Prosecution Insights
Last updated: May 29, 2026

Examiner: PETERSON, ERIK T

Tech Center 2800 • Art Units: 2822 2898

This examiner grants 77% of resolved cases

Performance Statistics

76.9%
Allow Rate
+8.9% vs TC avg
398
Total Applications
+11.8%
Interview Lift
941
Avg Prosecution Days
Based on 355 resolved cases, 2023–2026

Rejection Statute Breakdown

0.2%
§101 Eligibility
9.7%
§102 Novelty
69.2%
§103 Obviousness
12.4%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
17987378 APPARATUS AND METHOD FOR MANUFACTURING DISPLAY DEVICE Non-Final OA Samsung Display Co., LTD.
17879460 Technique for Forming Cubic Silicon Carbide and Heterojunction Silicon Carbide Device Final Rejection Infineon Technologies AG
17632340 Display Device and Electronic Device Non-Final OA Semiconductor Energy Laboratory Co., Ltd.
17968201 METHOD OF FORMING INTERCONNECT FOR SEMICONDUCTOR DEVICE Final Rejection Applied Materials, Inc.
18363841 POSITION DETERMINING METHOD AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE Non-Final OA Kioxia Corporation
18090471 PROCESSES AND APPLICATIONS FOR CATALYST INFLUENCED CHEMICAL ETCHING Non-Final OA Board of Regents, The University of Texas System
18010456 PROCESSES AND APPLICATIONS FOR CATALYST INFLUENCED CHEMICAL ETCHING Non-Final OA Board of Regents, The University of Texas System
18002525 Method for Manufacturing Semiconductor Device Final Rejection NTT, Inc.
17768709 Optical Communication Element Final Rejection NTT, Inc.
18328988 VERIFICATION METHOD FOR DEVICE CHIPS Non-Final OA DISCO CORPORATION
18328310 METHOD OF HANDLING WAFER Non-Final OA DISCO CORPORATION
18321411 MANUFACTURING METHOD OF CHIPS Non-Final OA DISCO CORPORATION
18490923 PLASMA-SINGULATED, CONTAMINANT-REDUCED SEMICONDUCTOR DIE Non-Final OA SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
18093477 THIN-FILM TRANSISTOR, THIN-FILM TRANSISTOR ARRAY, AND METHOD OF PRODUCING THIN-FILM TRANSISTOR Final Rejection TOPPAN Inc.
18237195 TRANSISTOR WITH THERMAL PLUG Non-Final OA GlobalFoundries U.S. Inc.
18184078 MEMORY DEVICE AND METHOD FOR FORMING THE SAME Final Rejection MACRONIX INTERNATIONAL CO., LTD.
18420779 WAFER WITH TEST STRUCTURE AND METHOD OF DICING WAFER Non-Final OA UNITED MICROELECTRONICS CORP.
17674796 SEMICONDUCTOR STRUCTURE WITH BACKSIDE THROUGH SILICON VIAS AND METHOD OF OBTAINING DIE IDS THEREOF Final Rejection UNITED MICROELECTRONICS CORP.
17990567 LIGHT-EMITTING DEVICE AND METHOD FOR MANUFACTURING THE SAME Final Rejection QUANZHOU SANAN SEMICONDUCTOR TECHNOLOGY CO., LTD
17750953 SELECTIVE REMOVAL OF SEMICONDUCTOR FINS Final Rejection Adeia Semiconductor Solutions LLC

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