Prosecution Insights
Last updated: August 16, 2026
Application No. 18/701,384

SYSTEM AND METHOD FOR CARBON PLUG FORMATION

Non-Final OA §103
Filed
Apr 15, 2024
Priority
Nov 03, 2021 — provisional 63/263,493 +1 more
Examiner
VU, HUNG K
Art Unit
Tech Center
Assignee
Lam Research Corporation
OA Round
1 (Non-Final)
88%
Grant Probability
Favorable
1-2
OA Rounds
1m
Est. Remaining
97%
With Interview

Examiner Intelligence

Grants 88% — above average
88%
Career Allowance Rate
879 granted / 1004 resolved
+27.5% vs TC avg
Moderate +9% lift
Without
With
+9.4%
Interview Lift
resolved cases with interview
Typical timeline
2y 6m
Avg Prosecution
30 currently pending
Career history
1035
Total Applications
across all art units

Statute-Specific Performance

§101
0.4%
-39.6% vs TC avg
§103
43.6%
+3.6% vs TC avg
§102
37.2%
-2.8% vs TC avg
§112
11.9%
-28.1% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1004 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Objections Claim 19 is objected to because of the following informalities: In claim 19, line 1, the recitation of “A” should be changed to “An”, for clarity. Appropriate correction is required. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim(s) 1-20 is/are rejected under 35 U.S.C. 103 as being unpatentable over Henry et al. (WO 2020/190878, of record) in view of Lee et al. (US 2010/0093187). Henry et al. discloses, as shown in Figures 5, 11-13 and [0074]-[00779], [0097], [0127]-[0138], a fabrication tool (70) comprising: a chamber (72); a pedestal electrode (not shown on the substrate holder 76) and a showerhead electrode (not shown on a showerhead 74) arranged in the chamber; one or more gas inlets (no shown that is controlled by a system controller 82) into the chamber and associated flow control hardware; a vacuum pump system (not shown) configured to reduce a pressure within the chamber; a radiofrequency (RF) power source (80) configured to form an RF plasma between the pedestal electrode and the showerhead electrode; and coupled operatively to the flow control hardware and to the RF power source, a controller (82) comprising a processor and memory, the memory comprising instructions executable by the processor to: operate the flow control hardware to introduce a hydrogen-containing reducing agent into the chamber, operate the flow control hardware to introduce a hydrocarbon gas into the chamber, and operate the RF power source to form a plasma between the pedestal electrode and the showerhead electrode to fully deposit a carbon plug (414, and amorphous carbon non-conformal material 416) in a recess of a workpiece positioned on a pedestal of the chamber. Henry et al. does not disclose the carbon plug is formed in a single plasma deposition cycle with no intermediate carbon removal process. However, Henry et al. discloses in paragraphs [0138]-[0142] and Figures 11-13, that a simultaneous etch during deposition allows no or minimal additional steps to be typically required once the amorphous carbon deposition is complete for the plug (414) and the non-conformal material (416), wherein the amorphous carbon of the plug (414) and the material (416) is deposited quickly in relative thick layer. Therefore, it would have been obvious to one of ordinary skills in the art at the time the invention was made to form the carbon plug of Henry et al. in a single plasma deposition cycle with no intermediate carbon removal process, such as taught by paragraphs [0138]-[0142], in order to have the desired conformality. Also, Lee et al. discloses a formation of an amorphous carbon layer (202) in cycles or a single step deposition. Note [0067] and Figure 2 of Lee et al. Therefore, it would have been obvious to one of ordinary skills in the art at the time the invention was made to form the carbon plug of Henry et al. using a single deposition cycle, such as taught by Lee et al. in order to have the desired conformality. Regarding claim 2, Henry et al. and Lee et al. disclose the instructions are executable to operate the RF power source to provide RF power at one or more frequencies within a range of five megahertz and higher [0077]. Regarding claim 3, Henry et al. and Lee et al. disclose the instructions are executable to operate the RF power source to provide RF power that excludes frequencies below five megahertz [0077]. Regarding claim 4, Henry et al. and Lee et al. disclose the hydrocarbon gas comprises an alkyne [0137]. Regarding claim 5, Henry et al. and Lee et al. disclose the alkyne comprises acetylene [0137]. Regarding claim 6, Henry et al. and Lee et al. disclose the instructions are executable to operate the flow control hardware to introduce the hydrogen-containing reducing agent and the hydrocarbon gas into the chamber at a molar ratio of 20-35% hydrogen [0137]-[0138]. Regarding claim 7, Henry et al. and Lee et al. disclose the instructions are further executable to further introduce one or more of argon or nitrogen into the chamber as a diluent gas [0139]. Regarding claim 8, Henry et al. and Lee et al. disclose the instructions are further executable to operate the flow control hardware to deposit the carbon plug at a processing gas pressure between 5 and 13 Torr ([0136], Table1). Regarding claim 9, Henry et al. and Lee et al. disclose the fabrication tool further comprising one or more heaters, and wherein the instructions are executable to operate the one or more heaters to maintain the pedestal electrode at a temperature within 275-660° C. during plug formation [0079]. Regarding claim 10, Henry et al. and Lee et al. disclose the instructions are executable to extinguish the plasma after the workpiece is exposed to the plasma for a duration within a range of 700 to 1800 seconds ([0079], Table 1). Regarding claim 11, Henry et al. discloses, as shown in [0127]-[0138] and Figures 11-13, an integrated circuit fabrication method comprising: forming a carbon plug (414 and 416) in a recess (14) of a workpiece in a plasma deposition cycle by exposing