Prosecution Insights
Last updated: October 01, 2026
Application No. 18/432,027

SEMICONDUCTOR STRUCTURE INCLUDING HIGH THERMAL CONDUCTIVITY MATERIAL AND METHOD OF FORMING THE SAME

Non-Final OA §103
Filed
Feb 04, 2024
Examiner
BRADFORD, PETER
Art Unit
2897
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Taiwan Semiconductor Manufacturing Company, Ltd.
OA Round
1 (Non-Final)
81%
Grant Probability
Favorable
1-2
OA Rounds
0m
Est. Remaining
85%
With Interview

Examiner Intelligence

Grants 81% — above average
81%
Career Allowance Rate
614 granted / 761 resolved
+12.7% vs TC avg
Minimal +4% lift
Without
With
+4.3%
Interview Lift
resolved cases with interview
Typical timeline
2y 6m
Avg Prosecution
33 currently pending
Career history
795
Total Applications
across all art units

Statute-Specific Performance

§101
0.6%
-39.4% vs TC avg
§103
46.4%
+6.4% vs TC avg
§102
21.6%
-18.4% vs TC avg
§112
30.9%
-9.1% vs TC avg
Black line = Tech Center average estimate • Based on career data from 761 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Restriction/Election Pursuant to the election without traverse on July 13, 2026, non-elected claims 7-20 are withdrawn from consideration. Claim Rejections - 35 USC § 103 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claims 1, 2, and 4-6 are rejected under 35 U.S.C. 103 as being unpatentable over Figuet, US 2026/0209990 A1, in view of Cheng, US 2020/0373206 A1. Claim 1: Figuet discloses and source/drain (S/D) regions (Dop, FIG. 8) disposed over the substrate at opposite sides of the gate structure and connecting the plurality of channel layers, wherein a material of the S/D regions comprises a high thermal conductivity material with a single crystal structure (boron arsenide (BAs)). PNG media_image1.png 316 548 media_image1.png Greyscale Chiang discloses a substrate (106); a plurality of channel layers (120) stacked over the substrate; a gate structure (112) wrapping the plurality of channel layers. PNG media_image2.png 636 456 media_image2.png Greyscale Figuet shows that it was known in the art to have a boron arsenide-source/drain transistor. Cheng discloses that the stacked channels with wrapped gates (e.g. gate-all-around transistors) were known in the art. It would have been obvious to have used the a GAA device such as Cheng in the device of Figuet in order to allow for smaller devices (Cheng [0002]). Alternatively, it would have been obvious to have used boron arsenide in Cheng in order to improve the heat dissipation and reliability ([0003]). Claim 2: the high thermal conductivity material comprises boron arsenide (BAs) with a thermal conductivity greater than 1000 W/mK (Figuet ([0005]). Claim 4: the S/D regions is free of silicon or silicon-containing material (boron arsenide). Claim 5: Cheng discloses a plurality of inner spacers (Cheng 113) respectively disposed between the S/D regions and the gate structure (Cheng FIG. 1C). Claim 6: in Cheng, the gate structure comprises: an interface layer (127) wrapping the plurality of channel layers; a gate dielectric layer (128) overlying the interface layer; a work function metal layer (130) overlying the gate dielectric layer; and a gate electrode (135) overlying the work function metal layer. PNG media_image3.png 550 596 media_image3.png Greyscale Conclusion Claims 1, 2, and 4-6 are rejected under 35 U.S.C. 103 as being unpatentable over Figuet in view of Cheng and Hu, US 2021/0035885 A1. Figuet does not disclose that the boron arsenide has a cubic structure. However, Hu discloses the formation of semiconductor devices in boron arsenide ([0027]) and the structure can be cubic ([0049]). It would have been obvious to have used this structure of boron arsenide as known for the formation of semiconductor devices. Any inquiry concerning this communication or earlier communications from the examiner should be directed to PETER BRADFORD whose telephone number is (571)270-1596. The examiner can normally be reached 10:30-6:30. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Jacob Choi can be reached at 469.295.9060. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /PETER BRADFORD/Primary Examiner, Art Unit 2897
Read full office action

Prosecution Timeline

Feb 04, 2024
Application Filed
Sep 23, 2026
Non-Final Rejection mailed — §103 (current)

Precedent Cases

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
81%
Grant Probability
85%
With Interview (+4.3%)
2y 6m (~0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 761 resolved cases by this examiner. Grant probability derived from career allowance rate.

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