5 pending office actions
| App # | Title | Examiner | Art Unit | Status | Filed |
|---|---|---|---|---|---|
| 18781351 | METHOD OF DETERMINING PROBING PARAMETERS FOR PROBE SYSTEM TO TEST DEVICE UNDER TEST, PROBE SYSTEM AND METHOD OF OPERATING THE SAME, NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIA, METHOD OF TESTING UNPACKAGED SEMICONDUCTOR DEVICE, TESTED SEMICONDUCTOR DEVICE AND METHOD OF PRODUCING THE SAME, AND METHOD OF GENERATING VIRTUAL MARK IMAGE | ASTACIO-OQUENDO, GIOVANNI | 2858 | Non-Final OA | Jul 23, 2024 |
| 18637836 | MEMBRANE PROBE CARD, METHOD OF MAKING THE SAME AND METHOD OF MAKING TESTED SEMICONDUCTOR CHIP BY USING THE SAME | HOLLINGTON, JERMELE M | 2858 | Non-Final OA | Apr 17, 2024 |
| 18635405 | ADHERED MULTILAYER DIE UNIT AND PROBE HEAD, PROBE SEAT, PROBE CARD AND TEST SYSTEM INCLUDING THE SAME | NGUYEN, VINH P | 2858 | Non-Final OA | Apr 15, 2024 |
| 18402824 | POSITIONING METHOD AND PROBE SYSTEM FOR PERFORMING THE SAME, METHOD FOR OPERATING PROBE SYSTEM, AND METHOD FOR UTILIZING PROBE SYSTEM TO PRODUCE A TESTED SEMICONDUCTOR DEVICE | ISLA, RICHARD | 2858 | Final Rejection | Jan 03, 2024 |
| 18327021 | TEST SYSTEM AND METHOD FOR DATA VERIFICATION FOR THE SAME | ALEXANDER, EMMA LYNNE | 2857 | Final Rejection | May 31, 2023 |
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