Prosecution Insights
Last updated: July 17, 2026
Application No. 18/575,538

HOLDING DEVICE ARRANGEMENT FOR USE IN AN IMPLANTATION PROCESS OF A PIEZOELECTRIC SUBSTRATE

Non-Final OA §103
Filed
Dec 29, 2023
Priority
Jul 19, 2021 — FR FR2107787 +1 more
Examiner
SMITH, DAVID E
Art Unit
2881
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Soitec
OA Round
1 (Non-Final)
85%
Grant Probability
Favorable
1-2
OA Rounds
0m
Est. Remaining
92%
With Interview

Examiner Intelligence

Grants 85% — above average
85%
Career Allowance Rate
910 granted / 1070 resolved
+17.0% vs TC avg
Moderate +7% lift
Without
With
+7.2%
Interview Lift
resolved cases with interview
Fast prosecutor
2y 0m
Avg Prosecution
19 currently pending
Career history
1092
Total Applications
across all art units

Statute-Specific Performance

§101
1.1%
-38.9% vs TC avg
§103
81.4%
+41.4% vs TC avg
§102
3.0%
-37.0% vs TC avg
§112
8.6%
-31.4% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1070 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Interpretation The following is a quotation of 35 U.S.C. 112(f): (f) Element in Claim for a Combination. – An element in a claim for a combination may be expressed as a means or step for performing a specified function without the recital of structure, material, or acts in support thereof, and such claim shall be construed to cover the corresponding structure, material, or acts described in the specification and equivalents thereof. The following is a quotation of pre-AIA 35 U.S.C. 112, sixth paragraph: An element in a claim for a combination may be expressed as a means or step for performing a specified function without the recital of structure, material, or acts in support thereof, and such claim shall be construed to cover the corresponding structure, material, or acts described in the specification and equivalents thereof. The claims in this application are given their broadest reasonable interpretation using the plain meaning of the claim language in light of the specification as it would be understood by one of ordinary skill in the art. The broadest reasonable interpretation of a claim element (also commonly referred to as a claim limitation) is limited by the description in the specification when 35 U.S.C. 112(f) or pre-AIA 35 U.S.C. 112, sixth paragraph, is invoked. As explained in MPEP § 2181, subsection I, claim limitations that meet the following three-prong test will be interpreted under 35 U.S.C. 112(f) or pre-AIA 35 U.S.C. 112, sixth paragraph: (A) the claim limitation uses the term “means” or “step” or a term used as a substitute for “means” that is a generic placeholder (also called a nonce term or a non-structural term having no specific structural meaning) for performing the claimed function; (B) the term “means” or “step” or the generic placeholder is modified by functional language, typically, but not always linked by the transition word “for” (e.g., “means for”) or another linking word or phrase, such as “configured to” or “so that”; and (C) the term “means” or “step” or the generic placeholder is not modified by sufficient structure, material, or acts for performing the claimed function. Use of the word “means” (or “step”) in a claim with functional language creates a rebuttable presumption that the claim limitation is to be treated in accordance with 35 U.S.C. 112(f) or pre-AIA 35 U.S.C. 112, sixth paragraph. The presumption that the claim limitation is interpreted under 35 U.S.C. 112(f) or pre-AIA 35 U.S.C. 112, sixth paragraph, is rebutted when the claim limitation recites sufficient structure, material, or acts to entirely perform the recited function. Absence of the word “means” (or “step”) in a claim creates a rebuttable presumption that the claim limitation is not to be treated in accordance with 35 U.S.C. 112(f) or pre-AIA 35 U.S.C. 112, sixth paragraph. The presumption that the claim limitation is not interpreted under 35 U.S.C. 112(f) or pre-AIA 35 U.S.C. 112, sixth paragraph, is rebutted when the claim limitation recites function without reciting sufficient structure, material or acts to entirely perform the recited function. Claim limitations in this application that use the word “means” (or “step”) are being interpreted under 35 U.S.C. 112(f) or pre-AIA 35 U.S.C. 112, sixth paragraph, except as otherwise indicated in an Office action. Conversely, claim limitations in this application that do not use the word “means” (or “step”) are not being interpreted under 35 U.S.C. 112(f) or pre-AIA 35 U.S.C. 112, sixth paragraph, except as otherwise indicated in an Office action. Such limitations are: “means for electrically connecting the surface of the elastic and thermo-conductive layer…to ground potential” in claim 1. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claims 1-5, 8, 10, 12-15 and 18-19 are rejected under 35 U.S.C. 103 as being unpatentable over Lin (US 20130120897 A1) in view of Zhang (CN 111769040 A). Regarding claim 1, Lin teaches a holding device arrangement, comprising a substrate holding device (electrostatic chuck, fig. 8, [0042) with an elastic and thermo-conductive layer (polymer protrusions 801 on charge control layer 802, [0042]; polymer is soft, [0006], and performs heat conduction, [0004]) for holding a substrate and means (metal layer 813) for electrically connecting the surface of the elastic and thermo-conductive layer to ground potential (bleeding charge to ground [0042]). Lin does not state that the system is for use in an implantation process of an piezoelectric substrate, or that the layer is for receiving a piezoelectric substrate. Zhang teaches an ion implantation system having an electrostatic chuck for receiving a piezoelectric substrate (p. 3 paragraph 1). It would have been obvious to one of ordinary skill in the art on or before the effective filing date of the invention to use the substrate holder of Lin in a system designed to implant ions in a piezoelectric substrate, such as the system of Zhang, as the substrate holder of Lin is designed for a microelectronics production system ([0003]) having a beam ([0027]) such as an