Tech Center 2800 • Art Units: 2895 2897
This examiner grants 81% of resolved cases
Peter Bradford is an examiner in Tech Center 2800 and Art Unit 2895. The examiner has 761 resolved cases on record. The data shows an allowance rate of 80.7% for these applications. This 80.7% allowance rate provides a metric for the frequency of successful outcomes. The median days to allowance is 933, which establishes a timeframe for the duration of the examination process from filing to the final grant.
The profile also includes an interview lift of 4.3%. This lift indicates that conducting an interview with the examiner correlates with a change in the likelihood of success. For practitioners, the 4.3% lift suggests that direct communication is a useful strategy for addressing rejections. With 761 resolved cases, the examiner's history provides a basis for these observations. The 933-day median to allowance remains a key consideration for managing client expectations and prosecution resources in Art Unit 2895.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18638757 | SEMICONDUCTOR PACKAGE AND METHOD OF INSPECTING THE SEMICONDUCTOR PACKAGE | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18601467 | SEMICONDUCTOR DEVICE | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18413897 | LIGHT SENSING DEVICE AND METHOD OF MANUFACTURING THE SAME, IMAGE SENSOR INCLUDING LIGHT SENSING DEVICE, AND ELECTRONIC APPARATUS INCLUDING IMAGE SENSOR | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18388266 | SEMICONDUCTOR DEVICES | Non-Final OA | SAMSUNG ELECTRONICS CO., LTD. |
| 18387682 | SEMICONDUCTOR PACKAGE | Final Rejection | SAMSUNG ELECTRONICS CO., LTD. |
| 18229296 | SEMICONDUCTOR MEMORY DEVICE AND ELECTRONIC SYSTEM INCLUDING THE SAME | Final Rejection | SAMSUNG ELECTRONICS CO., LTD. |
| 18180727 | DISPLAY SUBSTRATE, METHOD FOR MANUFACTURING THE SAME AND DISPLAY DEVICE | Final Rejection | BOE TECHNOLOGY GROUP CO., LTD. |
| 18785925 | DISPLAY DEVICE | Non-Final OA | Samsung Display Co., LTD. |
| 18620692 | ORGANIC LIGHT EMITTING DIODE DISPLAY WITH SHAPED EDGES OF ORGANIC EMISSION LAYER | Final Rejection | SAMSUNG DISPLAY CO., LTD. |
| 18398197 | DISPLAY DEVICE | Non-Final OA | Samsung Display Co., Ltd. |
| 18523961 | THIN FILM TRANSISTOR AND TRANSISTOR ARRAY SUBSTRATE | Final Rejection | Samsung Display Co., Ltd. |
| 18219851 | DISPLAY DEVICE | Final Rejection | Samsung Display Co., LTD. |
| 18190158 | DISPLAY DEVICE AND MANUFACTURING METHOD OF DISPLAY DEVICE | Final Rejection | Magnolia White Corporation |
| 18732927 | SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME | Non-Final OA | YANGTZE MEMORY TECHNOLOGIES CO., LTD. |
| 18641584 | LIGHTING APPARATUS | Non-Final OA | LEEDARSON LIGHTING CO.,LTD. |
| 18687589 | PHOTODETECTION DEVICE, IMAGING DEVICE, AND DISTANCE MEASUREMENT APPARATUS | Non-Final OA | Sony Semiconductor Solutions Corporation |
| 18514503 | ENABLING MM-WAVE AESAS USING ADVANCED PACKAGING | Non-Final OA | Rockwell Collins, Inc. |
| 18584199 | FERROELECTRIC SEMICONDUCTOR DEVICE INCLUDING MEMORY CELL HAVING A THREE-DIMENSIONAL STRUCTURE | Non-Final OA | SK hynix Inc. |
| 18455411 | MEMORY DEVICE | Non-Final OA | SK hynix Inc. |
| 18400350 | LDMOS EDGE TERMINATION FOR IMPROVED SAFE OPERATING AREA | Non-Final OA | Texas Instruments Incorporated |
| 18672733 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18432027 | SEMICONDUCTOR STRUCTURE INCLUDING HIGH THERMAL CONDUCTIVITY MATERIAL AND METHOD OF FORMING THE SAME | Non-Final OA | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18348343 | NOVEL STORAGE GATE FINFET FOR NON-VOLATILE MEMORY | Final Rejection | Taiwan Semiconductor Manufacturing Company, Ltd. |
| 18558388 | METHODS TO IMPROVE PRODUCTIVITY OF ADVANCED CVD W GAPFILL PROCESS | Final Rejection | Applied Materials, Inc. |
| 18752747 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | Non-Final OA | United Semiconductor (Xiamen) Co., Ltd. |
| 18479316 | IMAGE SENSOR CHARGE DIRECTION STRUCTURES AND METHODS | Non-Final OA | SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC |
| 18454546 | DEVICE AND FORMATION METHOD THEREOF | Final Rejection | National Yang Ming Chiao Tung University |
| 18612961 | SUPER FLASH AND METHOD FOR MANUFACTURING SAME | Non-Final OA | Shanghai Huali Integrated Circuit Corporation |
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