Prosecution Insights
Last updated: April 19, 2026
Application No. 18/185,611

SEMICONDUCTOR STRUCTURE

Non-Final OA §102§103
Filed
Mar 17, 2023
Examiner
SPALLA, DAVID C
Art Unit
2893
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Taiwan Semiconductor Manufacturing Company Ltd.
OA Round
1 (Non-Final)
84%
Grant Probability
Favorable
1-2
OA Rounds
2y 5m
To Grant
89%
With Interview

Examiner Intelligence

Grants 84% — above average
84%
Career Allow Rate
703 granted / 836 resolved
+16.1% vs TC avg
Minimal +5% lift
Without
With
+4.7%
Interview Lift
resolved cases with interview
Typical timeline
2y 5m
Avg Prosecution
18 currently pending
Career history
854
Total Applications
across all art units

Statute-Specific Performance

§103
47.7%
+7.7% vs TC avg
§102
34.4%
-5.6% vs TC avg
§112
8.6%
-31.4% vs TC avg
Black line = Tech Center average estimate • Based on career data from 836 resolved cases

Office Action

§102 §103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Information Disclosure Statement The information disclosure statement (IDS) submitted on 03/17/2023 is in compliance with the provisions of 37 CFR 1.97. Accordingly, the information disclosure statement is being considered by the examiner. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(2) the claimed invention was described in a patent issued under section 151, or in an application for patent published or deemed published under section 122(b), in which the patent or application, as the case may be, names another inventor and was effectively filed before the effective filing date of the claimed invention. Claims 1-10, 13 and 14 are rejected under 35 U.S.C. 102(a)(2) as being anticipated by US PG Pub 2023/0290784 to Do et al (hereinafter Do). Regarding Claim 1, Do discloses a semiconductor structure, comprising: a hybrid unit cell (Fig. 2A), comprising: at least one first sub-cell (R2) having a first cell height (H2), wherein the first sub-cell comprises a plurality of first gate-all-around (GAA) nanosheet transistors (Fig. 1B); and at least one second sub-cell (R1) having a second cell height (H1), wherein the second sub-cell comprises a plurality of second GAA nanosheet transistors (Fig. 1B), wherein the first cell height is higher than the second cell height (H2 is greater than H1), and the first GAA nanosheet transistor has a wider nanosheet width than the second GAA nanosheet transistor (A31, for example, is wider than A11). Regarding Claim 2, Do discloses the semiconductor structure as claimed in Claim 1, wherein the first sub-cell and the second sub-cell have the same cell width (Fig. 2B, for example, A22 and A32 appear to have the same widths). Regarding Claim 3, Do discloses the semiconductor structure as claimed in Claim 1, wherein the hybrid unit cell is divided into a first group of first sub-cells and a second group of second sub-cells, wherein the number of the first sub-cells in the first group is equal to the number of the second sub-cells in the second group (Fig. 2A). Regarding Claim 4, Do discloses the semiconductor structure as claimed in Claim 1, wherein the hybrid unit cell is divided into a first group of first sub-cells and a second group of second sub-cells, wherein the number of the first sub-cells in the first group is different from the number of the second sub-cells in the second group [0020]-[0021]. Regarding Claim 5, Do discloses the semiconductor structure as claimed in Claim 1, wherein the first sub-cell comprises a first P-type GAA nanosheet transistor and a first N-type GAA nanosheet transistor, and the second sub-cell comprises a second P-type GAA nanosheet transistor and a second N-type GAA nanosheet transistor (Fig. 2A). Regarding Claim 6, Do discloses the semiconductor structure as claimed in Claim 5, wherein the first P-type GAA nanosheet transistor and the first N-type GAA nanosheet transistor in the first sub-cell have a first nanosheet width, and the second P-type GAA nanosheet transistor and the second N-type GAA nanosheet transistor in the second sub-cell have a second nanosheet width, wherein the first nanosheet width is greater than the second nanosheet width (Fig. 2A). Regarding Claim 7, Do discloses the semiconductor structure as claimed in Claim 5, wherein a first nanosheet width of the first P-type GAA nanosheet transistor is greater than a second nanosheet width of the first N-type GAA nanosheet transistor, and a third nanosheet width of the second P-type GAA nanosheet transistor is greater than a fourth nanosheet width of the second N-type GAA nanosheet transistor (Fig. 2A). Regarding Claim 8, Do discloses the semiconductor structure as claimed in Claim 7, wherein the second nanosheet width is greater than the third nanosheet width (Figs. 6A-6F). Regarding Claim 9, Do discloses the semiconductor structure as claimed in Claim 7, wherein the second nanosheet width is greater than the fourth nanosheet width and less than the third nanosheet width (Figs. 6A-6F). Regarding Claim 10, Do discloses a semiconductor structure, comprising: a hybrid cell array (Fig. 2A) comprising a plurality of hybrid unit cells in a row, wherein each of the hybrid unit cells comprises: a first sub-cell having a first cell height (H2) and arranged in a first sub-row of the row; and a second sub-cell having a second cell height (H1) and arranged in a second sub-row of the row, wherein the first cell height is higher than the second cell height (Fig. 2A), wherein a plurality of first gate-all-around (GAA) nanosheet transistors of the first sub-cells in the first sub-row have different nanosheet widths (Fig. 4), and a plurality of second GAA nanosheet transistors of the second sub-cells in the second sub-row have different nanosheet widths (Fig. 4). Regarding Claim 13, Do discloses the semiconductor structure as claimed in Claim 10, wherein nanosheet structures of the first GAA nanosheet transistors of the first sub-cells in the first sub-row are aligned on the same edges of the nanosheet structures that are away from or close to an interface between an N-type well region and a P-type well region of the first sub-cells (Fig. 4). Regarding Claim 14, Do discloses the semiconductor structure as claimed in Claim 10, wherein nanosheet structures of the first GAA nanosheet transistors of the first sub-cells in the first sub-row are aligned along a centerline of the nanosheet structures (Figs, 1B & 4). Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claims 11, 12 and 15-20 are rejected under 35 U.S.C. 103 as being unpatentable over Do. Regarding Claims 11 and 12, Do discloses the semiconductor structure as claimed in Claim 10 but does not explicitly disclose the minimum and maximum nanosheet widths required by Applicant. However, it would have been obvious to one of ordinary skill, before the effective filing date of the invention, to have modified the nanosheets of Do wherein either (1) a minimum nanosheet width of the first GAA nanosheet transistors in the first sub-row is greater than a maximum nanosheet width of the second GAA nanosheet transistors in the second sub-row, or (2) a maximum nanosheet width of the second GAA nanosheet transistors in the second sub-row is greater than a minimum nanosheet width of the first GAA nanosheet transistors in the first sub-row and less than a maximum nanosheet width of the first GAA nanosheet transistors in the first sub-row. Do notes that the channels have a driving capability corresponding to the channel widths [0021]. Given the teachings and embodiments of Do, it would have been obvious to create sub-cells with varying channel widths depending on the circuit designs desired for a semiconductor device. Regarding Claim 15, Do discloses a semiconductor structure, comprising: a hybrid cell array, comprising: a plurality of hybrid unit cells (Fig. 2A), wherein each of the hybrid unit cells comprises: a first sub-cell having a first cell height (H2); and a second sub-cell having a second cell height (H1), wherein a cell height of the hybrid unit cell is equal to a sum of the first and second cell heights; and a regular cell array, comprising: a plurality of logic cells (Fig. 4) having a third cell height, wherein the third cell height is greater than the second cell height and less than the first cell height, wherein a plurality of first gate-all-around (GAA) nanosheet transistors in the first sub-cells have wider nanosheet widths than a plurality of second GAA nanosheet transistors in the second sub-cells (Fig. 2A). Do does not explicitly wherein the third cell height is greater than the second cell height and less than the first cell height. However, it would have been obvious to one of ordinary skill in the art, before the effective filing date of the invention, to have modified the cells of Do such that the third cell height is greater than the second cell height and less than the first cell height. Do notes that the channels have a driving capability corresponding to the channel widths [0021]. Given the teachings and embodiments of Do, it would have been obvious to create sub-cells with varying channel widths depending on the circuit designs desired for a semiconductor device. Regarding Claim 16, Do makes obvious the semiconductor structure as claimed in Claim 15, wherein the hybrid cell array and the regular cell array have the same array height (Figs. 2A & 4). Regarding Claims 11 and 12, Do discloses the semiconductor structure as claimed in Claim 15 but does not explicitly disclose the minimum and maximum nanosheet widths required by Applicant. However, it would have been obvious to one of ordinary skill, before the effective filing date of the invention, to have modified the nanosheets of Do wherein either (1) a minimum nanosheet width of the first GAA nanosheet transistors in the first sub-row is greater than a maximum nanosheet width of the second GAA nanosheet transistors in the second sub-row, or (2) a maximum nanosheet width of the second GAA nanosheet transistors in the second sub-row is greater than a minimum nanosheet width of the first GAA nanosheet transistors in the first sub-row and less than a maximum nanosheet width of the first GAA nanosheet transistors in the first sub-row. Do notes that the channels have a driving capability corresponding to the channel widths [0021]. Given the teachings and embodiments of Do, it would have been obvious to create sub-cells with varying channel widths depending on the circuit designs desired for a semiconductor device. Regarding Claim 19, Do makes obvious the semiconductor structure as claimed in Claim 15, wherein the first GAA nanosheet transistors of the first sub-cells in the same row of the hybrid cell array have the same nanosheet widths, and the second GAA nanosheet transistors of the second sub-cells in the same row of the hybrid cell array have the same nanosheet widths (Fig. 3B). Regarding Claim 20, Do makes obvious the semiconductor structure as claimed in Claim 15, wherein the first GAA nanosheet transistors of the first sub-cells in the same row of the hybrid cell array have different nanosheet widths, and the second GAA nanosheet transistors of the second sub-cells in the same row of the hybrid cell array have different nanosheet widths (Fig. 2A). Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to DAVID C SPALLA whose telephone number is (303)297-4298. The examiner can normally be reached Mon-Fri 10am-5pm MST. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Britt Hanley can be reached at 571-270-3042. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /DAVID C SPALLA/ Primary Examiner, Art Unit 2893
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Prosecution Timeline

Mar 17, 2023
Application Filed
Jan 08, 2026
Non-Final Rejection — §102, §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
84%
Grant Probability
89%
With Interview (+4.7%)
2y 5m
Median Time to Grant
Low
PTA Risk
Based on 836 resolved cases by this examiner. Grant probability derived from career allow rate.

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