Prosecution Insights
Last updated: October 23, 2026
Application No. 18/626,972

ONIUM SALT, RESIST COMPOSITION, AND PATTERN FORMING PROCESS

Non-Final OA §103
Filed
Apr 04, 2024
Priority
Apr 12, 2023 — JP 2023-064766
Examiner
FRASER, STEWART A
Art Unit
1724
Tech Center
1700 — Chemical & Materials Engineering
Assignee
Shin-Etsu Chemical Co., Ltd.
OA Round
1 (Non-Final)
86%
Grant Probability
Favorable
1-2
OA Rounds
0m
Est. Remaining
99%
With Interview

Examiner Intelligence

Grants 86% — above average
86%
Career Allowance Rate
1175 granted / 1367 resolved
+21.0% vs TC avg
Moderate +14% lift
Without
With
+14.4%
Interview Lift
resolved cases with interview
Typical timeline
2y 5m
Avg Prosecution
25 currently pending
Career history
1398
Total Applications
across all art units

Statute-Specific Performance

§101
1.3%
-38.7% vs TC avg
§103
48.2%
+8.2% vs TC avg
§102
22.3%
-17.7% vs TC avg
§112
18.2%
-21.8% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1367 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . This is the initial office action for US Patent Application No. 18/626972. Claims 1-17 are currently pending and have been fully considered. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claims 1-17 are rejected under 35 U.S.C. 103 as being unpatentable over JP 2015-148652 A, herein referred to as ‘652, provided in Applicant’s IDS filed 5/7/2026. Regarding claims 1-5 of the present application, paragraphs [0007] to [0011] of ‘652 disclose anions containing a partial structure represented by formula (1) and SO3 - or COO- , and radiation-sensitive onium cations (the definitions of each substituent and symbol are described in the relevant paragraphs of ‘652). Paragraphs [0115] to [0130] of ‘652 disclose specific examples of the compounds, such as formulas (1-1-1) to (1-1-10) (1-1-12) to (1-1-14) (1-1-16) to (1-1-18) , and (1-1-12) (which corresponds to formula (1) of the present application). The difference between ‘652 and the present application is that the anion structure of COO- in formula (1) of the present application is not disclosed. However, paragraphs [0007] to [0011] of the specification of ‘652 disclose an anion containing the partial structure represented by formula (1) and SO3 - or COO-.Therefore, it would have been obvious to one of ordinary skill in the art to modify the anion structure disclosed by ‘652 to meet the onium salt formula represented by formula (1) of the present application because substitution of a known element for another to obtain predictable results is considered to be obvious in view of MPEP Chapter 2143, Section I, Part B. Regarding claims 6-8 and 13-15 of the present application, in addition to the reasons stated for the rejections of claims 1-5, claim 1 of ‘652 discloses a radiation-sensitive resin composition contains a polymer having a structural unit containing an acid-dissociable group, and a first radiation-sensitive acid generator, and the first radiation-sensitive acid generator is a partial structure represented by the following formula (1) and an anion containing SO3- or COO - , and a radiation-sensitive onium cation. Paragraph [0014] of the specification of ‘652 discloses that the radiation-sensitive resin composition contains [A] a polymer and [B] an acid generator, and may contain further a second radiation-sensitive acid generator other than the first radiation-sensitive acid generator, [D] a nitrogen-atom-containing compound, [E] a fluorine-atom-containing polymer, and [F] a solvent. It would have been obvious to one of ordinary skill in the art to adjust the monomer composition of the composition as appropriate because substitution of a known element for another to obtain predictable results is considered to be obvious in view of MPEP Chapter 2143, Section I, Part B. Regarding claims 9-12 of the present application, in addition to the reasons stated for the rejection of claims 1-5, paragraphs [0014] to [0072] of ‘652 disclose a radiation-sensitive resin composition containing a polymer [A], wherein the polymer [A] may have structural units (I) to (III) and other structural units in addition to the structural units (I) to (III). It would have been obvious to one of ordinary skill in the art to adjust the monomer composition of the composition as appropriate because substitution of a known element for another to obtain predictable results is considered to be obvious in view of MPEP Chapter 2143, Section I, Part B. Regarding claims 16 and 17 of the present application, in addition to the reasons stated for the rejection of claims 1-5, paragraphs [0217] to [0223] of ‘652 disclose a method for forming a resist pattern comprises a resist film forming step, a resist film exposing step, and a resist film developing step, and that the resist film is formed from the radiation-sensitive resin composition Therefore, it would have been obvious to one of ordinary skill in the art to modify the resist pattern forming steps disclosed by ‘652 because applying a known technique to a known device (Method or Product) ready for improvement to yield predictable results is considered to be obvious in view of MPEP Chapter 2143, Section I, Part C. Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. Takihana et al. (US 2013/0209937 A1) disclose a polymerizable fluorine-containing sulfonic acid onium salt. Any inquiry concerning this communication or earlier communications from the examiner should be directed to STEWART A FRASER whose telephone number is (571)270-5126. The examiner can normally be reached M-F, 7am-4pm, EST. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Miriam Stagg can be reached at 571-270-5256. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /STEWART A FRASER/Primary Examiner, Art Unit 1724
Read full office action

Prosecution Timeline

Apr 04, 2024
Application Filed
Sep 30, 2026
Non-Final Rejection mailed — §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
86%
Grant Probability
99%
With Interview (+14.4%)
2y 5m (~0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1367 resolved cases by this examiner. Grant probability derived from career allowance rate.

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