Prosecution Insights
Prosecution Insights
Tech Center 2800 • Art Units: 2875 2881
This examiner grants 85% of resolved cases
David E. Smith operates within Tech Center 2800 and Art Unit 2875, where he has managed 1081 resolved cases. His allowance rate of 85.2 percent indicates a high frequency of granted patents relative to the total volume of applications he has processed. This rate suggests that practitioners working in these specific semiconductor or electronic fields may find a relatively favorable environment for securing patent rights. The 1081 resolved cases provide a robust statistical foundation for these observations.
The data shows a median of 754 days to allowance, providing a benchmark for expected prosecution timelines. Additionally, the interview lift of 7.0 percent reflects the impact of direct communication with the examiner. While this lift is positive, the high baseline allowance rate of 85.2 percent suggests that many applications reach allowance without the necessity of an interview. Practitioners should weigh the 7.0 percent increase in success against the 754 days typically required to reach a final resolution. This 7.0 percent lift remains a strategic option for complex cases.
| App # | Title | Status | Assignee |
|---|---|---|---|
| 18775073 | SCANNING ELECTRON MICROSCOPE DEVICE | Non-Final OA | Samsung Electronics Co., Ltd. |
| 18843241 | FLUID STERILIZATION DEVICE | Non-Final OA | Stanley Electric Co., Ltd. |
| 18719916 | Charged Particle Beam Device | Final Rejection | Hitachi High-Tech Corporation |
| 18589202 | BEAM TUBE AND LAYOUT FOR LINEAR ACCELERATOR | Non-Final OA | Applied Materials, Inc. |
| 18822365 | Techniques for Determining Active Ingredient (AI) Volatility for Agricultural Spray Solutions | Non-Final OA | Battelle Memorial Institute |
| 18910626 | SELF-DIFFERENTIAL CONFOCAL TILT SENSOR FOR MEASURING LEVEL VARIATION IN CHARGED PARTICLE BEAM SYSTEM | Non-Final OA | ASML Netherlands B.V. |
| 18568628 | CHARGED PARTICLE DETECTOR ASSEMBLY | Final Rejection | ASML NETHERLANDS B.V. |
| 18331866 | APPARATUS AND METHOD FOR DIRECTING CHARGED PARTICLE BEAM TOWARDS A SAMPLE | Final Rejection | ASML Netherlands B.V. |
| 18155698 | EMITTER FOR EMITTING CHARGED PARTICLES | Final Rejection | ASML Netherlands B.V. |
| 17964783 | ENERGY BAND-PASS FILTERING FOR IMPROVED HIGH LANDING ENERGY BACKSCATTERED CHARGED PARTICLE IMAGE RESOLUTION | Non-Final OA | ASML Netherlands B.V. |
| 18668112 | ELECTRON BEAM METROLOGY HAVING A SOURCE ENERGY SPREAD WITH FILTERED TAILS | Non-Final OA | KLA Corporation |
| 18906049 | ADDITIVE MANUFACTURING OF AN ION OPTICAL DEVICE | Non-Final OA | Thermo Finnigan LLC |
| 18755999 | HYBRIDIZED ION PRE-SEPARATION FOR MASS SPECTROMETRY | Non-Final OA | Thermo Finnigan LLC |
| 18904532 | BEAM ALIGNMENT AND SYNCHRONIZATION IN MICROSCOPY | Non-Final OA | FEI COMPANY |
| 18667077 | SCANNING DEFLECTOR | Non-Final OA | FEI Company |
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