Prosecution Insights
Last updated: October 01, 2026
Application No. 18/790,354

DEVICES AND METHODS FOR ENHANCING INSERTION LOSS PERFORMANCE OF AN ANTENNA SWITCH

Non-Final OA §DP
Filed
Jul 31, 2024
Priority
Mar 29, 2018 — provisional 62/649,967 +4 more
Examiner
ARMAND, MARC ANTHONY
Art Unit
Tech Center
Assignee
Taiwan Semiconductor Manufacturing Company, Ltd.
OA Round
1 (Non-Final)
83%
Grant Probability
Favorable
1-2
OA Rounds
3m
Est. Remaining
88%
With Interview

Examiner Intelligence

Grants 83% — above average
83%
Career Allowance Rate
901 granted / 1080 resolved
+23.4% vs TC avg
Minimal +4% lift
Without
With
+4.2%
Interview Lift
resolved cases with interview
Typical timeline
2y 5m
Avg Prosecution
31 currently pending
Career history
1097
Total Applications
across all art units

Statute-Specific Performance

§101
3.7%
-36.3% vs TC avg
§103
58.1%
+18.1% vs TC avg
§102
22.0%
-18.0% vs TC avg
§112
8.4%
-31.6% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1080 resolved cases

Office Action

§DP
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Double Patenting The nonstatutory double patenting rejection is based on a judicially created doctrine grounded in public policy (a policy reflected in the statute) so as to prevent the unjustified or improper timewise extension of the “right to exclude” granted by a patent and to prevent possible harassment by multiple assignees. A nonstatutory double patenting rejection is appropriate where the conflicting claims are not identical, but at least one examined application claim is not patentably distinct from the reference claim(s) because the examined application claim is either anticipated by, or would have been obvious over, the reference claim(s). See, e.g., In re Berg, 140 F.3d 1428, 46 USPQ2d 1226 (Fed. Cir. 1998); In re Goodman, 11 F.3d 1046, 29 USPQ2d 2010 (Fed. Cir. 1993); In re Longi, 759 F.2d 887, 225 USPQ 645 (Fed. Cir. 1985); In re Van Ornum, 686 F.2d 937, 214 USPQ 761 (CCPA 1982); In re Vogel, 422 F.2d 438, 164 USPQ 619 (CCPA 1970); In re Thorington, 418 F.2d 528, 163 USPQ 644 (CCPA 1969). A timely filed terminal disclaimer in compliance with 37 CFR 1.321(c) or 1.321(d) may be used to overcome an actual or provisional rejection based on nonstatutory double patenting provided the reference application or patent either is shown to be commonly owned with the examined application, or claims an invention made as a result of activities undertaken within the scope of a joint research agreement. See MPEP § 717.02 for applications subject to examination under the first inventor to file provisions of the AIA as explained in MPEP § 2159. See MPEP § 2146 et seq. for applications not subject to examination under the first inventor to file provisions of the AIA . A terminal disclaimer must be signed in compliance with 37 CFR 1.321(b). The filing of a terminal disclaimer by itself is not a complete reply to a nonstatutory double patenting (NSDP) rejection. A complete reply requires that the terminal disclaimer be accompanied by a reply requesting reconsideration of the prior Office action. Even where the NSDP rejection is provisional the reply must be complete. See MPEP § 804, subsection I.B.1. For a reply to a non-final Office action, see 37 CFR 1.111(a). For a reply to final Office action, see 37 CFR 1.113(c). A request for reconsideration while not provided for in 37 CFR 1.113(c) may be filed after final for consideration. See MPEP §§ 706.07(e) and 714.13. The USPTO Internet website contains terminal disclaimer forms which may be used. Please visit www.uspto.gov/patent/patents-forms. The actual filing date of the application in which the form is filed determines what form (e.g., PTO/SB/25, PTO/SB/26, PTO/AIA /25, or PTO/AIA /26) should be used. A web-based eTerminal Disclaimer may be filled out completely online using web-screens. An eTerminal Disclaimer that meets all requirements is auto-processed and approved immediately upon submission. For more information about eTerminal Disclaimers, refer to www.uspto.gov/patents/apply/applying-online/eterminal-disclaimer. Claims 1-20 are rejected on the ground of nonstatutory double patenting as being unpatentable over claims of U.S. Patent No. 11,855,012 discloses in claims 1-15. Although the claims at issue are not identical, they are not patentably distinct from each other because regarding claim 1, a method of making a semiconductor device, comprising: providing a substrate comprising a plurality of regions; forming a metal-oxide-semiconductor device extending into the substrate; and forming a plurality of contact pads exposed on a surface of the substrate, wherein each of the plurality of contact pads corresponds to one of the plurality