Prosecution Insights
Last updated: May 29, 2026

Examiner: BARRON, JEREMIAH JOHN

Tech Center 2800 • Art Units: 2858

This examiner grants 78% of resolved cases

Performance Statistics

78.3%
Allow Rate
+10.3% vs TC avg
57
Total Applications
+2.2%
Interview Lift
925
Avg Prosecution Days
Based on 23 resolved cases, 2023–2026

Rejection Statute Breakdown

0.9%
§101 Eligibility
1.8%
§102 Novelty
86.6%
§103 Obviousness
8.9%
§112 Clarity

Currently Pending Office Actions

App #TitleStatusAssignee
18680695 GROUND FAULT DETECTION TECHNIQUES IN MOBILE MACHINES Non-Final OA Caterpillar Inc.
18320022 PROGRAMMABLE SENSOR Non-Final OA Cypress Semiconductor Corporation
18535092 Current Sensor Non-Final OA Alps Alpine Co., Ltd.
18503840 PROBE CARD TRANSPORTING APPARATUS AND METHOD Final Rejection SEMES CO., LTD.
18590482 METHOD AND MEASUREMENT SYSTEM OF DETERMINING A QUALITY METRIC FOR A DEVICE UNDER TEST HAVING MULTIPLE TRANSMISSION ANTENNAS Non-Final OA Rohde & Schwarz GmbH & Co. KG
18487123 SWITCHING DEVICE Final Rejection OMRON Corporation
18518759 PROBE HEAD AND METHOD OF PRODUCING TESTED SEMICONDUCTOR DIE AND VERTICAL PROBE MANUFACTURING METHOD Non-Final OA MPI CORPORATION
18492987 VARIABLE MAGNETIC COUPLING TOUCH SENSORS Final Rejection Allegro MicroSystems, LLC
18254271 ELECTRICAL DEVICE, INVERTER, ELECTRIC DRIVE, VEHICLE AND MANUFACTURING METHODS Non-Final OA Valeo eAutomotive Germany GmbH
18711958 METHOD AND APPARATUS FOR DETECTING INSULATION IMPEDANCE OF DIRECT CURRENT SIDE OF PHOTOVOLTAIC INVERTER Non-Final OA HOYMILES POWER ELECTRONICS INC.
18711669 APPARATUS TO ENAMEL RATE SELECTED REGIONS OF METAL OBJECTS Non-Final OA INNOSEN LIMITED
18532172 Testing Assisting Device And Method Of Providing A Testing Assisting Device Non-Final OA NKT HV Cables AB
18578196 Apparatus, System and Method for Repairing a Test Contact Arrangement Final Rejection PAC TECH - PACKAGING TECHNOLOGIES GMBH
18402668 SOCKET DEVICE FOR TESTING ICs Final Rejection Jae Baek HWANG
18393548 SOCKET SYSTEMS WITH INTEGRATED PARTIALLY-CONDUCTIVE SUBSTRATES AND METHODS OF USING THE SAME Final Rejection Chiplytics Inc.
18541001 PROBE CARD STRUCTURE FOR HIGH FREQUENCY TEST AND TESTING METHOD THEREOF Non-Final OA STAR TECHNOLOGIES, INC.
18522398 PROBE CARD STRUCTURE Final Rejection teCat Technologies (Suzhou) Limited

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