Prosecution Insights
Last updated: October 02, 2026

Examiner: BRADFORD, PETER

Tech Center 2800 • Art Units: 2895 2897

This examiner grants 81% of resolved cases

Analysis

Peter Bradford is an examiner in Tech Center 2800 and Art Unit 2895. The examiner has 761 resolved cases on record. The data shows an allowance rate of 80.7% for these applications. This 80.7% allowance rate provides a metric for the frequency of successful outcomes. The median days to allowance is 933, which establishes a timeframe for the duration of the examination process from filing to the final grant.

The profile also includes an interview lift of 4.3%. This lift indicates that conducting an interview with the examiner correlates with a change in the likelihood of success. For practitioners, the 4.3% lift suggests that direct communication is a useful strategy for addressing rejections. With 761 resolved cases, the examiner's history provides a basis for these observations. The 933-day median to allowance remains a key consideration for managing client expectations and prosecution resources in Art Unit 2895.

Written from this page's own data; every figure is computed from USPTO records and verified before publication.

Performance Statistics

80.7%
Allow Rate
+12.7% vs TC avg
795
Total Applications
+4.3%
Interview Lift
933
Avg Prosecution Days
Based on 761 resolved cases, 2023–2026

Rejection Statute Breakdown

0.6%
§101 Eligibility
21.6%
§102 Novelty
46.4%
§103 Obviousness
30.9%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18638757 SEMICONDUCTOR PACKAGE AND METHOD OF INSPECTING THE SEMICONDUCTOR PACKAGE Non-Final OA Samsung Electronics Co., Ltd.
18601467 SEMICONDUCTOR DEVICE Non-Final OA Samsung Electronics Co., Ltd.
18413897 LIGHT SENSING DEVICE AND METHOD OF MANUFACTURING THE SAME, IMAGE SENSOR INCLUDING LIGHT SENSING DEVICE, AND ELECTRONIC APPARATUS INCLUDING IMAGE SENSOR Non-Final OA SAMSUNG ELECTRONICS CO., LTD.
18388266 SEMICONDUCTOR DEVICES Non-Final OA SAMSUNG ELECTRONICS CO., LTD.
18387682 SEMICONDUCTOR PACKAGE Final Rejection SAMSUNG ELECTRONICS CO., LTD.
18229296 SEMICONDUCTOR MEMORY DEVICE AND ELECTRONIC SYSTEM INCLUDING THE SAME Final Rejection SAMSUNG ELECTRONICS CO., LTD.
18180727 DISPLAY SUBSTRATE, METHOD FOR MANUFACTURING THE SAME AND DISPLAY DEVICE Final Rejection BOE TECHNOLOGY GROUP CO., LTD.
18785925 DISPLAY DEVICE Non-Final OA Samsung Display Co., LTD.
18620692 ORGANIC LIGHT EMITTING DIODE DISPLAY WITH SHAPED EDGES OF ORGANIC EMISSION LAYER Final Rejection SAMSUNG DISPLAY CO., LTD.
18398197 DISPLAY DEVICE Non-Final OA Samsung Display Co., Ltd.
18523961 THIN FILM TRANSISTOR AND TRANSISTOR ARRAY SUBSTRATE Final Rejection Samsung Display Co., Ltd.
18219851 DISPLAY DEVICE Final Rejection Samsung Display Co., LTD.
18190158 DISPLAY DEVICE AND MANUFACTURING METHOD OF DISPLAY DEVICE Final Rejection Magnolia White Corporation
18732927 SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME Non-Final OA YANGTZE MEMORY TECHNOLOGIES CO., LTD.
18641584 LIGHTING APPARATUS Non-Final OA LEEDARSON LIGHTING CO.,LTD.
18687589 PHOTODETECTION DEVICE, IMAGING DEVICE, AND DISTANCE MEASUREMENT APPARATUS Non-Final OA Sony Semiconductor Solutions Corporation
18514503 ENABLING MM-WAVE AESAS USING ADVANCED PACKAGING Non-Final OA Rockwell Collins, Inc.
18584199 FERROELECTRIC SEMICONDUCTOR DEVICE INCLUDING MEMORY CELL HAVING A THREE-DIMENSIONAL STRUCTURE Non-Final OA SK hynix Inc.
18455411 MEMORY DEVICE Non-Final OA SK hynix Inc.
18400350 LDMOS EDGE TERMINATION FOR IMPROVED SAFE OPERATING AREA Non-Final OA Texas Instruments Incorporated
18672733 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18432027 SEMICONDUCTOR STRUCTURE INCLUDING HIGH THERMAL CONDUCTIVITY MATERIAL AND METHOD OF FORMING THE SAME Non-Final OA Taiwan Semiconductor Manufacturing Company, Ltd.
18348343 NOVEL STORAGE GATE FINFET FOR NON-VOLATILE MEMORY Final Rejection Taiwan Semiconductor Manufacturing Company, Ltd.
18558388 METHODS TO IMPROVE PRODUCTIVITY OF ADVANCED CVD W GAPFILL PROCESS Final Rejection Applied Materials, Inc.
18752747 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME Non-Final OA United Semiconductor (Xiamen) Co., Ltd.
18479316 IMAGE SENSOR CHARGE DIRECTION STRUCTURES AND METHODS Non-Final OA SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
18454546 DEVICE AND FORMATION METHOD THEREOF Final Rejection National Yang Ming Chiao Tung University
18612961 SUPER FLASH AND METHOD FOR MANUFACTURING SAME Non-Final OA Shanghai Huali Integrated Circuit Corporation

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