Prosecution Insights
Last updated: April 19, 2026
Application No. 18/328,988

VERIFICATION METHOD FOR DEVICE CHIPS

Non-Final OA §102
Filed
Jun 05, 2023
Examiner
PETERSON, ERIK T
Art Unit
2898
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Disco Corporation
OA Round
1 (Non-Final)
77%
Grant Probability
Favorable
1-2
OA Rounds
2y 8m
To Grant
89%
With Interview

Examiner Intelligence

Grants 77% — above average
77%
Career Allow Rate
271 granted / 353 resolved
+8.8% vs TC avg
Moderate +12% lift
Without
With
+12.0%
Interview Lift
resolved cases with interview
Typical timeline
2y 8m
Avg Prosecution
40 currently pending
Career history
393
Total Applications
across all art units

Statute-Specific Performance

§101
0.3%
-39.7% vs TC avg
§103
39.3%
-0.7% vs TC avg
§102
24.7%
-15.3% vs TC avg
§112
29.7%
-10.3% vs TC avg
Black line = Tech Center average estimate • Based on career data from 353 resolved cases

Office Action

§102
DETAILED ACTION This action is responsive to the application No. 18/328,988 filed on June 5, 2023. The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Information Disclosure Statement Acknowledgement is made of Applicant’s Information Disclosure Statement (IDS) form PTO-1449. The IDS has been considered. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claims 1, 3, and 4 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Mori et al. (US 2021/0090954), of record. (Re Claim 1) Mori teaches a verification method for device chips, comprising: a providing step of providing a wafer having a front surface with a plurality of devices formed thereon and demarcated by a plurality of intersecting streets (Figs. 3-5, 13-15: wafer 13, devices 23, streets 17) the devices including non-defective devices and defective devices that are distinguished from each other based on an electrical characteristic (Figs. 12-13 and ¶¶102-104); a dividing step of, after the providing step, dividing the wafer into individual device chips along the streets (Figs. 12, 15, dividing step S3); a defective device chip extracting step of extracting defective device chips from the individual device chips, the defective device chips corresponding to the defective devices and being defective in the electrical characteristic (¶108, step S4, Figs. 7A-7C, 12); and a verification step of verifying a physical characteristic of each of the extracted defective device chips (Fig. 11A-12, step S6 in S5, ¶¶109-110). (Re Claim 3) wherein the wafer is positioned in an opening of an annular frame and is integrated with the annular frame via a dicing tape (Fig. 3: frame 21, tape 19). (Re Claim 4) wherein the dividing step is performed by one of a cutting blade, a laser beam, plasma, dicing before grinding, or stealth dicing before grinding (¶¶105-106). Allowable Subject Matter Claim 2 is objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Claim 2 recites the allowable subject matter “…further comprising: a determination step of determining based on results of the verification step whether or not to transfer non-defective device chips out of the individual device chips to a subsequent step, the non-defective device chips corresponding to the non-defective devices and being non-defective in the electrical characteristic”, as set forth in the claimed combination. This method step is not anticipated or rendered obvious by the prior art known to the Examiner. Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. The additional cited art teaches related testing and pick and place processes. Any inquiry concerning this communication or earlier communications from the examiner should be directed to ERIK T. K. PETERSON whose telephone number is (571)272-3997. The examiner can normally be reached M-F, 9-5 pm (CST). Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Jessica Manno can be reached at 571-272-2339. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /ERIK T. K. PETERSON/ Primary Examiner, Art Unit 2898
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Prosecution Timeline

Jun 05, 2023
Application Filed
Feb 26, 2026
Non-Final Rejection — §102 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

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2y 5m to grant Granted Mar 31, 2026
Patent 12591325
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Patent 12575374
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2y 5m to grant Granted Mar 10, 2026
Patent 12568750
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Patent 12564068
Carbon Assisted Semiconductor Dicing And Method
2y 5m to grant Granted Feb 24, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
77%
Grant Probability
89%
With Interview (+12.0%)
2y 8m
Median Time to Grant
Low
PTA Risk
Based on 353 resolved cases by this examiner. Grant probability derived from career allow rate.

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