Prosecution Insights
Last updated: July 17, 2026
Application No. 18/568,071

RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN

Non-Final OA §102
Filed
Dec 07, 2023
Priority
Jun 15, 2021 — JP 2021-099658 +4 more
Examiner
FRASER, STEWART A
Art Unit
Tech Center
Assignee
Tokyo Ohka Kogyo Co., Ltd.
OA Round
1 (Non-Final)
86%
Grant Probability
Favorable
1-2
OA Rounds
0m
Est. Remaining
99%
With Interview

Examiner Intelligence

Grants 86% — above average
86%
Career Allowance Rate
1164 granted / 1352 resolved
+26.1% vs TC avg
Moderate +14% lift
Without
With
+14.2%
Interview Lift
resolved cases with interview
Typical timeline
2y 5m
Avg Prosecution
26 currently pending
Career history
1368
Total Applications
across all art units

Statute-Specific Performance

§101
0.4%
-39.6% vs TC avg
§103
77.7%
+37.7% vs TC avg
§102
11.7%
-28.3% vs TC avg
§112
4.2%
-35.8% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1352 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . This is the initial office action for US Patent Application No. 18/568071 by Ishii et al. Claims 1-12 are currently pending and have been fully considered. Priority Receipt is acknowledged of certified copies of papers required by 37 CFR 1.55. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claims 1-3 and 12 are rejected under 35 U.S.C. 102 (a)(1) as being anticipated by Hatakeyama et al. (US 2021/0116808 A1), herein referred to as Hatakeyama. Regarding claims 1-3, Hatakeyama teaches [0174] a positive resist composition comprising a base polymer (resin component) and a PAG monomer (acid generator component. The base polymer includes an ALG monomer (ALG Monomer 5, page 104) that has the following chemical structure: PNG media_image1.png 200 370 media_image1.png Greyscale The PAG monomer (PAG monomer 3, page 103) includes the following chemical structure: PNG media_image2.png 200 296 media_image2.png Greyscale The ALG monomer and PAG monomer compositions taught by Hatakeyama satisfy the chemical composition limitations recited in claims 1-3 and therefore. claims 1-3 are anticipated by Hatakeyama. Regarding claim 12, Hatakeyama teaches [0021] a process for forming a pattern comprising the steps of applying the positive resist composition defined above onto a substrate to form a resist film thereon, exposing the resist film to high-energy radiation, and developing the exposed resist film in a developer. Allowable Subject Matter The following is a statement of reasons for the indication of allowable subject matter: Claims 4-11 contain allowable subject matter because the prior art does not teach or suggest the claimed resist compositions. Hatakeyama teaches several resist compositions that comprise a base polymer comprising recurring units containing an imide group having an iodine-substituted aromatic group bonded thereto, and recurring units of at least one type selected from recurring units having a carboxyl group whose hydrogen is substituted by an acid labile group and recurring units having a phenolic hydroxyl group whose hydrogen is substituted by an acid labile group. Hatakeyama however does not teach or suggest the specific limitations recited in claims 4-11 comprising the specified combinations of claimed resin components and acid generator components. Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. Hatakeyama et al. (US 2010/0227274 A1) disclose a positive resist composition comprising polymerizable monomers and acid generator compounds. Any inquiry concerning this communication or earlier communications from the examiner should be directed to STEWART A FRASER whose telephone number is (571)270-5126. The examiner can normally be reached M-F, 7am-4pm, EST. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Miriam Stagg can be reached at 571-270-5256. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /STEWART A FRASER/Primary Examiner, Art Unit 1724
Read full office action

Prosecution Timeline

Dec 07, 2023
Application Filed
Jun 30, 2026
Non-Final Rejection mailed — §102 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
86%
Grant Probability
99%
With Interview (+14.2%)
2y 5m (~0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1352 resolved cases by this examiner. Grant probability derived from career allowance rate.

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