Prosecution Insights
Last updated: April 19, 2026
Application No. 18/478,771

ELECTRON-OPTICAL SYSTEM AND METHOD OF OPERATING AN ELECTRON-OPTICAL SYSTEM

Non-Final OA §102
Filed
Sep 29, 2023
Examiner
VANORE, DAVID A
Art Unit
2878
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
ASML Netherlands B.V.
OA Round
1 (Non-Final)
89%
Grant Probability
Favorable
1-2
OA Rounds
2y 0m
To Grant
96%
With Interview

Examiner Intelligence

Grants 89% — above average
89%
Career Allow Rate
1099 granted / 1239 resolved
+20.7% vs TC avg
Moderate +8% lift
Without
With
+7.5%
Interview Lift
resolved cases with interview
Fast prosecutor
2y 0m
Avg Prosecution
33 currently pending
Career history
1272
Total Applications
across all art units

Statute-Specific Performance

§101
12.5%
-27.5% vs TC avg
§103
10.6%
-29.4% vs TC avg
§102
29.4%
-10.6% vs TC avg
§112
33.7%
-6.3% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1239 resolved cases

Office Action

§102
Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Priority Acknowledgment is made of applicant's claim for foreign priority based on an application filed in the EU (EP21166211.9) on March 31st, 2021. It is noted, however, that applicant has not filed a certified copy of the European application as required by 37 CFR 1.55. Information Disclosure Statement The information disclosure statement (IDS) submitted on September 29th, 2023 has been considered by the examiner. Drawings Figure 1-6 should be designated by a legend such as --Prior Art-- because only that which is old is illustrated. See MPEP § 608.02(g). Corrected drawings in compliance with 37 CFR 1.121(d) are required in reply to the Office action to avoid abandonment of the application. The replacement sheet(s) should be labeled “Replacement Sheet” in the page header (as per 37 CFR 1.84(c)) so as not to obstruct any portion of the drawing figures. If the changes are not accepted by the examiner, the applicant will be notified and informed of any required corrective action in the next Office action. The objection to the drawings will not be held in abeyance. Claim Rejections - 35 USC § 102 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 19-20 are is/are rejected under 35 U.S.C. 102(a)(1) as being clearly anticipated by USPN 9,368,319. Regarding claim 19, ‘319 discloses a method where electrons are projected towards a sample using an objective lens [20], moving a sample stage while energizing the sample collector to draw particles away from a sample and/or stage as the sample moves [44-46]: PNG media_image1.png 242 628 media_image1.png Greyscale Note the above portion of the disclosure from [44-46] indicating the moving and collecting simultaneously. Regarding claim 20, taken with the teaching of ‘319 above regarding collection and sample movement, ‘319 teaches an electron beam system comprising an electro optical system including an objective lens (106) projecting a beam (103) towards a sample surface (109): PNG media_image2.png 700 628 media_image2.png Greyscale ‘319 also discloses an electrode assembly (702) for collecting particles mounted radially and outside the objective lens and facing the sample. PNG media_image3.png 326 582 media_image3.png Greyscale As noted above with respect to claim 19, the function of sample movement and the drawing of particles away from a sample/stage/chamber interior is disclosed in ‘319. Allowable Subject Matter Claims 1-18 are allowed. The following is an examiner’s statement of reasons for allowance: Claim 1 recites in addition to the other elements of the claim: PNG media_image4.png 156 630 media_image4.png Greyscale This particular configuration requiring the particle trap electrode be both radial and outside the objective lens and that the objective lens be position between the particle trap and the electron beam path and where the claimed control system drives the electrode assembly to generate an electric field between a “sample facing electrode” of the electrode assembly. Item 702 above is a singular electrode, not an assembly, and while facing the sample in the embodiment in Fig. 9, fails to satisfy the position requirement of the portion of the claim cited above. Therefore, it appears the apparatus of claim 1 defines over the prior art and claims 2-18 are indicated as being allowable by at least virtue of their dependency. Any comments considered necessary by applicant must be submitted no later than the payment of the issue fee and, to avoid processing delays, should preferably accompany the issue fee. Such submissions should be clearly labeled “Comments on Statement of Reasons for Allowance.” Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to DAVID A VANORE whose telephone number is (571)272-2483. The examiner can normally be reached Monday to Friday 7AM to 6 PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Robert Kim can be reached at 571-272-2293. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /DAVID A VANORE/ Primary Examiner, Art Unit 2881
Read full office action

Prosecution Timeline

Sep 29, 2023
Application Filed
Jan 12, 2026
Non-Final Rejection — §102 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12592357
SYSTEM AND METHOD FOR MULTI-BEAM ELECTRON MICROSCOPY USING A DETECTOR ARRAY
2y 5m to grant Granted Mar 31, 2026
Patent 12592465
A BROADBAND MICROWAVE WINDOW ASSEMBLY
2y 5m to grant Granted Mar 31, 2026
Patent 12586751
Transfer Device and Analysis System
2y 5m to grant Granted Mar 24, 2026
Patent 12586755
APPARATUS FOR ANALYZING AND/OR PROCESSING A SAMPLE WITH A PARTICLE BEAM AND METHOD
2y 5m to grant Granted Mar 24, 2026
Patent 12571780
DATA PROCESSING DEVICE FOR CHROMATOGRAPH, DATA PROCESSING METHOD, AND CHROMATOGRAPH
2y 5m to grant Granted Mar 10, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
89%
Grant Probability
96%
With Interview (+7.5%)
2y 0m
Median Time to Grant
Low
PTA Risk
Based on 1239 resolved cases by this examiner. Grant probability derived from career allow rate.

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