Prosecution Insights
Last updated: April 19, 2026
Application No. 18/358,394

BIASING CIRCUIT FOR RADIO FREQUENCY AMPLIFIER

Non-Final OA §102
Filed
Jul 25, 2023
Examiner
NGUYEN, KHIEM D
Art Unit
2843
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
MACOM TECHNOLOGY SOLUTIONS HOLDINGS, INC.
OA Round
1 (Non-Final)
86%
Grant Probability
Favorable
1-2
OA Rounds
2y 6m
To Grant
98%
With Interview

Examiner Intelligence

Grants 86% — above average
86%
Career Allow Rate
1872 granted / 2187 resolved
+17.6% vs TC avg
Moderate +12% lift
Without
With
+12.5%
Interview Lift
resolved cases with interview
Typical timeline
2y 6m
Avg Prosecution
73 currently pending
Career history
2260
Total Applications
across all art units

Statute-Specific Performance

§101
0.5%
-39.5% vs TC avg
§103
44.5%
+4.5% vs TC avg
§102
30.7%
-9.3% vs TC avg
§112
15.2%
-24.8% vs TC avg
Black line = Tech Center average estimate • Based on career data from 2187 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claims 1-3 & 16-19 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Bettencourt (US 7,852,136 B2). PNG media_image1.png 1018 902 media_image1.png Greyscale Regarding claim 1, Bettencourt (Fig. 2) discloses a biasing circuit for biasing an output transistor (transistor Q1) in a radio frequency (RF) amplifier, the biasing circuit comprising: a first field-effect transistor (FET) (transistor Q2, Fig. 2) monolithically integrated with the output transistor (Col. 1, lines 56-58, integrated circuit), the first FET (transistor Q2) including a first source/drain connected to a first voltage source (reference potential ground, it noted that the transistor Q2 having analogous arrangement as the transistor MBIAS of the Fig. 3 of the application), a gate connected to a gate of the output transistor (transistor Q1), and a second source/drain connected to a current source (resistor R1 connected to VDD) configured to supply a prescribed current to the first FET; and a voltage divider (resistor R2 and R3 form as a voltage divider) coupled to the current source and configured to control a voltage at the gate of the first FET for setting a direct current (DC) quiescent current in the output transistor (transistor Q1). Regarding claim 2, Bettencourt (Fig. 2) discloses wherein the voltage divider includes a first resistor (R2) connected between the second source/drain and the gate of the first FET (transistor Q2), and a second resistor (resistor R3) connected between the gate of the first FET and a second voltage source (reference potential at node n3). Regarding claim 3, Bettencourt (Fig. 2) discloses wherein the first and second resistors (R2 and R3) are formed of the same material and are disposed proximate to one another. Regarding claim 16, Bettencourt (Fig. 2) discloses wherein the first source/drain of the first FET is connected to a first source/drain of the output transistor (both source terminals of transistors Q2 & Q1 connected to common ground / both drain terminals of transistors Q2 and Q1 connected to same supply source VDD), such that the first FET (transistor Q2) and the output transistor (transistor Q1) are connected together in a current mirror configuration (Col. 3, lines 55-57, Q2 and Q1 are in a current mirror configuration). Regarding claim 17, Bettencourt (Fig. 2) discloses a biasing circuit for biasing an output transistor (transistor Q1) in a radio frequency (RF) amplifier, the biasing circuit comprising: a first field-effect transistor (FET) (transistor Q2) monolithically integrated (Col. 1, lines 56-58, integrated circuit), with the output transistor, the first FET being connected to the output transistor in a current mirror configuration (Col. 3, lines 55-57, Q2 and Q1 are in a current mirror configuration), such that a gate-to-source voltage of the first FET is the same as a gate-to-source voltage of the output transistor, and a drain current in the first FET (transistor Q2) is matched to a drain current in the output transistor (transistor Q1) and scaled proportionally according to a size of the first FET relative to a size of the output transistor; and a voltage divider (resistors R2 and R3 forms a voltage divider) integrated with the first FET (transistor Q2) and connected to a current source (resistor R1 connected to VDD), the voltage divider (resistors R2 and R3) being configured to generate a voltage that is substantially independent of temperature variations for controlling the drain current in the first FET (transistor Q2). Regarding claim 18, Bettencourt (Fig. 2) discloses wherein the first FET (transistor Q2) includes a first source/drain connected to a first voltage source (reference potential ground, it noted that the transistor Q2 having analogous arrangement as the transistor MBIAS of the Fig. 3 of the application), a gate connected to a gate of the output transistor (transistor Q1), and a second source/drain connected to the current source. Regarding claim 19, Bettencourt (Fig. 2) discloses wherein the voltage divider includes a first resistor (resistor R2) connected between the second source/drain and the gate of the first FET (transistor Q2), and a second resistor (resistor R3) connected between the gate of the first FET and a second voltage source (reference potential at node 3). Allowable Subject Matter Claims 4-15, 21, 25, 29 & 31 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Claim 33 is allowed. Upon conclusion of a comprehensive search of the pertinent prior art, the Office indicates that the claims are allowable. The prior art when taken alone, or, in combination, cannot be construed as reasonably teaching or suggesting all of the elements of the claimed invention as arranged, disposed, or provided in the manner as claimed by the Applicant. Added primarily for emphasis, the claim recitations “ an impedance presented to a gate of the output transistor by the biasing circuit is configured to be about 0 to 10 ohms per millimeter of gate width of the output transistor” in claim 33 is not found in the prior art of record. Any comments considered necessary by applicant must be submitted no later than the payment of the issue fee and, to avoid processing delays, should preferably accompany the issue fee. Such submissions should be clearly labeled “Comments on Statement of Reasons for Allowance.” Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to KHIEM D NGUYEN whose telephone number is (571)270-3941. The examiner can normally be reached Mon-Fri 8:00 AM-5:00 PM EST. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, ANDREA J LINDGREN BALTZELL can be reached at (571)272-5918. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /KHIEM D NGUYEN/Examiner, Art Unit 2843
Read full office action

Prosecution Timeline

Jul 25, 2023
Application Filed
Jan 17, 2026
Non-Final Rejection — §102 (current)

Precedent Cases

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
86%
Grant Probability
98%
With Interview (+12.5%)
2y 6m
Median Time to Grant
Low
PTA Risk
Based on 2187 resolved cases by this examiner. Grant probability derived from career allow rate.

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