ion implanter and can implicitly hold any desired substrate. Regarding claim 2, Lin teaches that the elastic and thermo-conductive layer comprises a polymer layer (polymer protrusions, [0009]). Regarding claims 3 and 13, Lin teaches that the means for electrically connecting comprises at least on electrically conductive element embedded in the elastic and thermo-conductive layer to render the elastic and thermo-conductive layer electrically conductive (polymer may be a blend of a carbon nanotube and a polymer, or a conductive nanoparticle doped polymer, [0010]). Regarding claim 4 and 14, Lin teaches that the electrically conductive element is carbon nanotubes ([0010]). Regarding claims 5 and 15, Lin teaches that the means for electrically connecting comprises at least one pin (ground pin, [0032]) extending through the elastic and thermo-conductive layer to the substrate holding device (pin passage 418 extends through top of substrate holder, fig. 4). Regarding claims 8 and 18, Lin teaches that the means for electrically connecting comprises a conductive layer (conductive path 952, [0043]), provided over the elastic and thermo-conductive layer and extending laterally at least partially over the side surface of the elastic and thermo-conductive layer to be in direct contact with the surface of the substrate holding device (fig. 9). Regarding claim 10, Zhang (as modified by Lin) teaches an ion implanter comprising a holding device arrangement according to claim 1. Regarding claims 12 and 19, Lin does not teach that the conductive layer comprises a metallic layer. It would have been obvious to one of ordinary skill in the art at the time of the invention to select the conductive layer of Lin to be a metallic layer as a matter of selecting a known material based on its art-recognized suitability for its intended use (i.e. conductors are often made of metal) (MPEP 2144.07 [R-01.2024]). Claims 6-7 and 16-17 are rejected under 35 U.S.C. 103 as being unpatentable over Lin in view of Zhang and in further view of Parkhe (20160148828 A1). Regarding claims 6 and 16, Lin and Zhang teach all the limitations of claims 5 and 15 as described above. Lin and Zhang do not teach that the at least one metallic pin rests on a spring element provided in the substrate holding device. Parkhe teaches a grounding pin (146, [0054]) for an electrostatic chuck which rests on a spring element (coil spring 150) provided in the substrate holding device (fig. 9). It would have been obvious to one of ordinary skill in the art on or before the effective filing date of the current claims to modify the system of Lin to have the spring loaded grounding pin of Parkhe, in order to provide a spring force for ensuring contact between the pin and the substrate for proper grounding as described by Parkhe. Regarding claims 7 and 17, Parkhe teaches that, in the absence of a substrate, the metallic pins protrude at least partially beyond the surface of the electrostatic chuck (fig. 9; the surface comprises the elastic and thermo-conductive layer in the combination with Lin, above). Claim 9 is rejected under 35 U.S.C. 103 as being unpatentable over Zhang in view of Liu. Regarding claim 9, Zhang teaches a method of implantation of a piezoelectric substrate (p. 3 paragraph 1), comprising the steps of: Providing a piezoelectric substrate (piezoelectric wafer 5) on a holding device (electrostatic chuck, p. 3 paragraph 1), and Implanting atomic species into the piezoelectric substrate (H ion implantation, line 17). Zhang does not teach that the holding device arrangement connects the substrate to ground potential and comprises a substrate holding device with an elastic and thermo-conductive layer for receiving the piezoelectric substrate, and means for electrically connecting the surface of the elastic and thermo-conductive layer for receiving the piezoelectric substrate to ground potential. Lin teaches a holding device arrangement connecting a substrate to ground potential (by ground pins, [0032], fig. 4) comprising a substrate holding device (electrostatic chuck, fig. 8, [0042) with an elastic and thermo-conductive layer (polymer protrusions 801 on charge control layer 802, [0042]; polymer is soft, [0006], and performs heat conduction, [0004]) for holding a substrate and means (metal layer 813) for electrically connecting the surface of the elastic and thermo-conductive layer to ground potential (bleeding charge to ground [0042]). It would have been obvious to one of ordinary skill in the art on or before the effective filing data of the invention to use the substrate holder of Lin in the ion implantation method of Zhang, as the substrate holder of Lin is designed for a microelectronics production system ([0003]) having a beam ([0027]) such as an ion implanter and can implicitly hold any desired substrate. Claim 11 is rejected under 35 U.S.C. 103 as being unpatentable over Lin in view of Zhang and in further view of Henley (US 6,458,723 B1). Regarding claim 11, Lin and Zhang teach all the limitations of claim 1 as described above. Lin and Zhang do not teach that the polymer is an elastomer. Henley teaches an ion implantation substrate holder with an elastomer top layer (75, col. 7 lines 38-40). t would have been obvious to one of ordinary skill in the art at the time of the invention to select the polymer layer of Lin to be an elastomer layer as a matter of selecting a known material based on its art-recognized suitability for an intended use (MPEP 2144.07 [R-01.2024]). In this case Henley teaches that an elastomer layer allows a shock absorbing layer with heat resistance characteristics (col. 7 lines 39-41) and provides efficient heat dissipation in an ion implantation process. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to DAVID E SMITH whose telephone number is (571)270-7096. The examiner can normally be reached M to F 8:30 AM-5:00 PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Robert Kim can be reached at 22293. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /DAVID E SMITH/Examiner, Art Unit 2881
Read full office action

