Prosecution Insights
Last updated: May 04, 2026
Application No. 18/226,986

DISPLAY DEVICE AND METHOD OF MANUFACTURING THE SAME

Non-Final OA §103
Filed
Jul 27, 2023
Priority
Sep 05, 2022 — RE 10-2022-0111985
Examiner
CHAN, CANDICE
Art Unit
2813
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Samsung Display Co., Ltd.
OA Round
1 (Non-Final)
73%
Grant Probability
Favorable
1-2
OA Rounds
6m
Est. Remaining
92%
With Interview

Examiner Intelligence

Grants 73% — above average
73%
Career Allowance Rate
399 granted / 547 resolved
+4.9% vs TC avg
Strong +19% interview lift
Without
With
+18.8%
Interview Lift
resolved cases with interview
Typical timeline
3y 3m
Avg Prosecution
58 currently pending
Career history
605
Total Applications
across all art units

Statute-Specific Performance

§101
0.3%
-39.7% vs TC avg
§103
50.1%
+10.1% vs TC avg
§102
28.5%
-11.5% vs TC avg
§112
17.8%
-22.2% vs TC avg
Black line = Tech Center average estimate • Based on career data from 547 resolved cases

Office Action

§103
DETAILED ACTION This Office action is in response to the election filed 12 January 2026. Claims 1-20 are currently pending. Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Election/Restrictions Applicant’s election without traverse of Invention I, claims 1-11, in the reply filed on 12 January 2026 is acknowledged. Claims 12-20 are withdrawn from further consideration pursuant to 37 CFR 1.142(b) as being drawn to a nonelected invention, there being no allowable generic or linking claim. Specification The title of the invention is not descriptive. A new title is required that is clearly indicative of the invention to which the claims are directed. Claim Rejections - 35 USC § 103 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. This application currently names joint inventors. In considering patentability of the claims the examiner presumes that the subject matter of the various claims was commonly owned as of the effective filing date of the claimed invention(s) absent any evidence to the contrary. Applicant is advised of the obligation under 37 CFR 1.56 to point out the inventor and effective filing dates of each claim that was not commonly owned as of the effective filing date of the later invention in order for the examiner to consider the applicability of 35 U.S.C. 102(b)(2)(C) for any potential 35 U.S.C. 102(a)(2) prior art against the later invention. The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claims 1-11 are rejected under 35 U.S.C. 103 as being unpatentable US 2022/0376117 A1 to Kim (hereinafter “Kim”). Regarding independent claim 1, Kim (Fig. 6) discloses a display device comprising: a substrate 100 (¶ 0103); a transistor TFT” (¶ 0103) disposed on the substrate, wherein the transistor includes an active layer 220/210 (¶ 0104) including a first active area 210a/220c1/210b (¶ 0104) and a second active area 210d/220c2/210b (¶ 0104), wherein the first active area includes a first drain area 210a (¶ 0104), a source area 210b (¶ 0104), and a first channel area 220c1 (¶ 0104) located between the first drain area and the source area, and the second active area includes the source area 210b, a second drain area 210d (¶ 0105), and a second channel area 220c2 (¶ 0105) located between the source area and the second drain area; a gate insulating layer 112 (¶ 0104) disposed on the active layer; a second charge layer CIR1/CIR2 (¶ 0107) defined at the interface between the first channel area 220c1 and the gate insulating layer 112 to be adjacent to the first drain area 210a and at the interface between the second channel area 220c2 and the gate insulating layer 112 to be adjacent to the second drain area 210d, In the embodiment of Fig. 6, Kim fails to expressly disclose a first charge layer defined at an interface between the first channel area and the gate insulating layer to be adjacent to the source area and at an interface between the second channel area and the gate insulating layer to be adjacent to the source area; and wherein the second charge layer has a charge opposite to a charge of the first charge layer. In a different embodiment, Kim (Fig. 4) discloses a first charge layer CIR1/CIR2 (¶ 0085, 87) defined at an interface between the first channel area 220c1 (¶ 0085) and the gate insulating layer 112 (¶ 0085) to be adjacent to the source area 210b (¶ 0086) and at an interface between the second channel area 220c2 (¶ 0086) and the gate insulating layer 112 to be adjacent to the source area 210b. It would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to modify the display device of Kim to include a first charge layer as disclosed in the embodiment of Fig. 4, for the purpose of reducing leakage current (¶ 0100). Additionally, it would have been obvious to one of ordinary skill in the art to provide a second charge layer having a charge opposite to a charge of the first layer since there are only two possible charge combinations (i.e., same charge, opposite charge) and a person of ordinary skill has good reason to pursue the known options within his or her technical