Prosecution Insights
Last updated: April 18, 2026
Application No. 18/788,939

MASK ASSEMBLY AND METHOD OF MANUFACTURING THE SAME

Non-Final OA §103
Filed
Jul 30, 2024
Examiner
REMAVEGE, CHRISTOPHER
Art Unit
1713
Tech Center
1700 — Chemical & Materials Engineering
Assignee
Samsung Display Co., Ltd.
OA Round
1 (Non-Final)
57%
Grant Probability
Moderate
1-2
OA Rounds
3y 4m
To Grant
84%
With Interview

Examiner Intelligence

Grants 57% of resolved cases
57%
Career Allow Rate
361 granted / 632 resolved
-7.9% vs TC avg
Strong +27% interview lift
Without
With
+26.7%
Interview Lift
resolved cases with interview
Typical timeline
3y 4m
Avg Prosecution
29 currently pending
Career history
661
Total Applications
across all art units

Statute-Specific Performance

§101
0.5%
-39.5% vs TC avg
§103
54.9%
+14.9% vs TC avg
§102
26.1%
-13.9% vs TC avg
§112
15.5%
-24.5% vs TC avg
Black line = Tech Center average estimate • Based on career data from 632 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 103 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claims 1-2 and 4 are rejected under 35 U.S.C. 103 as being unpatentable over Chen (US 20220131076 A1) in view of Bae et al. (KR 20190014188 A, Machine Translation). As to claim 1, Chen discloses a mask assembly [Abstract; claim 18] comprising: a mask frame 50 comprising an outer frame through which a cell opening is defined [para. 0134, Fig. 3-7, Fig. 4-9]; a cell mask 20 disposed on the mask frame 50 and comprising a plurality of masking patterns corresponding to the cell opening [Fig. 3-7, Fig. 4-9] and a polymer material [para. 0117, “debonding layer 20 includes, but not limited to, organic film, such as polyimide”]; and a mesh frame 30/40 disposed between the mask frame 50 and the cell mask 20 and comprising a plurality of conductive patterns 30/40 corresponding to the plurality of masking patterns a/b/c/e [Fig. 3-7, Fig. 4-9; claim 18-19]. Chen discloses the patterned metal layers 30/40 and polyimide layer 20 have a continuous width [Fig. 3-7, Fig. 4-9]. Chen therefore fails to explicitly disclose: wherein a width of each of the plurality of masking patterns continuously decreases as a distance from a corresponding conductive pattern among the plurality of conductive patterns decreases. However, Bae teaches a mask frame assembly having tapered masking patterns [Fig. 10], comprising: wherein a width of each of the plurality of masking patterns continuously decreases as a distance from a corresponding conductive pattern among the plurality of conductive patterns decreases [Fig. 10; pg. 4, para. 2-4]. It would have been prima facie obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to modify the masking patterns, of the deposition mask of Chen, to have a tapered shape, of Bae in order to improve control the deposition material that passes through the hole pattern, as taught by Bae [pg. 4, para. 4], and thereby improve pattern edge definition. As to claim 2, modified Chen discloses the mask assembly of claim 1, wherein each of the plurality of conductive patterns 30/40 comprises: a first surface which is in contact with the plurality of masking patterns a/b/c/e [Chen, Fig. 3-7, Fig. 4-9]; and a second surface opposite to the first surface [Chen, Fig. 3-7, Fig. 4-9], the first surface has a width equal to or smaller than the width of each of the plurality of masking patterns, and the second surface has a width smaller than the width of the first surface [Bae; Fig. 10]. As to claim 4, modified Chen discloses the mask assembly of claim 1, wherein the mesh frame comprises a metal material 30/40 or a transparent conductive oxide [para. 0118-119], and the cell mask comprises polyimide [para. 0117]. Allowable Subject Matter Claim 3 is objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. The following is a statement of reasons for the indication of allowable subject matter: The prior art of record, alone or in combination, fails to teach or suggest the feature of “wherein each of the plurality of conductive patterns further comprises a side surface portion connecting the first surface and the second surface, and the side surface portion has a curved surface shape.” Here, Chen teaches a straight (perpendicular), non-cruved, side surface shape [Fig. 3-7, Fig. 4-9], and Bae teaches a tapered side surface profile having a straight, non-curved, shape [Fig. 10]. Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure: The additionally cited references are cited to show conventional deposition masks [Abstracts]. Any inquiry concerning this communication or earlier communications from the examiner should be directed to CHRISTOPHER M REMAVEGE whose telephone number is (571)270-5511. The examiner can normally be reached Monday-Friday 10:00 AM - 3:30 PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Joshua Allen can be reached at 571-270-3176. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /CHRISTOPHER REMAVEGE/Examiner, Art Unit 1713
Read full office action

Prosecution Timeline

Jul 30, 2024
Application Filed
Apr 01, 2026
Non-Final Rejection — §103 (current)

Precedent Cases

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
57%
Grant Probability
84%
With Interview (+26.7%)
3y 4m
Median Time to Grant
Low
PTA Risk
Based on 632 resolved cases by this examiner. Grant probability derived from career allow rate.

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