Prosecution Insights
Last updated: April 19, 2026
Application No. 18/233,092

POWER LEADFRAME PACKAGE WITH REDUCED SOLDER VOIDS

Non-Final OA §103
Filed
Aug 11, 2023
Examiner
VALENZUELA, PATRICIA D
Art Unit
2812
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
STMicroelectronics
OA Round
1 (Non-Final)
90%
Grant Probability
Favorable
1-2
OA Rounds
2y 4m
To Grant
92%
With Interview

Examiner Intelligence

Grants 90% — above average
90%
Career Allow Rate
645 granted / 715 resolved
+22.2% vs TC avg
Minimal +2% lift
Without
With
+2.1%
Interview Lift
resolved cases with interview
Typical timeline
2y 4m
Avg Prosecution
63 currently pending
Career history
778
Total Applications
across all art units

Statute-Specific Performance

§101
1.3%
-38.7% vs TC avg
§103
60.1%
+20.1% vs TC avg
§102
19.9%
-20.1% vs TC avg
§112
8.6%
-31.4% vs TC avg
Black line = Tech Center average estimate • Based on career data from 715 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Election/Restrictions Applicant’s election without traverse of claims 1-10, 20-28 in the reply filed on 11/25/25 is acknowledged. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim(s) 1-10, 20-28 is/are rejected under 35 U.S.C. 103 as being unpatentable over Glenn(USPGPUB DOCUMENT: 2003/0113954, hereinafter Glenn) in view of Kitano (USPATENT: 4942452, hereinafter Kitano). Re claim 1 Glenn discloses in Fig 5/6 an electronic device, comprising: a first support substrate(16B/16A); a second support substrate(16B/16A) spaced apart from the first support substrate(16B/16A); an integrated circuit (IC) die(14) having opposed first and second faces(top/bottom), the second face(top/bottom) bonded to a first surface(top/bottom) of the first support substrate(16B/16A); a conductive clip(230)[0041] formed by first and second portion(234)[0041]s each having opposed first and second surfaces(top/bottom), the first portion(230) of the conductive clip(230)[0041] being elongate and extending across the IC die(14), the first portion(230) of the conductive clip(230)[0041] having its second surface(top/bottom) bonded to the first face(top/bottom) of the IC die(14) by a solder layer(36)[0009], the second portion(234)[0041] of the conductive clip(230)[0041] extending from the first portion(230) away from the IC die(14) toward the second support substrate(16B/16A) such that its second surface(top/bottom) is bonded to the first surface(top/bottom) of the second support substrate(16B/16A); wherein the first surface(top/bottom) of the conductive clip(230)[0041] has a pattern(242/142) formed therein, the pattern(242/142) including a depressed floor with fins(fin portion of 230/340)(230/340) extending upwardly therefrom; extend through the first surface(top/bottom) of the conductive clip(230)[0041] from the depressed floor of the pattern(242/142) to the second surface(top/bottom) of the conductive clip(230)[0041]; and an encapsulating layer(18) covering portions of the first support substrate(16B/16A), second support substrate(16B/16A), IC die(14), and conductive clip(230)[0041] while leaving the first surface(top/bottom) of the first portion(230) of the conductive clip(230)[0041] exposed to permit heat to radiate away[0030] therefrom. Glenn does not disclose wherein through-holes extend through the first surface(top/bottom) of the conductive clip(230)[0041] from the depressed floor of the pattern(242/142) to the second surface(top/bottom) of the conductive clip(230)[0041]; Kitano discloses in Fig 10 wherein through-holes (through-hole in 13c of Kitano) extend through the first surface(top/bottom) from the depressed floor of the pattern to the second surface(top/bottom); It would have been obvious to one of ordinary skill in the art before the effective filling date of the invention to apply the teachings of Kitano to the teachings of Glenn in order to have a lead frame and a semiconductor device adapted to preventing package cracking the heat [col1 lines 5-15, Kitano]. In doing so, wherein through-holes (through-hole in 13c of Kitano) extend through