Prosecution Insights
Last updated: April 19, 2026
Application No. 18/405,172

SEMICONDUCTOR PACKAGE STRUCTURE

Non-Final OA §102§103
Filed
Jan 05, 2024
Examiner
ENAD, CHRISTINE A
Art Unit
2811
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
MediaTek Inc.
OA Round
1 (Non-Final)
84%
Grant Probability
Favorable
1-2
OA Rounds
2y 1m
To Grant
94%
With Interview

Examiner Intelligence

Grants 84% — above average
84%
Career Allow Rate
1105 granted / 1312 resolved
+16.2% vs TC avg
Moderate +10% lift
Without
With
+10.1%
Interview Lift
resolved cases with interview
Fast prosecutor
2y 1m
Avg Prosecution
68 currently pending
Career history
1380
Total Applications
across all art units

Statute-Specific Performance

§101
1.5%
-38.5% vs TC avg
§103
61.5%
+21.5% vs TC avg
§102
21.1%
-18.9% vs TC avg
§112
7.7%
-32.3% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1312 resolved cases

Office Action

§102 §103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. (a)(2) the claimed invention was described in a patent issued under section 151, or in an application for patent published or deemed published under section 122(b), in which the patent or application, as the case may be, names another inventor and was effectively filed before the effective filing date of the claimed invention. Claims 1-3, 5-8 are rejected under 35 U.S.C. 102(a)(2) as being anticipated by Hsu et al (US Publication No. 2025/0219031). Regarding claim 1, Hsu discloses a semiconductor package structure, comprising: a first substrate Fig 5, S; a capacitor structure disposed over the first substrate and comprising: a semiconductor substrate Fig 5, 10 having a first surface and a second surface opposite the first surface; a first capacitor Fig 2, 12 or Fig 5, 12 disposed on the first surface of the semiconductor substrate Fig 2 and Fig 5; and a second capacitor Fig 2, 22 or Fig 5, 22 disposed on the second surface of the semiconductor substrate Fig 2 and Fig 5; and a plurality of first conductive connectors Fig 5, 29 disposed over the capacitor structure and electrically coupled to the first capacitor; and a plurality of second conductive connectors Fig 5, 29 disposed below the capacitor structure and electrically coupled to the second capacitor Fig 2 and Fig 5. Regarding claim 2, Hsu discloses, wherein the capacitor structure further comprises: a first metal layer Fig 5, 16 disposed between the semiconductor substrate and the first capacitor and electrically coupled to one of the first conductive connectors; and a second metal layer Fig 5, 26 disposed over a top surface of the first capacitor and electrically coupled to another one of the first conductive connectors Fig 5. Regarding claim 3, Hsu discloses wherein the capacitor structure further comprises: a dielectric layer Fig 5, 14 disposed on the first surface of the semiconductor substrate and surrounding the first metal layer, the first capacitor, and the second metal layer Fig 5. Regarding claim 5, Hsu discloses wherein the first capacitor vertically overlaps the second capacitor Fig 5. Regarding claim 6, Hsu discloses wherein the first conductive connectors and the second conductive connectors each comprises microbumps, wire bonds, copper pillar bumps, or a combination thereof Fig 5. Regarding claim 7, Hsu discloses a second substrate Fig 5, 40 disposed over the capacitor structure and electrically coupled to the first substrate through a plurality of conductive terminals, wherein the capacitor structure is disposed between the plurality of conductive terminals; and a semiconductor die disposed over the second substrate¶0031-0033, 0041 Fig 5. Regarding claim 8, Hsu discloses wherein the first conductive connectors are electrically coupled to the second substrate and the second conductive connectors are electrically coupled to the first substrate Fig 5. Claims 9-11, 17-19 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Choi (US Publication No. 2020/0294889). Regarding claim 9, Choi discloses a semiconductor package structure, comprising: a substrate Fig 4, 600; a redistribution layer Fig 4, 310B/320B disposed over the substrate; a capacitor structure disposed over the redistribution layer and electrically coupled to the redistribution layer Fig 4, wherein the capacitor structure comprises: a semiconductor substrate Fig 2 or 4, 220 ¶0024; a first capacitor Fig 2 or 4, 230 disposed over the semiconductor substrate; and a second capacitor Fig 2 or 4, 230 disposed below the semiconductor substrate Fig 2 or 4, 220 and vertically overlapping the first capacitor; and a first semiconductor die Fig 4, 100 disposed over the redistribution layer Fig 4, 310B/320B and electrically coupled to the redistribution layer Fig 4. Regarding claim 10, Choi discloses wherein the first semiconductor die Fig 4, 100T is disposed over the capacitor structure and electrically coupled to the first capacitor, and the redistribution layer is electrically coupled to the second capacitor Fig 4. Regarding claim 11, Choi discloses a conductive pillar adjacent to the capacitor structure and electrically coupling the first semiconductor die to the redistribution layer Fig 4. Regarding claim 17, Choi discloses a semiconductor package structure, comprising: a substrate Fig 4, 600; a semiconductor die Fig 4, 100 disposed over the substrate; a capacitor structure disposed between the substrate and the first semiconductor die Fig 4 and comprising: a semiconductor substrate Fig 2 or 4, 220 ¶0024; a first capacitor Fig 2 or 4, 230 disposed over the semiconductor substrate and electrically coupled to the first semiconductor die; and a second capacitor Fig 2 or 4, 230 disposed below the semiconductor substrate and electrically coupled to the substrate, wherein the first capacitor vertically overlaps the second capacitor Fig 4. Regarding claim 18, Choi discloses a conductive pillar disposed over the substrate and electrically coupling the semiconductor die to the substrate; and a plurality of conductive terminals disposed below the substrate Fig 4. Regarding claim 19, Choi discloses a first conductive connector electrically coupling the first capacitor to the first semiconductor die; and a second conductive connector electrically coupling the second capacitor to the substrate Fig 4. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim 4 is rejected under 35 U.S.C. 103 as being unpatentable over Hsu et al (US Publication No. 2025/0219031) in view of Ye et al (US Publication No. 2024/0072022). Regarding claim 4, Hsu discloses all the limitations but silent on the length of the second metal layer. Whereas Ye discloses wherein a length of the first metal layer is greater than a length of the second metal layer Fig 3. Hsu and Ye are analogous art because they are directed to capacitor structure and one of ordinary skill in the art would have had a reasonable expectation of success to modify Hsu because they are from the same field of endeavor. Therefore it would have been obvious to one having ordinary skill of the art before the effective filing date of the claimed invention to modify the metal layer length to improve connectivity. Claims 12-16 are rejected under 35 U.S.C. 103 as being unpatentable over Choi (US Publication No. 2020/0294889) in view of Ye et al (US Publication No. 2024/0072022). Regarding claim 12, Choi discloses wherein the capacitor structure is disposed over the first semiconductor die Fig 4, 100B and electrically coupled to the first semiconductor die Fig 4. Choi discloses all the limitations but silent on the type of bonding. Whereas Ye discloses a capacitor structure coupled to the semiconductor die through a first wire bond Fig 5. Choi and Ye are analogous art because they are directed to capacitor structure and one of ordinary skill in the art would have had a reasonable expectation of success to modify Choi because they are from the same field of endeavor. Therefore it would have been obvious to one having ordinary skill of the art before the effective filing date of the claimed invention to modify the type of connection between devices as an alternative method known in the art as a matter of design choice. Regarding claim 13, Ye discloses a second semiconductor die disposed over the first semiconductor die and electrically coupled to the first semiconductor die through a second wire bond Fig 5. Regarding claim 14, Ye discloses wherein the first semiconductor die is electrically coupled to the redistribution layer through a second wire bond ¶0026 Fig 3-4 and Fig 8A. Regarding claim 15, Choi discloses wherein the capacitor structure is adjacent to the first semiconductor die, wherein the capacitor structure and the first semiconductor die are electrically coupled to the redistribution layer Fig 4. Choi discloses all the limitations but silent on the type of bonding. Whereas Ye discloses a capacitor structure coupled to the semiconductor die through a first wire bond Fig 5. Choi and Ye are analogous art because they are directed to capacitor structure and one of ordinary skill in the art would have had a reasonable expectation of success to modify Choi because they are from the same field of endeavor. Therefore it would have been obvious to one having ordinary skill of the art before the effective filing date of the claimed invention to modify the type of connection between devices as an alternative method known in the art as a matter of design. Regarding claim 16, Choi discloses a second semiconductor die disposed over the redistribution layer and electrically coupled to the capacitor structure and the first semiconductor die Fig 4. Choi discloses all the limitations but silent on the type of bonding. Whereas Ye discloses a capacitor structure coupled to the semiconductor die through a first wire bond Fig 5. Choi and Ye are analogous art because they are directed to capacitor structure and one of ordinary skill in the art would have had a reasonable expectation of success to modify Choi because they are from the same field of endeavor. Therefore it would have been obvious to one having ordinary skill of the art before the effective filing date of the claimed invention to modify the type of connection between devices as an alternative method known in the art as a matter of design Claim 20 is rejected under 35 U.S.C. 103 as being unpatentable over Choi (US Publication No. 2020/0294889) in view of Ye et al (US Publication No. 2024/0072022) and in further view of Kung et al (US Publication No. 2023/0065615). Regarding claim 20, Choi discloses all the limitations but silent on the connector/pillar arrangement. Whereas Kung discloses wherein a height of the conductive pillar is equal to a total height of the first conductive connector, the capacitor structure, and the second conductive connector Fig 2. Choi and Kung are analogous art because they are directed to capacitor structure and one of ordinary skill in the art would have had a reasonable expectation of success to modify Choi because they are from the same field of endeavor. Therefore it would have been obvious to one having ordinary skill of the art before the effective filing date of the claimed invention to modify the connector arrangement and incorporate the teachings of Kung as an alternative arrangement to improve device connectivity. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to CHRISTINE A ENAD whose telephone number is (571)270-7891. The examiner can normally be reached Monday-Friday, 7:30 am -4:30 pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Lynne Gurley can be reached at 571 272 1670. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /CHRISTINE A ENAD/Primary Examiner, Art Unit 2811
Read full office action

Prosecution Timeline

Jan 05, 2024
Application Filed
Mar 05, 2026
Non-Final Rejection — §102, §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
84%
Grant Probability
94%
With Interview (+10.1%)
2y 1m
Median Time to Grant
Low
PTA Risk
Based on 1312 resolved cases by this examiner. Grant probability derived from career allow rate.

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