the workpiece to a carbon-depositing plasma in a plasma processing chamber (72), the plasma formed from a mixture of gases comprising a hydrogen-containing reducing agent, and a hydrocarbon gas. Henry et al. does not disclose the plasma deposition cycle is in a single plasma deposition cycle. However, Henry et al. discloses in paragraphs [0138]-[0142] and Figures 11-13, that a simultaneous etch during deposition allows no or minimal additional steps to be typically required once the amorphous carbon deposition is complete for the plug (414) and the non-conformal material (416), wherein the amorphous carbon of the plug (414) and the material (416) is deposited quickly in relative thick layer. Therefore, it would have been obvious to one of ordinary skills in the art at the time the invention was made to form the carbon plug of Henry et al. in a single plasma deposition cycle with no intermediate carbon removal process, such as taught by paragraphs [0138]-[0142], in order to have the desired conformality. Also, Lee et al. discloses a formation of an amorphous carbon layer (202) in cycles or a single step deposition. Note [0067] and Figure 2 of Lee et al. Therefore, it would have been obvious to one of ordinary skills in the art at the time the invention was made to form the carbon plug of Henry et al. using a single deposition cycle, such as taught by Lee et al. in order to have the desired conformality. Regarding claim 12, Henry et al. and Lee et al. disclose the carbon-depositing plasma comprises a radiofrequency (RF) plasma, the RF plasma comprising one or more frequencies within a range of five megahertz and higher [077] Regarding claim 13, Henry et al. and Lee et al. disclose the hydrocarbon gas comprises an alkyne [0137]. Regarding claim 14, Henry et al. and Lee et al. disclose the hydrogen-containing reducing agent and the hydrocarbon gas are introduced into the chamber at a molar ratio of 20-35% hydrogen [0137]-[0138]. Regarding claim 15, Henry et al. and Lee et al. disclose the mixture of gases further comprises one or more of argon or nitrogen as a diluent gas [0139]. Regarding claim 16, Henry et al. and Lee et al. disclose the carbon plug is formed at a processing gas pressure between 5 and 13 Torr ([0136], Table 1). Regarding claim 17, Henry et al. and Lee et al. disclose the fabrication method further comprising planarizing the workpiece after the single plasma deposition cycle, thereby removing carbon deposited outside of the recess ([0144], Figures 12-13). Regarding claim 18, Henry et al. and Lee et al. disclose the recess comprises a channel of a memory stack structure [0126]. Regarding claim 19, Henry et al. discloses an integrated circuit fabrication method of fabricating a memory stack structure comprising: supporting a workpiece on a pedestal of a deposition chamber (72), the deposition chamber comprising a pedestal electrode (no shown on the substrate holder 76) separated from a showerhead electrode (not shown on the substrate holder 74) by an interelectrode space (not shown), the workpiece comprising a recess in a first memory deck; flowing a mixture of gases through the deposition chamber at reduced pressure, the mixture of gases comprising a hydrogen-containing reducing agent, and also comprising a hydrocarbon; driving RF current through a discharge gap between the pedestal electrode and the showerhead electrode to form a carbon-depositing plasma and deposit a carbon plug ((amorphous carbon plug (414) and an amorphous carbon non-conformal material (416) within the feature (14) n the individual layers (12)) in the recess in the first memory deck; planarizing the workpiece after forming the carbon plug in the recess in the first memory deck [0048]; and depositing layers of a second memory deck over the first memory deck and the carbon plug [0048]-[0051]. Henry et al. does not disclose the plasma deposition cycle is in a single plasma deposition cycle. However, Henry et al. discloses in paragraphs [0138]-[0142] and Figures 11-13, that a simultaneous etch during deposition allows no or minimal additional steps to be typically required once the amorphous carbon deposition is complete for the plug (414) and the non-conformal material (416), wherein the amorphous carbon of the plug (414) and the material (416) is deposited quickly in relative thick layer. Therefore, it would have been obvious to one of ordinary skills in the art at the time the invention was made to form the carbon plug of Henry et al. in a single plasma deposition cycle with no intermediate carbon removal process, such as taught by paragraphs [0138]-[0142], in order to have the desired conformality. Also, Lee et al. discloses a formation of an amorphous carbon layer (202) in cycles or a single step deposition. Note [0067] and Figure 2 of Lee et al. Therefore, it would have been obvious to one of ordinary skills in the art at the time the invention was made to form the carbon plug of Henry et al. using a single deposition cycle, such as taught by Lee et al. in order to have the desired conformality. Regarding claim 20, Henry et al. and Lee et al. disclose the hydrocarbon comprises an alkyne [0137]. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to HUNG K VU whose telephone number is (571)272-1666. The examiner can normally be reached Monday - Friday: 7am - 5pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, JACOB CHOI can be reached at (469) 295-9060. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /HUNG K VU/ Primary Examiner, Art Unit 2897
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Prosecution Timeline

Apr 15, 2024
Application Filed
Jul 15, 2026
Non-Final Rejection mailed — §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
88%
Grant Probability
97%
With Interview (+9.4%)
2y 6m (~1m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1004 resolved cases by this examiner. Grant probability derived from career allowance rate.

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