Prosecution Insights
Last updated: April 19, 2026

Examiner: OH, JIYOUNG

Tech Center 2800 • Art Units: 2818

This examiner grants 72% of resolved cases

Performance Statistics

72.4%
Allow Rate
+4.4% vs TC avg
80
Total Applications
+32.9%
Interview Lift
1267
Avg Prosecution Days
Based on 29 resolved cases, 2023–2026

Rejection Statute Breakdown

0%
§101 Eligibility
24.6%
§102 Novelty
59.0%
§103 Obviousness
15.5%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18534997 CAPACITOR STRUCTURE AND SEMICONDUCTOR DEVICE INCLUDING THE CAPACITOR STRUCTURE Non-Final OA SAMSUNG ELECTRONICS CO., LTD.
18138192 METHOD OF MANUFACTURING INTEGRATED CIRCUIT DEVICE Final Rejection SAMSUNG ELECTRONICS CO., LTD.
18193758 SEMICONDUCTOR DEVICE Non-Final OA SAMSUNG ELECTRONICS CO., LTD.
17962783 THIN FILM TRANSISTOR, FABRICATING METHOD THEREOF AND DISPLAY DEVICE COMPRISING THE SAME Non-Final OA LG Display Co., Ltd.
18194126 POST-LASER DICING WAFER-LEVEL TESTING Non-Final OA TEXAS INSTRUMENTS INCORPORATED
18247789 BACKLIGHT UNIT, DISPLAY DEVICE COMPRISING SAME, AND METHOD FOR MANUFACTURING DISPLAY DEVICE Final Rejection LG ELECTRONICS INC.
18076396 DISPLAY APPARATUS HAVING FIRST FIXING ELEMENT ADJACENT TO PAD GROUP Non-Final OA AUO Corporation
17992935 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF Final Rejection AUO Corporation
18353732 Stacked Multi-Gate Device With Reduced Contact Resistance And Methods For Forming The Same Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18304350 METHOD OF FORMING SEMICONDUCTOR STRUCTURE Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18155296 SEMICONDUCTOR DEVICE STRUCTURE AND METHOD FOR FORMING THE SAME Final Rejection Taiwan Semiconductor Manufacturing Company, Ltd.
17855639 CONTACT ARCHITECTURE FOR 2D STACKED NANORIBBON TRANSISTOR Final Rejection Intel Corporation
17554004 INDUCTORS AND TRANSFORMERS FORMED BY BURIED POWER RAILS Final Rejection Intel Corporation
17357729 FEATURES FOR IMPROVING DIE SIZE AND ORIENTATION DIFFERENTIATION IN HYBRID BONDING SELF ASSEMBLY Final Rejection Intel Corporation
17308853 METAL OXIDE THIN FILM TRANSISTORS WITH MULTI-COMPOSITION GATE DIELECTRIC Non-Final OA Intel Corporation
18306348 METHOD FOR MANUFACTURING LIGHT-EMITTING DEVICE Non-Final OA NICHIA CORPORATION
18319915 METHOD TO REDUCE PARASITIC RESISTANCE FOR CFET DEVICES THROUGH SINGLE DAMASCENE PROCESSING OF VIAS Non-Final OA Tokyo Electron Limited
18151061 Well Modulation for Defect Inspection Final Rejection Taiwan Semiconductor Manufacturing Co., Ltd.
17816782 Trimming Through Etching in Wafer to Wafer Bonding Non-Final OA Taiwan Semiconductor Manufacturing Co., Ltd.
17815088 Semiconductor Package and Method Non-Final OA Taiwan Semiconductor Manufacturing Co., Ltd.
18058154 MICRO-NANOFIN LED ELECTRODE ASSEMBLY, MANUFACTURING METHOD THEREFOR, AND LIGHT SOURCE INCLUDING SAME Final Rejection KOOKMIN UNIVERSITY INDUSTRY ACADEMY COOPERATION FOUNDATION
18484304 ELECTRICAL MODULE AND METHOD OF MANUFACTURING AN ELECTRICAL MODULE Non-Final OA Rolls-Royce Deutschland Ltd & Co KG
18065918 Method for Bonding Dies to a Carrier Substrate Final Rejection IMEC VZW
18156459 SEMICONDUCTOR STRUCTURE WITH VERTICAL TRANSISTOR AND FORMING METHOD THEREFOR Final Rejection CHANGXIN MEMORY TECHNOLOGIES, INC.
18248212 LOW ROUGHNESS THIN-FILM TRANSISTORS Non-Final OA Amorphyx, Incorporated
17806497 Eutectic Electrode Structure of Flip-chip LED Chip and Flip-chip LED Chip Non-Final OA XIAMEN SANAN OPTOELECTRONICS TECHNOLOGY CO., LTD.

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