Prosecution Insights
Last updated: May 29, 2026
Application No. 18/518,759

PROBE HEAD AND METHOD OF PRODUCING TESTED SEMICONDUCTOR DIE AND VERTICAL PROBE MANUFACTURING METHOD

Non-Final OA
Filed
Nov 24, 2023
Priority
Nov 24, 2022 — TW 111145056
Examiner
BARRON, JEREMIAH JOHN
Art Unit
2858
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Mpi Corporation
OA Round
2 (Non-Final)
78%
Grant Probability
Favorable
2-3
OA Rounds
0m
Est. Remaining
80%
With Interview

Examiner Intelligence

Grants 78% — above average
78%
Career Allowance Rate
18 granted / 23 resolved
+10.3% vs TC avg
Minimal +2% lift
Without
With
+2.2%
Interview Lift
resolved cases with interview
Typical timeline
2y 6m
Avg Prosecution
17 currently pending
Career history
57
Total Applications
across all art units

Statute-Specific Performance

§101
0.9%
-39.1% vs TC avg
§103
86.6%
+46.6% vs TC avg
§102
1.8%
-38.2% vs TC avg
§112
8.9%
-31.1% vs TC avg
Black line = Tech Center average estimate • Based on career data from 23 resolved cases

Prosecution Timeline

Nov 24, 2023
Application Filed
Sep 12, 2025
Non-Final Rejection mailed
Dec 08, 2025
Response Filed
Jan 29, 2026
Final Rejection mailed
Mar 30, 2026
Response after Non-Final Action
Apr 27, 2026
Request for Continued Examination
Apr 30, 2026
Response after Non-Final Action

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12631670
Current Sensing Device
2y 9m to grant Granted May 19, 2026
Patent 12620992
CAPACITIVE SENSOR WITH OPTIMIZED NOISE IMMUNITY
2y 9m to grant Granted May 05, 2026
Patent 12601758
Socketed Probes
2y 9m to grant Granted Apr 14, 2026
Patent 12601782
PROBE CARD HOLDER FOR WAFER TESTING
2y 3m to grant Granted Apr 14, 2026
Patent 12601773
DETECTION CIRCUIT AND RELATED ELECTRONIC APPARATUS
2y 7m to grant Granted Apr 14, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

2-3
Expected OA Rounds
78%
Grant Probability
80%
With Interview (+2.2%)
2y 6m (~0m remaining)
Median Time to Grant
Moderate
PTA Risk
Based on 23 resolved cases by this examiner. Grant probability derived from career allowance rate.

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