Prosecution Insights
Last updated: July 05, 2026
Application No. 18/404,489

CORRECTING OF DESIGN AND MASK SHAPE POSITION DUE TO DIE AND WAFER DISTORTION FOR BONDING

Non-Final OA
Filed
Jan 04, 2024
Examiner
OH, JIYOUNG
Art Unit
2818
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Tokyo Electron Limited
OA Round
1 (Non-Final)
75%
Grant Probability
Favorable
1-2
OA Rounds
1y 0m
Est. Remaining
99%
With Interview

Examiner Intelligence

Grants 75% — above average
75%
Career Allowance Rate
27 granted / 36 resolved
+7.0% vs TC avg
Strong +28% interview lift
Without
With
+27.8%
Interview Lift
resolved cases with interview
Typical timeline
3y 6m
Avg Prosecution
30 currently pending
Career history
89
Total Applications
across all art units

Statute-Specific Performance

§103
86.6%
+46.6% vs TC avg
§102
7.4%
-32.6% vs TC avg
§112
5.2%
-34.8% vs TC avg
Black line = Tech Center average estimate • Based on career data from 36 resolved cases

Prosecution Timeline

Jan 04, 2024
Application Filed
Apr 21, 2026
Non-Final Rejection mailed (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12648177
Thin-Film Transistors For Detecting Miniature Targets
3y 10m to grant Granted Jun 02, 2026
Patent 12628635
SELECTIVE DEPOSITION OF LINER AND BARRIER FILMS FOR RESISTANCE REDUCTION OF SEMICONDUCTOR DEVICES
3y 9m to grant Granted May 12, 2026
Patent 12622120
DISPLAY DEVICE
4y 1m to grant Granted May 05, 2026
Patent 12610529
SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING SAME
3y 3m to grant Granted Apr 21, 2026
Patent 12568652
FORMING GATE ALL AROUND DEVICE WITH SILICON-GERMANIUM CHANNEL
3y 5m to grant Granted Mar 03, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
75%
Grant Probability
99%
With Interview (+27.8%)
3y 6m (~1y 0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 36 resolved cases by this examiner. Grant probability derived from career allowance rate.

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