Prosecution Timeline

Dec 29, 2023
Application Filed
Apr 20, 2026
Non-Final Rejection mailed — §103 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12676296
ORTHOGONAL ACCELERATION TIME-OF-FLIGHT MASS SPECTROMETER AND TUNING METHOD FOR THE SAME
3y 3m to grant Granted Jul 07, 2026
Patent 12671056
Ion Milling Device
2y 11m to grant Granted Jun 30, 2026
Patent 12667857
IDENTIFFYING AND QUANTIFYING COMPONENTS IN A HIGH-MELTING-POINT LIQUID
2y 4m to grant Granted Jun 30, 2026
Patent 12665178
SYSTEMS AND METHODS FOR MULTISTAGE MASS SPECTROMETRY UTILIZING AN ELECTROSTATIC ION TRAP
3y 2m to grant Granted Jun 23, 2026
Patent 12665180
ION MOLECULE REACTOR AND SETUP FOR ANALYZING COMPLEX MIXTURES
2y 5m to grant Granted Jun 23, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

Strategy Recommendation AI-generated — please review before filing

Get a prosecution strategy drawn from examiner precedents, rejection analysis, and claim mapping.
Typically takes 5-10 seconds — AI-generated, attorney review required before filing

Prosecution Projections

1-2
Expected OA Rounds
85%
Grant Probability
92%
With Interview (+7.2%)
2y 0m (~0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1070 resolved cases by this examiner. Grant probability derived from career allowance rate.

Sign in with your work email

Enter your email to receive a magic link. No password needed.

Personal email addresses (Gmail, Yahoo, etc.) are not accepted.

Free tier: 3 strategy analyses per month