of regions, wherein the plurality of regions comprises at least one of: a p-type well region corresponding to a first contact pad, a deep n-type well region corresponding to a second contact pad, and a p-type substrate region corresponding to a third contact pad. Regarding claims 2-5, U.S. Patent No. 11,855,012 discloses in claim 2-8, a method wherein each of the plurality of contact pads has an area smaller than 4 square micrometers; wherein each of the plurality of regions has a ring shape and each of the plurality of contact pads has a shape covering a portion of the ring shape of the corresponding region; wherein a distance from the first contact pad to the second contact pad is between 0.01 micrometer and 5 micrometers; wherein a distance from the second contact pad to the third contact pad is between 0.01 micrometer and 200 micrometers. Regarding claim 6, U.S. Patent No. 11,855,012 discloses in claim 9, a method of making a semiconductor device, comprising: providing a substrate comprising a plurality of regions each having a ring shape; forming a metal-oxide-semiconductor device extending into the substrate; and forming a plurality of contact pads on a surface of the substrate, wherein each of the plurality of contact pads corresponds to one of the plurality of regions, wherein the plurality of regions comprises at least one of: a p-type well region corresponding to a first contact pad, a deep n-type well region corresponding to a second contact pad, and a p-type substrate region corresponding to a third contact pad. Regarding claims 7-13, U.S. Patent No. 11,855,012 discloses in claims 7-13, a method wherein each of the plurality of contact pads has an area smaller than 4 square micrometers; wherein each of the plurality of regions has a ring shape and each of the plurality of contact pads has a shape covering a portion of the ring shape of the corresponding region; wherein a distance from the first contact pad to the second contact pad is larger than 0.01 micrometer; wherein a distance from the first contact pad to the second contact pad is smaller than 5 micrometers; wherein a distance from the second contact pad to the third contact pad is larger than 0.01 micrometer; wherein a distance from the second contact pad to the third contact pad is smaller than 200 micrometers; wherein the semiconductor device serves as an antenna switch. Regarding claim 14, U.S. Patent No. 11,855,012 discloses in claim 9, a method of making a semiconductor device, comprising: providing a substrate comprising a plurality of regions, wherein the plurality of regions comprises at least one of: a p-type well region corresponding to a first contact pad, a deep n-type well region corresponding to a second contact pad, and a p-type substrate region corresponding to a third contact pad; forming a metal-oxide-semiconductor device extending into the substrate; and forming at least one isolation feature extending into the substrate and disposed adjacent to the metal-oxide-semiconductor device. Regarding claims 15-20, U.S. Patent No. 11,855,012 discloses in claims 10-15, a method further comprising forming at least four metal layers on the metal-oxide-semiconductor device in a chip portion of the semiconductor device; wherein a quantity of the at least four metal layers is between four and twenty; wherein an insertion loss of the semiconductor device is smaller as a quantity of the at least four metal layers becomes larger; wherein eight metal layers in total are formed on the metal-oxide-semiconductor device in the chip portion of the semiconductor device; further comprising forming at least one metal layer in a packaging portion of the semiconductor device; wherein an insertion loss of the semiconductor device is smaller as a quantity of the at least one metal layer becomes larger. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to MARC-ANTHONY ARMAND whose telephone number is (571)272-5178. The examiner can normally be reached 8am-5pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Steven B Gauthier can be reached at 571-270-0373. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. MARC - ANTHONY ARMAND Primary Examiner Art Unit 2813 /MARC-ANTHONY ARMAND/Primary Examiner, Art Unit 2813
Read full office action

Prosecution Timeline

Jul 31, 2024
Application Filed
Aug 27, 2026
Non-Final Rejection mailed — §DP (current)

Precedent Cases

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
83%
Grant Probability
88%
With Interview (+4.2%)
2y 5m (~3m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1080 resolved cases by this examiner. Grant probability derived from career allowance rate.

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