Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2855 2878 2881
This examiner grants 89% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18905665 | SCANNING ELECTRON MICROSCOPE (SEM) IMAGE IMPROVING METHOD | Non-Final OA | SAMSUNG ELECTRONICS CO, LTD. |
| 18806211 | SPECIMEN IMAGING SYSTEMS AND METHODS | Non-Final OA | Georgia Tech Research Corporation |
| 18771126 | CHARGED PARTICLE BEAM DEVICE | Non-Final OA | Hitachi High-Tech Corporation |
| 18270937 | Charged Particle Beam Device | Non-Final OA | Hitachi High-Tech Corporation |
| 18769008 | THERMALLY OPTIMIZED EXTRACTION PLATE FOR ION IMPLANTER | Non-Final OA | Applied Materials, Inc. |
| 18758615 | TRANSMISSION ELECTRON MICROSCOPE AND SAMPLE ANALYSIS METHOD USING TRANSMISSION ELECTRON MICROSCOPE | Non-Final OA | Kioxia Corporation |
| 18754126 | METHOD AND SYSTEM FOR 3D RECONSTRUCTION OF WAFER STRUCTURE BY DIAGONAL MILLING | Non-Final OA | Applied Materials Israel Ltd. |
| 18678180 | SUPPORT STRUCTURE FOR CHARGED PARTICLE BEAM TARGET | Non-Final OA | TAE Technologies, Inc. |
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