Tech Center 2800 • Art Units: 2858
This examiner grants 78% of resolved cases
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18320022 | PROGRAMMABLE SENSOR | Non-Final OA | Cypress Semiconductor Corporation |
| 18089411 | ENHANCED STATIC-DYNAMIC STRESS TECHNIQUES TO ACCELERATE LATENT DEFECTS FOR INTEGRATED CIRCUITS | Non-Final OA | Intel Corporation |
| 18536477 | Current Measurement Device And Current Sensor | Final Rejection | Alps Alpine Co., Ltd. |
| 18535092 | Current Sensor | Non-Final OA | Alps Alpine Co., Ltd. |
| 18680695 | GROUND FAULT DETECTION TECHNIQUES IN MOBILE MACHINES | Non-Final OA | Caterpillar Inc. |
| 18377547 | CURRENT AND POWER SENSOR FOR MULTI-WIRE CABLES | Final Rejection | TotalEnergies OneTech |
| 18503840 | PROBE CARD TRANSPORTING APPARATUS AND METHOD | Final Rejection | SEMES CO., LTD. |
| 18590482 | METHOD AND MEASUREMENT SYSTEM OF DETERMINING A QUALITY METRIC FOR A DEVICE UNDER TEST HAVING MULTIPLE TRANSMISSION ANTENNAS | Non-Final OA | Rohde & Schwarz GmbH & Co. KG |
| 18487123 | SWITCHING DEVICE | Final Rejection | OMRON Corporation |
| 18292379 | ANISOTROPIC ELECTROCONDUCTIVE SHEET, METHOD FOR PRODUCING SAME, ELECTRICAL INSPECTION DEVICE, AND ELECTRICAL INSPECTION METHOD | Non-Final OA | MITSUI CHEMICALS, INC. |
| 18578963 | PROBE PIN AND PROBE CARD | Non-Final OA | JAPAN ELECTRONIC MATERIALS CORPORATION |
| 18492987 | VARIABLE MAGNETIC COUPLING TOUCH SENSORS | Final Rejection | Allegro MicroSystems, LLC |
| 18711958 | METHOD AND APPARATUS FOR DETECTING INSULATION IMPEDANCE OF DIRECT CURRENT SIDE OF PHOTOVOLTAIC INVERTER | Non-Final OA | HOYMILES POWER ELECTRONICS INC. |
| 18711669 | APPARATUS TO ENAMEL RATE SELECTED REGIONS OF METAL OBJECTS | Non-Final OA | INNOSEN LIMITED |
| 18532172 | Testing Assisting Device And Method Of Providing A Testing Assisting Device | Non-Final OA | NKT HV Cables AB |
| 18578196 | Apparatus, System and Method for Repairing a Test Contact Arrangement | Final Rejection | PAC TECH - PACKAGING TECHNOLOGIES GMBH |
| 18402668 | SOCKET DEVICE FOR TESTING ICs | Final Rejection | Jae Baek HWANG |
| 18393548 | SOCKET SYSTEMS WITH INTEGRATED PARTIALLY-CONDUCTIVE SUBSTRATES AND METHODS OF USING THE SAME | Final Rejection | Chiplytics Inc. |
| 18570966 | PROBE HEAD WITH REPLACEABLE PROBE BOARD | Final Rejection | Xallent Inc. |
| 18541001 | PROBE CARD STRUCTURE FOR HIGH FREQUENCY TEST AND TESTING METHOD THEREOF | Non-Final OA | STAR TECHNOLOGIES, INC. |
| 18522398 | PROBE CARD STRUCTURE | Final Rejection | teCat Technologies (Suzhou) Limited |
| 18220328 | CONTACT PIN AND SOCKET FOR INSPECTION | Non-Final OA | Yamaichi Electronics Co., Ltd. |
| 18554890 | CURRENT SPECIFYING DEVICE | Final Rejection | Traffic Sim Co.,Ltd. |
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