Prosecution Insights
Prosecution Insights
Technology area: Semiconductors, Circuits & Optics
8 pending office actions • 1 art units • 6 examiners • 0 of 8 (0%) have an AI response strategy ready • 5 patents granted in the last 365 days
MPI Corporation has 8 pending office actions in the Semiconductors, Circuits & Optics technology area. These actions are distributed among 6 distinct examiners, all of whom are located within 1 distinct art unit. This indicates a high concentration of the company's technical matters within a single department despite the involvement of multiple individuals. The focus on a single art unit suggests that the company's semiconductor innovations are technically similar enough to be grouped together by the patent office.
Akm Zakaria is the busiest examiner for the portfolio, managing 3 pending office actions. The remaining actions are split among the other examiners. With 8 actions in only 1 art unit, the company can expect a consistent application of technical standards and prior art across its entire pending portfolio. This structure allows for a more centralized prosecution strategy even with 6 different examiners involved. Practitioners should leverage the consistency of the art unit while addressing the specific preferences of Akm Zakaria, who handles 3 pending matters, and the other examiners.
Based on the USPTO statutory response window for each pending office action. 1 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.
Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.
| Bucket | Cases |
|---|---|
| §101 + other | 1 (12%) |
| §103 only | 1 (12%) |
| §102 only | 2 (25%) |
| Multi-statute (no §101) | 4 (50%) |
How the docket's pending cases split across USPTO tech-center bands.
Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.
| Examiner | Apps on this docket | Allow rate | Interview lift |
|---|---|---|---|
| ZAKARIA, AKM | 3 | 82.6% | +16.1% |
| PATEL, PARESH H | 1 | 79.5% | -1.1% |
| REISNER, NOAM S | 1 | 74.1% | -8.7% |
| ISLA, RICHARD | 1 | 77.3% | +15.3% |
| POTHEN, FEBA | 1 | 81.1% | +11.2% |
| BARRON, JEREMIAH JOHN | 1 | 78.8% | +4.5% |
Cases in front of an examiner with an allow rate of 80%+ where the difficulty is Easy or Medium. The top 1 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18762988 | WAFER PROBE STATION AND METHOD FOR ESTABLISHING AN EVALUATION MODEL FOR CALIBRATION OF A PROBE ASSEMBLY | POTHEN, FEBA | — |
Multi-statute / §101-driven matters, or cases in front of an examiner with an allow rate under 30%. The top 5 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18938623 | PROBE SYSTEM FOR DOUBLE SIDE PROBING, METHOD OF OPERATING THE SAME AND TESTED DEVICE | REISNER, NOAM S | — |
| 18934482 | PROBE CARD AND METHOD FOR DESIGN PROBE CARD AND MEASURING METHOD AND SYSTEM FOR DETECTING DEVICE UNDER TEST USING THE PROBE CARD | ZAKARIA, AKM | — |
| 18932728 | PROBE CARD, PROBE HEAD, METHOD FOR MANUFACTURING THE PROBE HEAD, AND ELECTRONIC DEVICE UNDER TEST TESTED BY THE PROBE CARD | ZAKARIA, AKM | — |
| 18932714 | PROBE SYSTEM, PROBE CARD, PROBE HEAD, AND PROBE FOR TESTING ELECTRONIC DEVICE UNDER TEST INTEGRATED ON A SEMICONDUCTOR WAFER, AND ELECTRONIC DEVICE UNDER TEST TESTED BY THE PROBE CARD | ZAKARIA, AKM | — |
| 18820228 | MULTIPORT RF CALIBRATION USING PEER-TERMINATED STANDARDS | ISLA, RICHARD | — |
Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 5 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18934482 | PROBE CARD AND METHOD FOR DESIGN PROBE CARD AND MEASURING METHOD AND SYSTEM FOR DETECTING DEVICE UNDER TEST USING THE PROBE CARD | ZAKARIA, AKM | — |
| 18932728 | PROBE CARD, PROBE HEAD, METHOD FOR MANUFACTURING THE PROBE HEAD, AND ELECTRONIC DEVICE UNDER TEST TESTED BY THE PROBE CARD | ZAKARIA, AKM | — |
| 18932714 | PROBE SYSTEM, PROBE CARD, PROBE HEAD, AND PROBE FOR TESTING ELECTRONIC DEVICE UNDER TEST INTEGRATED ON A SEMICONDUCTOR WAFER, AND ELECTRONIC DEVICE UNDER TEST TESTED BY THE PROBE CARD | ZAKARIA, AKM | — |
| 18820228 | MULTIPORT RF CALIBRATION USING PEER-TERMINATED STANDARDS | ISLA, RICHARD | — |
| 18762988 | WAFER PROBE STATION AND METHOD FOR ESTABLISHING AN EVALUATION MODEL FOR CALIBRATION OF A PROBE ASSEMBLY | POTHEN, FEBA | — |
| Art Unit | Apps |
|---|---|
| 2858 | 3 |
| App # | Title | Examiner | Art Unit | Statutes | Status | Due in | AI | Filed |
|---|---|---|---|---|---|---|---|---|
| 18973444 | PROBE SYSTEM AND MACHINE APPARATUS THEREOF | PATEL, PARESH H | — | §102Other | Non-Final OA | — | Pending | Dec 09, 2024 |
| 18938623 | PROBE SYSTEM FOR DOUBLE SIDE PROBING, METHOD OF OPERATING THE SAME AND TESTED DEVICE | REISNER, NOAM S | — | §102§103 | Non-Final OA | — | Pending | Nov 06, 2024 |
| 18934482 | PROBE CARD AND METHOD FOR DESIGN PROBE CARD AND MEASURING METHOD AND SYSTEM FOR DETECTING DEVICE UNDER TEST USING THE PROBE CARD | ZAKARIA, AKM | — | §102§103§112 | Non-Final OA | — | Pending | Nov 01, 2024 |
| 18932728 | PROBE CARD, PROBE HEAD, METHOD FOR MANUFACTURING THE PROBE HEAD, AND ELECTRONIC DEVICE UNDER TEST TESTED BY THE PROBE CARD | ZAKARIA, AKM | — | §102§103§112 | Non-Final OA | — | Pending | Oct 31, 2024 |
| 18932714 | PROBE SYSTEM, PROBE CARD, PROBE HEAD, AND PROBE FOR TESTING ELECTRONIC DEVICE UNDER TEST INTEGRATED ON A SEMICONDUCTOR WAFER, AND ELECTRONIC DEVICE UNDER TEST TESTED BY THE PROBE CARD | ZAKARIA, AKM | — | §102§103 | Non-Final OA | — | Pending | Oct 31, 2024 |
| 18820228 | MULTIPORT RF CALIBRATION USING PEER-TERMINATED STANDARDS | ISLA, RICHARD | 2858 | §101§102§112 | Final Rejection | — | Pending | Aug 29, 2024 |
| 18762988 | WAFER PROBE STATION AND METHOD FOR ESTABLISHING AN EVALUATION MODEL FOR CALIBRATION OF A PROBE ASSEMBLY | POTHEN, FEBA | 2858 | §102 | Non-Final OA | — | Pending | Jul 03, 2024 |
| 18518759 | PROBE HEAD AND METHOD OF PRODUCING TESTED SEMICONDUCTOR DIE AND VERTICAL PROBE MANUFACTURING METHOD | BARRON, JEREMIAH JOHN | 2858 | §103 | Non-Final OA | 167d overdue | Pending | Nov 24, 2023 |
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