the first surface(top/bottom) of the conductive clip(230)[0041] from the depressed floor of the pattern(242/142) to the second surface(top/bottom) of the conductive clip(230)[0041]; Re claim 2 Glenn and Kitano disclose the electronic device of claim 1, wherein the through-holes (through-hole in 13c of Kitano) are straight- cut, being equal in size and shape at the depressed floor of the pattern(242/142) and at the second surface(top/bottom) of the conductive clip(230)[0041]. Re claim 3 Glenn and Kitano disclose the electronic device of claim 1, wherein the through-holes (through-hole in 13c of Kitano) expand in size from the depressed floor of the pattern(242/142) through to the second surface(top/bottom) of the conductive clip(230)[0041] such that the size of the through-holes (through-hole in 13c of Kitano) at the depressed floor is less than the size of the through- holes at the second surface(top/bottom) of the conductive clip(230)[0041]. Re claim 4 Glenn and Kitano disclose the electronic device of claim 1, wherein the through-holes (through-hole in 13c of Kitano) contract in size from the depressed floor of the pattern(242/142) through to the second surface(top/bottom) of the conductive clip(230)[0041] such that the size of the through-holes (through-hole in 13c of Kitano) at the depressed floor is larger than the size of the through- holes at the second surface(top/bottom) of the conductive clip(230)[0041]. Re claim 5 Glenn and Kitano disclose the electronic device of claim 1, wherein the through-holes (through-hole in 13c of Kitano) have cross sections(see Fig 10 of Kitano) that are circular in shape. Re claim 6 Glenn and Kitano disclose the electronic device of claim 1, wherein the through-holes (through-hole in 13c of Kitano) have cross sections(see Fig 10 of Kitano) that are pill shaped. Re claim 7 Glenn and Kitano disclose the electronic device of claim 1, wherein the fins(fin portion of 230/340) extend upwardly from the depressed floor to a level of a highest point of the first surface(top/bottom) of the first portion(230) of the conductive clip(230)[0041]. Re claim 8 Glenn and Kitano disclose the electronic device of claim 1, wherein the second surface(top/bottom) of the first portion(230) of the conductive clip(230)[0041] is planar. Re claim 9 Glenn and Kitano disclose the electronic device of claim 1, wherein the first support substrate(16B/16A) is a die(14) pad of a leadframe. Re claim 10 Glenn and Kitano disclose the electronic device of claim 1, wherein the second support substrate(16B/16A) is at least one lead of a leadframe. Re claim 20 Glenn and Kitano disclose the electronic device of claim 1, wherein the through-holes (through-hole in 13c of Kitano) are arranged in a staggered pattern(242/142) across the first portion(230) of the conductive clip(230)[0041]. Re claim 21 Glenn and Kitano disclose the electronic device of claim 1, wherein the second portion(234)[0041] of the conductive clip(230)[0041] defines a step-down in height between the first portion(230) and the second support substrate(16B/16A). Re claim 22 Glenn and Kitano disclose the electronic device of claim 1, wherein the fins(fin portion of 230/340) are arranged in a grid pattern(242/142) defined by intersecting channels formed in the first surface(top/bottom) of the first portion(230) of the conductive clip(230)[0041]. Re claim 23 Glenn and Kitano disclose the electronic device of claim 1, wherein the encapsulating layer(18) seals a gap between the first support substrate(16B/16A) and the second support substrate(16B/16A). Re claim 24 Glenn discloses in Fig 5/6 an electronic device comprising: a body with a support substrate(16B/16A); an integrated circuit (IC) die(14) mounted to the support substrate(16B/16A); and a conductive clip(230)[0041] for coupling the IC to the support substrate(16B/16A), wherein the conductive clip(230)[0041] comprises: a first portion(230) having opposed first and second surfaces(top/bottom) and configured to be bonded to a first face(top/bottom) of the IC die(14) by