Office Action Predictor
Application No. 18/241,051

SEMICONDUCTOR STRUCTURE AND METHOD FOR ARRANGING REDISTRIBUTION LAYER OF SEMICONDUCTOR DEVICE

Non-Final OA §103
Filed
Aug 31, 2023
Examiner
FERNANDES, ERROL V
Art Unit
2893
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Nanya Technology Corporation
OA Round
1 (Non-Final)
85%
Grant Probability
Favorable
1-2
OA Rounds
2y 3m
To Grant
89%
With Interview

Examiner Intelligence

85%
Career Allow Rate
663 granted / 782 resolved
Without
With
+4.0%
Interview Lift
avg trend
2y 3m
Avg Prosecution
30 pending
812
Total Applications
career history

Statute-Specific Performance

§103
58.6%
+18.6% vs TC avg
§102
36.8%
-3.2% vs TC avg
§112
4.1%
-35.9% vs TC avg
Black line = Tech Center average estimate • Based on career data

Office Action

§103
DETAILED ACTION Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claims 1-13 is/are rejected under 35 U.S.C. 103 as being unpatentable over Yang US 2021/10351162 A1 in view of Otake et al. US 2002/0011606 A1. Regarding claim 1, Yang discloses: A semiconductor structure (10), comprising: a substrate (120), having a first surface (top) and a conductive trace (128; para 0046) extending above the substrate; a semiconductor device (100/110), disposed on the first surface of the substrate having edge pads (RP2); and a plurality of bonding wires (BW3), electrically connected between the substrate and the plurality of edge pads (Fig. 1A). Yang does not disclose: A semiconductor device, comprising: a semiconductor die; and a redistribution layer, formed on the semiconductor die, the redistribution layer comprising: a plurality of center pads; a plurality of edge pads; and a plurality of conductive wires, electrically connecting the plurality of center pads to the plurality of edge pads; wherein each of the plurality of conductive wires comprises at least two turning points, and an inner angle at each turning point is greater than a predetermined angle. Otake discloses a publication from a similar field of endeavor in which: A semiconductor device (Fig. 14), comprising: a semiconductor die (210); and a redistribution layer (700, 211, 710), formed on the semiconductor die, the redistribution layer comprising: a plurality of center pads (700); a plurality of edge pads (211); and a plurality of conductive wires (710), electrically connecting the plurality of center pads to the plurality of edge pads; wherein each of the plurality of conductive wires comprises at least two turning points, and an inner angle at each turning point is greater than a predetermined angle (710 with angular bends). It would have been obvious to one of ordinary skill in the art, before the effective filing date of the claimed invention, to employ the redistribution layer of Otatke on the surface of the semiconductor die/device of Yang to provide a semiconductor integrated circuit that can decrease the adverse influence upon the operation of the internal circuit and effectively prevent a high frequency component of source current change from generating an electromagnetic wave (see Otake paras 0006-0026). (claim 2) Otake: a first row and a second row (Fig. 14; inner 2 columns of 700); a first direction (vertical). (claim 3) Otake: Fig. 14. (claim 4) Otake: a first region and a second region (211 shown on leftmost and rightmost sides in a column formation). (claim 5) Otake: a second direction (horizontal). (claim 6) Otake: Fig. 14; 710 shown with several angular bends. (claim 7) Otake: Fig. 14. (claim 8) Otake: Fig. 14. (claim 11) Yang: a plurality of first bonding wires (Fig. 1A: left BW3s on top surface of 110); a plurality of second bonding wires (right BW3s on top surface of 110). (claim 12) Yang: a molding compound (Fig. 1A: 140). (claim 13) Yang: a conductive bump (Fig. 1A: EC2 para 0048). Regarding claim 9, although Otake does not specifically disclose “wherein the conductive wires comprises power lines, ground lines, and signal lines, and a first width of the power lines and the ground lines is greater than a second width of the signal lines”, Otake does gives insight, in para 0075, that the pads 211 include power supply functions. It would have been obvious to one of ordinary skill in the art, before the effective filing date of the claimed invention, to understand that such external chip pads customarily include signal and ground pads as well for full functionality. Furthermore, it would have been obvious to one of ordinary skill in the art, before the effective filing date of the claimed invention, to determine the claimed relationship between the widths of the power/ground and signal lines since it has been held that discovering an optimum value of a result effective variable involves only routine skill in the art. In re Boesch, 617 F.2d 272,205USPQ 215 (CCPA 1980). Regarding claim 10, although Otake does not specifically disclose “wherein the predetermined angle is between 136 degrees and 179 degrees”, Otake does offer various examples of angular wiring in Fig. 14. It would have been obvious to one of ordinary skill in the art, before the effective filing date of the claimed invention, to determine the claimed wiring angle range when referencing Otake’s similar structures since it has been held that where the general conditions of a claim are disclosed in the prior art, discovering the optimum or working ranges involves only routine skill in the art. In re Aller, 105 USPQ 233. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to ERROL V FERNANDES whose telephone number is (571)270-7433. The examiner can normally be reached on 9-5:30. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Britt Hanley can be reached on (571) 270-30423042. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of an application may be obtained from the Patent Application Information Retrieval (PAIR) system. Status information for published applications may be obtained from either Private PAIR or Public PAIR. Status information for unpublished applications is available through Private PAIR only. For more information about the PAIR system, see http://pair-direct.uspto.gov. Should you have questions on access to the Private PAIR system, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative or access to the automated information system, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /ERROL V FERNANDES/Primary Examiner, AU 2893
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Prosecution Timeline

Aug 31, 2023
Application Filed
Dec 23, 2025
Non-Final Rejection — §103
Mar 27, 2026
Response Filed

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Prosecution Projections

1-2
Expected OA Rounds
85%
Grant Probability
89%
With Interview (+4.0%)
2y 3m
Median Time to Grant
Low
PTA Risk
Based on 782 resolved cases by this examiner