Prosecution Insights
Prosecution Insights
4 pending office actions • 2 art units • 4 examiners • 0 of 4 (0%) have an AI response strategy ready • 3 patents granted in the last 365 days
Based on the USPTO statutory response window for each pending office action. 4 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.
Every pending office action with a known statutory deadline, placed on a days-until-due axis. Dots left of Today are overdue; the further right, the more runway. Cases that share a deadline window stack vertically. 4 of the docket's apps have a known mailing date.
Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.
| Bucket | Cases |
|---|---|
| §101 only | 1 (25%) |
| §103 only | 2 (50%) |
| No statute on record | 1 (25%) |
How the docket's pending cases split across USPTO tech-center bands.
Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.
| Examiner | Apps on this docket | Allow rate | Interview lift |
|---|---|---|---|
| ASTACIO-OQUENDO, GIOVANNI | 1 | 88.4% | +10.4% |
| HOLLINGTON, JERMELE M | 1 | 86.1% | -15.7% |
| BARRON, JEREMIAH JOHN | 1 | 78.3% | +2.2% |
| ALEXANDER, EMMA LYNNE | 1 | 63.6% | +13.9% |
Cases in front of an examiner with an allow rate of 80%+ where the difficulty is Easy or Medium. The top 1 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18637836 | MEMBRANE PROBE CARD, METHOD OF MAKING THE SAME AND METHOD OF MAKING TESTED SEMICONDUCTOR CHIP BY USING THE SAME | HOLLINGTON, JERMELE M | 8d overdue |
Multi-statute / §101-driven matters, or cases in front of an examiner with an allow rate under 30%. The top 1 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18781351 | METHOD OF DETERMINING PROBING PARAMETERS FOR PROBE SYSTEM TO TEST DEVICE UNDER TEST, PROBE SYSTEM AND METHOD OF OPERATING THE SAME, NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIA, METHOD OF TESTING UNPACKAGED SEMICONDUCTOR DEVICE, TESTED SEMICONDUCTOR DEVICE AND METHOD OF PRODUCING THE SAME, AND METHOD OF GENERATING VIRTUAL MARK IMAGE | ASTACIO-OQUENDO, GIOVANNI | 14d |
Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 2 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18781351 | METHOD OF DETERMINING PROBING PARAMETERS FOR PROBE SYSTEM TO TEST DEVICE UNDER TEST, PROBE SYSTEM AND METHOD OF OPERATING THE SAME, NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIA, METHOD OF TESTING UNPACKAGED SEMICONDUCTOR DEVICE, TESTED SEMICONDUCTOR DEVICE AND METHOD OF PRODUCING THE SAME, AND METHOD OF GENERATING VIRTUAL MARK IMAGE | ASTACIO-OQUENDO, GIOVANNI | 14d |
| 18327021 | TEST SYSTEM AND METHOD FOR DATA VERIFICATION FOR THE SAME | ALEXANDER, EMMA LYNNE | 14d |
| Art Unit | Apps |
|---|---|
| 2858 | 3 |
| 2857 | 1 |
| App # | Title | Examiner | Art Unit | Statutes | Status | Due in | AI | Filed |
|---|---|---|---|---|---|---|---|---|
| 18781351 | METHOD OF DETERMINING PROBING PARAMETERS FOR PROBE SYSTEM TO TEST DEVICE UNDER TEST, PROBE SYSTEM AND METHOD OF OPERATING THE SAME, NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIA, METHOD OF TESTING UNPACKAGED SEMICONDUCTOR DEVICE, TESTED SEMICONDUCTOR DEVICE AND METHOD OF PRODUCING THE SAME, AND METHOD OF GENERATING VIRTUAL MARK IMAGE | ASTACIO-OQUENDO, GIOVANNI | 2858 | §101 | Non-Final OA | 14d | Pending | Jul 23, 2024 |
| 18637836 | MEMBRANE PROBE CARD, METHOD OF MAKING THE SAME AND METHOD OF MAKING TESTED SEMICONDUCTOR CHIP BY USING THE SAME | HOLLINGTON, JERMELE M | 2858 | §103 | Non-Final OA | 8d overdue | Pending | Apr 17, 2024 |
| 18518759 | PROBE HEAD AND METHOD OF PRODUCING TESTED SEMICONDUCTOR DIE AND VERTICAL PROBE MANUFACTURING METHOD | BARRON, JEREMIAH JOHN | 2858 | — | Non-Final OA | 167d overdue | Pending | Nov 24, 2023 |
| 18327021 | TEST SYSTEM AND METHOD FOR DATA VERIFICATION FOR THE SAME | ALEXANDER, EMMA LYNNE | 2857 | §103 | Final Rejection | 14d | Pending | May 31, 2023 |
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