2026
Patent 12598780
GATE-ALL-AROUND TRANSISTORS WITH HYBRID ORIENTATION
3y 9m to grant Granted Apr 07, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

Strategy Recommendation AI-generated — please review before filing

Get a prosecution strategy drawn from examiner precedents, rejection analysis, and claim mapping.
Typically takes 5-10 seconds — AI-generated, attorney review required before filing

Prosecution Projections

3-4
Expected OA Rounds
92%
Grant Probability
97%
With Interview (+5.3%)
3y 3m (~0m remaining)
Median Time to Grant
Moderate
PTA Risk
Based on 38 resolved cases by this examiner. Grant probability derived from career allowance rate.

Sign in with your work email

Enter your email to receive a magic link. No password needed.

Personal email addresses (Gmail, Yahoo, etc.) are not accepted.

Free tier: 3 strategy analyses per month