Prosecution Insights
Last updated: October 01, 2026
Application No. 18/441,824

STRESS INCORPORATION IN SEMICONDUCTOR DEVICES

Non-Final OA §112
Filed
Feb 14, 2024
Priority
Feb 28, 2023 — provisional 63/487,501
Examiner
PHAM, LONG
Art Unit
2897
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Applied Materials Inc.
OA Round
1 (Non-Final)
92%
Grant Probability
Favorable
1-2
OA Rounds
0m
Est. Remaining
97%
With Interview

Examiner Intelligence

Grants 92% — above average
92%
Career Allowance Rate
1530 granted / 1671 resolved
+23.6% vs TC avg
Moderate +6% lift
Without
With
+5.5%
Interview Lift
resolved cases with interview
Typical timeline
2y 4m
Avg Prosecution
42 currently pending
Career history
1697
Total Applications
across all art units

Statute-Specific Performance

§101
0.1%
-39.9% vs TC avg
§103
42.7%
+2.7% vs TC avg
§102
39.7%
-0.3% vs TC avg
§112
10.3%
-29.7% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1671 resolved cases

Office Action

§112
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Election/Restrictions Applicant’s election without traverse of claims 1-15 in the reply filed on 6/8/26 is acknowledged. Claim 15 was inadvertently included in the device or structure invention in the restriction requirement, however claim 15 is a processing system which involves a series of processing steps, it should have been included in the process invention, since applicant has elected the device invention to be examined, the claim 15 has been withdrawn from consideration. Claim Rejections - 35 USC § 112 The following is a quotation of 35 U.S.C. 112(b): (b) CONCLUSION.—The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the inventor or a joint inventor regards as the invention. The following is a quotation of 35 U.S.C. 112 (pre-AIA ), second paragraph: The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the applicant regards as his invention. Claim 1 recites the limitation "the source" in line 5. There is insufficient antecedent basis for this limitation in the claim. Claim 1 recites the limitation "the drain" in lines 5 and 6. There is insufficient antecedent basis for this limitation in the claim. Claim 1 recites the limitation "the channel" in line 11. There is insufficient antecedent basis for this limitation in the claim. Claims 1-14 are rejected under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor (or for applications subject to pre-AIA 35 U.S.C. 112, the applicant), regards as the invention. In claim 1, line 7, it is unclear where and how the first gate region is formed because it is unclear where and how the p-MOS region is formed, thus claim is indefinite. In claim 1, line 11, it is unclear where and how the second gate region is formed because it is unclear where and how the n-MOS region is formed, thus claim is indefinite. In claim 1, lines 11-12, it is unclear the first gate is formed to enclose the channel while the channel is being located between the source and drain regions, thus claim is indefinite (as shown in fig. 4 of specification, the channel portion 326 is between source/drain regions 304, but the gate 306 is not enclosing it, the channel portion 316 is enclosed by the gate but not between the source/drain regions) In claim 6, line 2, it is unclear how the horizontally extending channels are formed, thus claim is indefinite. Examiner’s Cited References The cited references generally show the similar or related structure having a gate structure having a first gate region in PMOS region and a second gate region in NMOS region, the first gate region having a diffusion break of stressed dielectric and the second gate region having a gate enclosing a channel between source/drain as presently claimed by applicant. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to LONG PHAM whose telephone number is (571)272-1714. The examiner can normally be reached Mon-Friday. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Jacob Choi can be reached at 469-295-9060. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. LONG . PHAM Examiner Art Unit 2823 /LONG PHAM/Primary Examiner, Art Unit 2897
Read full office action

Prosecution Timeline

Feb 14, 2024
Application Filed
Aug 10, 2026
Non-Final Rejection mailed — §112
Sep 08, 2026
Applicant Interview (Telephonic)
Sep 08, 2026
Examiner Interview Summary

Precedent Cases

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
92%
Grant Probability
97%
With Interview (+5.5%)
2y 4m (~0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1671 resolved cases by this examiner. Grant probability derived from career allowance rate.

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