Prosecution Insights
Last updated: July 17, 2026
Application No. 18/803,195

THERMO-MECHANICAL ACTUATOR

Non-Final OA §102
Filed
Aug 13, 2024
Priority
Jul 29, 2019 — EU 19188866.8 +2 more
Examiner
PERSAUD, DEORAM
Art Unit
2882
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
ASML Holding N.V.
OA Round
1 (Non-Final)
77%
Grant Probability
Favorable
1-2
OA Rounds
10m
Est. Remaining
89%
With Interview

Examiner Intelligence

Grants 77% — above average
77%
Career Allowance Rate
583 granted / 759 resolved
+8.8% vs TC avg
Moderate +12% lift
Without
With
+11.8%
Interview Lift
resolved cases with interview
Typical timeline
2y 9m
Avg Prosecution
33 currently pending
Career history
798
Total Applications
across all art units

Statute-Specific Performance

§101
1.2%
-38.8% vs TC avg
§103
63.8%
+23.8% vs TC avg
§102
28.0%
-12.0% vs TC avg
§112
0.7%
-39.3% vs TC avg
Black line = Tech Center average estimate • Based on career data from 759 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Specification The lengthy specification has not been checked to the extent necessary to determine the presence of all possible minor errors. Applicant’s cooperation is requested in correcting any errors of which applicant may become aware in the specification. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claims 1-24 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Shiraishi [US 2010/0033704 A1]. Regarding claims 1, 13 and 24, Shiraishi discloses a system / a lithography system (Fig. 1) / a metrology system (paragraph [0070]) comprising: an optical element (M1); and a plurality of thermo-mechanical actuators (paragraph [0069] teaches piezo-actuators arranged movably in the openings) coupled to a first surface of the optical element (M1), wherein each actuator comprises at least one piezo-electric module each having at least one piezo-electric element (as shown in Figs. 2-5, see also paragraphs [0069] teaches a plurality of actuators comprising piezo-electric elements to deform and cool a mirror), wherein a first one of the plurality of thermo-mechanical actuators (paragraph [0044] teaches elements for deforming the reflecting surface of the mirror are provided in the holes) is configured to receive a mechanical actuation signal that causes one of its at least one piezo-electric module to apply a force to the first surface of the optical element (M1) with its at least one piezo-electric element to thereby cause a deformation of a second surface of the optical element (paragraphs [0049]-[0051] teaches wherein active deformation control makes it possible to define the target shape for the shape of the reflecting surface of the mirror), and wherein a second one of the plurality of thermo-mechanical actuators (paragraph [0044] teaches elements for deforming the reflecting surface of the mirror are provided in the holes) is configured to receive a thermal actuation signal that causes one of its at least one piezo-electric module to heat or cool the first surface of the optical element (M1) with its at least one piezo-electric element (paragraph [0045] teaches the actuator comprising Peltier element 37 position in each opening to cool the mirror, see also Figs. 2-5). Regarding claims 2 and 15, Shiraishi discloses wherein the first one or the second one of the plurality of thermo-mechanical actuators (paragraphs [0044]-[0045] teaches the actuator comprising Peltier element 37 position in each opening to cool the mirror) is configured to generate a mechanical sensing signal representative of a mechanical state of the optical element using one of its at least one piezo-electric module based on a state of another piezo-electric element (paragraphs [0063]-[0069] teaches the measurement signal of the temperature sensor and controlling of the deformation mirror as a result of the measurement). Regarding claims 3 and 16, Shiraishi discloses wherein another one of the plurality of thermo-mechanical actuators is configured to generate a mechanical sensing signal representative of a mechanical state of the optical element using one of its at least one piezo-electric module based on a state of its at least one piezo-electric element (paragraphs [0049]-[0051] teaches wherein active deformation control makes it possible to define the target shape for the shape of the reflecting surface of the mirror). Regarding claims 4 and 17, Shiraishi discloses wherein the first one or the second one of the plurality of thermo-mechanical actuators is configured to generate a temperature sensing signal representative of a thermal state of the optical element using one of its at least one piezo-electric module based on a state of another piezo-electric element (paragraphs [0044]-[0045] teaches the actuator comprising Peltier element 37 position in each opening to cool the mirror). Regarding claims 5 and 18, Shiraishi discloses wherein another one of the plurality of thermo-mechanical actuators is configured to generate a temperature sensing signal representative of a thermal state of the optical element using one of its at least one piezo-electric module based on a state of its at least one piezo-electric element (paragraphs [0063]-[0069]). Regarding claims 6 and 19, Shiraishi discloses wherein each at least one piezo-electric element is disposed on a common member of frame (94, see also paragraph [0045]). Regarding claim 7, Shiraishi discloses wherein common member of frame comprises a grounding electrode (as shown in Figs. 2-5). Regarding claims 8 and 20, Shiraishi discloses wherein common member of frame comprises a heat sink (paragraphs [0010] and [0014] teaches enhance heat discharge). Regarding claims 9 and 21, Shiraishi discloses wherein the first one of the plurality of thermo-mechanical actuators is also configure to receive a further thermal actuation signal that causes one of its at least one piezo-electric module to heat or cool the first surface of the optical element with another piezo-electric element (paragraphs [0063]-[0069]). Regarding claims 10 and 22, Shiraishi discloses wherein the second one of the plurality of thermo-mechanical actuators is also configure to receive a further mechanical actuation signal that causes one of its at least one piezo-electric module to apply a force to the first surface of the optical element with another piezo-electric element to thereby cause a deformation of a second surface of the optical element (paragraphs [0063]-[0069]). Regarding claims 11 and 14, Shiraishi discloses wherein the first one of the plurality of thermo-mechanical actuators and the second one of the plurality of thermo-mechanical actuators are the same thermo-mechanical actuator (as shown in Figs. 2-5). Regarding claims 12 and 23, Shiraishi discloses wherein the optical element is a mirror (M1, see also Fig. 1). Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to DEORAM PERSAUD whose telephone number is (571)270-5476. The examiner can normally be reached M-F 8AM-5PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Minh-Toan Ton can be reached at 571-272-2303. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /DEORAM PERSAUD/Primary Examiner, Art Unit 2882
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Prosecution Timeline

Aug 13, 2024
Application Filed
Mar 16, 2026
Non-Final Rejection (signed) — §102
Apr 28, 2026
Non-Final Rejection mailed — §102 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
77%
Grant Probability
89%
With Interview (+11.8%)
2y 9m (~10m remaining)
Median Time to Grant
Low
PTA Risk
Based on 759 resolved cases by this examiner. Grant probability derived from career allowance rate.

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