Prosecution Insights
Last updated: July 05, 2026
Application No. 18/414,252

OXIDATION BASED ATOMIC LAYER ETCHING

Non-Final OA
Filed
Jan 16, 2024
Examiner
TRAN, TRANG Q
Art Unit
2811
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Tokyo Electron Limited
OA Round
1 (Non-Final)
81%
Grant Probability
Favorable
1-2
OA Rounds
2m
Est. Remaining
88%
With Interview

Examiner Intelligence

Grants 81% — above average
81%
Career Allowance Rate
587 granted / 725 resolved
+13.0% vs TC avg
Moderate +7% lift
Without
With
+7.2%
Interview Lift
resolved cases with interview
Typical timeline
2y 8m
Avg Prosecution
32 currently pending
Career history
767
Total Applications
across all art units

Statute-Specific Performance

§101
0.1%
-39.9% vs TC avg
§103
77.4%
+37.4% vs TC avg
§102
16.8%
-23.2% vs TC avg
§112
4.4%
-35.6% vs TC avg
Black line = Tech Center average estimate • Based on career data from 725 resolved cases

Prosecution Timeline

Jan 16, 2024
Application Filed
May 23, 2025
Response after Non-Final Action
May 12, 2026
Non-Final Rejection mailed (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12672576
SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF
4y 1m to grant Granted Jun 30, 2026
Patent 12667000
Semiconductor Device that Uses Bonding Layer to Join Semiconductor Substrates Together
4y 10m to grant Granted Jun 23, 2026
Patent 12667029
PACKAGE COMPRISING A SUBSTRATE WITH POST INTERCONNECTS AND A SOLDER RESIST LAYER HAVING A CAVITY
4y 5m to grant Granted Jun 23, 2026
Patent 12653010
Adaptive Interconnect Structure for Semiconductor Package
3y 9m to grant Granted Jun 09, 2026
Patent 12642149
Package Formation Using UBM-First Approach and the Corresponding Packages
3y 4m to grant Granted May 26, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
81%
Grant Probability
88%
With Interview (+7.2%)
2y 8m (~2m remaining)
Median Time to Grant
Low
PTA Risk
Based on 725 resolved cases by this examiner. Grant probability derived from career allowance rate.

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