a solder layer(36)[0009] ; and a heat-dissipation pattern(242/142) formed in the first surface(top/bottom) of the first portion(230), the pattern(242/142) including a depressed floor and fins(fin portion of 230/340) extending upwardly therefrom to increase exposed surface(top/bottom) area of the first surface(top/bottom). Glenn does not disclose a plurality of through-holes extending between the first and second surfaces(top/bottom) of the first portion(230) and positioned to permit gases generated during solder reflow to escape through the conductive clip(230)[0041], thereby reducing formation of solder voids in the solder layer(36)[0009]; Kitano discloses in Fig 10 a plurality of through-holes (through-hole in 13c of Kitano) extending between the first and second surfaces(top/bottom) and positioned to permit gases generated during solder reflow[col1, lines 10-25 of Kitano] to escape, thereby reducing formation of solder voids (reflow cracks)[col1, lines 10-25 of Kitano] in the solder layer; It would have been obvious to one of ordinary skill in the art before the effective filling date of the invention to apply the teachings of Kitano to the teachings of Glenn in order to have a lead frame and a semiconductor device adapted to preventing package cracking the heat [col1 lines 5-15, Kitano]. In doing so, a plurality of through-holes (through-hole in 13c of Kitano) extending between the first and second surfaces(top/bottom) of the first portion(230) and positioned to permit gases generated during solder reflow[col1, lines 10-25 of Kitano] to escape through the conductive clip(230)[0041], thereby reducing formation of solder voids (reflow cracks)[col1, lines 10-25 of Kitano] in the solder layer(36)[0009]; Re claim 25 Glenn and Kitano disclose the electronic device of claim 24, wherein the through-holes (through-hole in 13c of Kitano) taper outwardly from the first surface(top/bottom) of the first portion(230) toward the second surface(top/bottom) of the first portion(230). Re claim 26 Glenn and Kitano disclose the electronic device of claim 24, wherein the through-holes (through-hole in 13c of Kitano) taper inwardly from the first surface(top/bottom) of the first portion(230) toward the second surface(top/bottom) of the first portion(230). Re claim 27 Glenn and Kitano disclose the electronic device of claim 24, wherein the through-holes (through-hole in 13c of Kitano) have circular cross sections(see Fig 10 of Kitano). Re claim 28 Glenn and Kitano disclose the electronic device of claim 24, wherein the through-holes (through-hole in 13c of Kitano) have pill- shaped cross sections(see Fig 10 of Kitano). Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to PATRICIA D VALENZUELA whose telephone number is (571)272-9242. The examiner can normally be reached Monday-Friday 10am-6pm EST. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, William Partridge can be reached at 571-270-1402. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /PATRICIA D VALENZUELA/Primary Examiner, Art Unit 2812
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Prosecution Timeline

Aug 11, 2023
Application Filed
Mar 07, 2026
Non-Final Rejection — §103 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12604686
SEMICONDUCTOR CHIP AND SEMICONDUCTOR PACKAGE INCLUDING THE SAME
2y 5m to grant Granted Apr 14, 2026
Patent 12604749
SEMICONDUCTOR PACKAGE
2y 5m to grant Granted Apr 14, 2026
Patent 12598990
ELECTRICALLY ISOLATED DISCRETE PACKAGE WITH HIGH PERFORMANCE CERAMIC SUBSTRATE
2y 5m to grant Granted Apr 07, 2026
Patent 12598986
METAL INSULATOR METAL CAPACITOR (MIM CAPACITOR)
2y 5m to grant Granted Apr 07, 2026
Patent 12593675
RETICLE STITCHING TO ACHIEVE HIGH-CAPACITY INTEGRATED CIRCUIT
2y 5m to grant Granted Mar 31, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
90%
Grant Probability
92%
With Interview (+2.1%)
2y 4m
Median Time to Grant
Low
PTA Risk
Based on 715 resolved cases by this examiner. Grant probability derived from career allow rate.

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