grasp, with a reasonable expectation of success. MPEP 2143(I)(E). Regarding claim 2, Kim discloses the display device of claim 1, wherein the second charge layer shifts a threshold voltage of the transistor in one of a positive direction and a negative direction, and the first charge layer shifts the threshold voltage of the transistor in the other of the positive direction and the negative direction (these limitations are considered functional language that does not structurally distinguish the claimed invention or the prior art; Kim discloses the structure as recited in the claim as currently drafted, thus the structure of Kim is presumed to capable of the functionally defined limitations oof the claimed device. MPEP 2114(I). Regarding claim 3, Kim discloses the display device of claim 1, wherein the first charge layer CIR1/CIR2 (Fig. 4) and the second charge layer CIR1/CIR2 (Fig. 6) are spaced apart from each other. Regarding claim 4, Kim (Figs. 4, 6) discloses the display device of claim 1, wherein the transistor includes a first gate electrode 230a (¶ 0104) overlapping the first channel area 220c1 and a second gate electrode 230b (¶ 0099) overlapping the second channel area 220c2, and wherein the first gate electrode and the second gate electrode are electrically connected to each other (Fig. 5). Regarding claim 5, Kim (Fig. 6) discloses the display device of claim 4, wherein the transistor includes: a first sub-transistor defined by the first active area 210a/220c1/210b and the first gate electrode 230a; and a second sub-transistor defined by the second active area 210b/220c2/210d and the second gate electrode 230b, and wherein the first sub-transistor and the second sub-transistor are connected to each other (Figs. 5, 6). Regarding claim 6, Kim (Figs. 4, 6) discloses the display device of claim 4, wherein each of the first charge layer CIR1/CIR2 (Fig. 4) and the second charge layer CIR1/CIR2 (Fig. 6) overlaps the first gate electrode 230a and the second gate electrode 230b when viewed in a thickness direction of the substrate. Regarding claim 7, Kim discloses the display device of claim 1, wherein each of the first drain area, the source area, and the second drain area is doped with P-type impurity ions (¶ 0107 - P-type transistor). Regarding claim 8, Kim discloses the display device of claim 7, wherein the second charge layer has a negative charge (¶ 0107). Kim does not expressly disclose the first charge layer has a positive charge. However, it would have been obvious to one of ordinary skill in the art to provide a positive charge in the first charge layer since there are only two possible charges (i.e., positive, negative) and a person of ordinary skill has good reason to pursue the known options within his or her technical grasp, with a reasonable expectation of success. MPEP 2143(I)(E). Regarding claim 9, Kim discloses the display device of claim 1, wherein each of the first drain area, the source area, and the second drain area is doped with N-type impurity ions (¶ 0107 - N-type transistor). Regarding claim 10, Kim discloses the display device of claim 9, wherein the second charge layer has a positive charge (¶ 0107). Kim does not expressly disclose the first charge layer has a negative charge. However, it would have been obvious to one of ordinary skill in the art to provide a negative charge in the first charge layer since there are only two possible charges (i.e., positive, negative) and a person of ordinary skill has good reason to pursue the known options within his or her technical grasp, with a reasonable expectation of success. MPEP 2143(I)(E). Regarding claim 11, Kim discloses the display device of claim 1, wherein the active layer 220/210 includes a silicon semiconductor (¶ 0068). Conclusion The following prior art made of record and not relied upon is considered pertinent to applicant's disclosure: US 2011/0140116 A1 to Morosawa et al. disclosing a thin film transistor with a charge layer and shifted threshold voltage; 2016/0027814 A1 to Jin et al. disclosing thin film transistors with doped areas adjacent to source/drain regions. Any inquiry concerning this communication or earlier communications from the examiner should be directed to Candice Y. Chan whose telephone number is (571)272-9013. The examiner can normally be reached 8:30 am - 5 pm ET. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Steven B. Gauthier can be reached at 571-270-0373. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. CANDICE Y. CHAN Examiner Art Unit 2813 24 February 2026 /STEVEN B GAUTHIER/Supervisory Patent Examiner, Art Unit 2813
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Prosecution Timeline

Jul 27, 2023
Application Filed
Feb 24, 2026
Non-Final Rejection — §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
73%
Grant Probability
92%
With Interview (+18.8%)
3y 3m (~6m remaining)
Median Time to Grant
Low
PTA Risk
Based on 547 resolved cases by this examiner. Grant probability derived from career allowance rate.

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