Prosecution Insights
Last updated: October 23, 2026
Application No. 18/436,721

ONIUM SALT, RESIST COMPOSITION AND PATTERN FORMING PROCESS

Non-Final OA §102
Filed
Feb 08, 2024
Priority
Feb 21, 2023 — JP 2023-024819
Examiner
CHACKO DAVIS, DABORAH
Art Unit
1737
Tech Center
1700 — Chemical & Materials Engineering
Assignee
Shin-Etsu Chemical Co., Ltd.
OA Round
1 (Non-Final)
72%
Grant Probability
Favorable
1-2
OA Rounds
8m
Est. Remaining
92%
With Interview

Examiner Intelligence

Grants 72% — above average
72%
Career Allowance Rate
718 granted / 997 resolved
+7.0% vs TC avg
Strong +20% interview lift
Without
With
+20.4%
Interview Lift
resolved cases with interview
Typical timeline
3y 4m
Avg Prosecution
35 currently pending
Career history
1052
Total Applications
across all art units

Statute-Specific Performance

§101
0.7%
-39.3% vs TC avg
§103
35.9%
-4.1% vs TC avg
§102
28.5%
-11.5% vs TC avg
§112
25.3%
-14.7% vs TC avg
Black line = Tech Center average estimate • Based on career data from 997 resolved cases

Office Action

§102
DETAILED ACTION The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 1-17, is/are rejected under 35 U.S.C. 102(a) (1) as being anticipated by U. S. Patent Application Publication No. 2019/0299428 (hereinafter referred to as Masunaga). Masunaga, in the abstract, in [0023], and [0025], disclose a resist composition that comprises a base resin, and an onium salt that has the same claimed structure , and is disclosed as formula (1) and formula (II), and discloses a carboxylate anion structure, see below, PNG media_image1.png 354 392 media_image1.png Greyscale wherein the partial Y structure includes a nitrogen containing heterocycle (claimed W) that include substituents in the heterocycle (including nitrogen) wherein the substituent can include -CO2L, and is the same carbamate group attached to the claimed W, and also discloses that the substituents in the aryl group that can be linked to the Y group by a linking group (includes -CH2-, see right column on page 2, 3rd paragraph), and the aryl group can include any substituents in addition to a -CO2- group i.e., the substituents can include OH groups as disclosed by Masunaga, in paragraph no. [0061]. Masunaga, in [0076], discloses that the carboxylic acid onium salt functions as an acid diffusion regulator, and in [0077], Masunaga teaches that the acid diffusion regulator i.e., the carboxylic onium salt functions as a quencher (claims 1-7). Masunaga, in [0181], discloses that the resist composition includes an organic solvent, and in [0055], and [0140], discloses that the resist composition includes a photoacid generator (claims 8, 13). Masunaga, in [0149]-[0150], discloses that the resist composition includes a basic compound (claimed a quencher other than the quencher) for controlling acid diffusion (different from the onium salt) (claim 14). Masunaga, in [0151], discloses that the resist composition includes a surfactant (claim 15). Masunaga, in [0037], discloses that the resist composition can include polymer with the following recurring units , see below PNG media_image2.png 190 283 media_image2.png Greyscale and is the same as the claimed formula (a1), PNG media_image3.png 202 319 media_image3.png Greyscale and is the same as the claimed (a2) (claims 9-10). Masunaga, in [0030], discloses that the resin includes recurring unit, see below, PNG media_image4.png 235 334 media_image4.png Greyscale and is the same as the claimed formula (b2) (claim 11). Masunaga, in [0035], discloses that the resin in the composition also includes the following recurring units, see below, PNG media_image5.png 157 233 media_image5.png Greyscale wherein R13 includes the same structure recited for Z1 and Z2 (see [0111]-[0112]) (claim 12). Masunaga, in [0040]-[0042], discloses that the resist composition is applied to a substrate to forma resist film and exposed to high-energy radiation such as EUV or EB, and the exposed resist is developed in a developer to form a resist pattern (claims 16-17). Claim(s) 1-5, is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by WO 2022/037680 and using its English Translation Equivalent U.S. Patent Application Publication No. 2024/0294554 (hereinafter referred to as Qin). Qin, in [0056]-[0057], discloses a composition comprising a salt, wherein the salt comprises the same claimed carboxylate anion, and illustrates the salt structure on page 15, right column, last structure, see below, PNG media_image6.png 197 478 media_image6.png Greyscale , and on page 49, Qin discloses the carboxylic acid anion of the salt, as seen below, PNG media_image7.png 184 489 media_image7.png Greyscale in a salt solution (see [0069]) that includes hydronium cations (H3O+) in it, and is the same claimed structure recited as the onium salt (claims 1-5). Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to Daborah Chacko-Davis whose telephone number is (571) 272-1380. The examiner can normally be reached on 9:30AM-6:00PM EST Mon-Fri. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Sally A. Merkling can be reached on (571) 272-6297. The fax phone number for the organization where this application or proceeding is assigned is 571-272-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /DABORAH CHACKO-DAVIS/Primary Examiner, Art Unit 1737 September 28, 2026.
Read full office action

Prosecution Timeline

Feb 08, 2024
Application Filed
Oct 01, 2026
Non-Final Rejection mailed — §102 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12772809
METHOD FOR FABRICATING MASK
4y 4m to grant Granted Oct 20, 2026
Patent 12769199
PHOTOMASK AND CORRECTING METHOD FOR EXPOSING APPARATUS USING PHOTOMASK
4y 2m to grant Granted Oct 20, 2026
Patent 12754479
EUV RESIST UNDERLAYER FILM-FORMING COMPOSITION
3y 9m to grant Granted Oct 06, 2026
Patent 12736881
PROVIDING A BARRIER LAYER FOR PHOTORESIST PROCESSING
4y 1m to grant Granted Sep 15, 2026
Patent 12730374
PHOTOACID GENERATOR, AND PHOTOSENSITIVE COMPOSITION USING SAME
3y 3m to grant Granted Sep 08, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

Strategy Recommendation AI-generated — please review before filing

Get a prosecution strategy drawn from examiner precedents, rejection analysis, and claim mapping.
Typically takes 5-10 seconds — AI-generated, attorney review required before filing

Prosecution Projections

1-2
Expected OA Rounds
72%
Grant Probability
92%
With Interview (+20.4%)
3y 4m (~8m remaining)
Median Time to Grant
Low
PTA Risk
Based on 997 resolved cases by this examiner. Grant probability derived from career allowance rate.

Sign in with your work email

Enter your email to receive a magic link. No password needed.

Personal email addresses (Gmail, Yahoo, etc.) are not accepted.

Free tier: 3 strategy analyses per month