Prosecution Insights
Prosecution Insights
193 pending office actions • 45 art units • 115 examiners • 22 of 193 (11%) have an AI response strategy ready • 235 patents granted in the last 365 days
Based on the USPTO statutory response window for each pending office action. 62 of the docket's apps have a known mailing date; the rest are excluded from the tile counts.
Every pending office action with a known statutory deadline, placed on a days-until-due axis. Dots left of Today are overdue; the further right, the more runway. Cases that share a deadline window stack vertically. 62 of the docket's apps have a known mailing date.
Difficulty is derived from the rejection statutes on the most recent pending office action. §101-driven and multi-statute cases are graded Hard; §112-only and obviousness-type double-patenting cases are graded Easy; everything else is Medium. "Unknown" means we have not yet parsed a statute for that office action.
| Bucket | Cases |
|---|---|
| §101 only | 3 (2%) |
| §101 + other | 18 (9%) |
| §103 only | 55 (28%) |
| §102 only | 22 (11%) |
| §112 only | 9 (5%) |
| Double-patenting only | 1 (1%) |
| Double-patenting + other | 3 (2%) |
| Multi-statute (no §101) | 82 (42%) |
How the docket's pending cases split across USPTO tech-center bands.
Manual office-action response work runs about 10 hours per case. The time-saved bands below show what IP Author's prosecution pipeline typically delivers — a conservative 20% on the low end, 35% in the middle, 50% on the high end.
| Examiner | Apps on this docket | Allow rate | Interview lift |
|---|---|---|---|
| WHITESELL, STEVEN H | 10 | 81.9% | +12.9% |
| PERSAUD, DEORAM | 8 | 76.8% | +11.8% |
| RIDDLE, CHRISTINA A | 8 | 80.8% | +13.8% |
| MCCORMACK, JASON L | 8 | 84.6% | +7.9% |
| ASFAW, MESFIN T | 7 | 82.8% | +14.0% |
| LI, LARRY | 5 | 100.0% | +0.0% |
| KIM, PETER B | 4 | 82.9% | +9.3% |
| WANG, JING | 4 | 100.0% | +0.0% |
| OSENBAUGH-STEWART, ELIZA W | 4 | 73.3% | +16.2% |
| CHOI, JAMES J | 4 | 67.9% | +45.1% |
Cases in front of an examiner with an allow rate of 80%+ where the difficulty is Easy or Medium. The top 8 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18842640 | APPARATUS AND METHODS FOR FILTERING MEASUREMENT RADIATION | WHITESELL, STEVEN H | 9d overdue |
| 18515952 | Transport System Having a Magnetically Levitated Transportation Stage | WHITESELL, STEVEN H | 1d overdue |
| 18320157 | INSPECTION METHOD AND INSPECTION TOOL | MCCORMACK, JASON L | 14d |
| 18844478 | SETUP AND CONTROL METHODS FOR A LITHOGRAPHIC PROCESS AND ASSOCIATED APPARATUSES | ASFAW, MESFIN T | 30d |
| 17922580 | SUBSTRATE SUPPORT SYSTEM, LITHOGRAPHIC APPARATUS AND METHOD OF EXPOSING A SUBSTRATE | RIDDLE, CHRISTINA A | 55d |
| 19008794 | APPARATUS AND METHOD FOR PROCESS-WINDOW CHARACTERIZATION | ASFAW, MESFIN T | — |
| 18869304 | CABLE SLAB, POSITIONING MODULE AND LITHOGRAPHIC APPARATUS | ASFAW, MESFIN T | — |
| 18911806 | CHARGED PARTICLE BEAM APPARATUS WITH MULTIPLE DETECTORS AND METHODS FOR IMAGING | MCCORMACK, JASON L | — |
Multi-statute / §101-driven matters, or cases in front of an examiner with an allow rate under 30%. The top 8 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18565951 | INSPECTION DATA FILTERING SYSTEMS AND METHODS | BHATNAGAR, ANAND P | 100d overdue |
| 17623829 | SUB-FIELD CONTROL OF A LITHOGRAPHIC PROCESS AND ASSOCIATED APPARATUS | TAN, ALVIN H | 99d overdue |
| 18265431 | FEATURE EXTRACTION METHOD FOR EXTRACTING FEATURE VECTORS FOR IDENTIFYING PATTERN OBJECTS | LIEW, ALEX KOK SOON | 93d overdue |
| 18511454 | PROCESS WINDOW BASED ON DEFECT PROBABILITY | WHITESELL, STEVEN H | 88d overdue |
| 17632632 | METHOD AND APPARATUS FOR PHOTOLITHOGRAPHIC IMAGING | WHITE, JAY MICHAEL | 86d overdue |
| 17794435 | CHARGED PARTICLE MANIPULATOR DEVICE | OSENBAUGH-STEWART, ELIZA W | 72d overdue |
| 18705509 | DETERMINING AN ETCH EFFECT BASED ON AN ETCH BIAS DIRECTION | ASFAW, MESFIN T | 60d overdue |
| 18719902 | METHOD AND APPARATUS FOR LITHOGRAPHIC IMAGING | KIM, PETER B | 53d overdue |
Cases in front of an examiner whose interview lift is 10 percentage points or more — i.e. interviewed cases historically resolve more favorably than non-interviewed ones. The top 8 ordered by deadline are shown.
| App # | Title | Examiner | Due in |
|---|---|---|---|
| 18511454 | PROCESS WINDOW BASED ON DEFECT PROBABILITY | WHITESELL, STEVEN H | 88d overdue |
| 17794435 | CHARGED PARTICLE MANIPULATOR DEVICE | OSENBAUGH-STEWART, ELIZA W | 72d overdue |
| 18705509 | DETERMINING AN ETCH EFFECT BASED ON AN ETCH BIAS DIRECTION | ASFAW, MESFIN T | 60d overdue |
| 18842640 | APPARATUS AND METHODS FOR FILTERING MEASUREMENT RADIATION | WHITESELL, STEVEN H | 9d overdue |
| 18578780 | APPARATUS AND METHOD FOR PREPARING AND CLEANING A COMPONENT | RIDDLE, CHRISTINA A | 2d overdue |
| 18064110 | REPLACEABLE MODULE FOR A CHARGED PARTICLE APPARATUS | OSENBAUGH-STEWART, ELIZA W | 2d overdue |
| 18515952 | Transport System Having a Magnetically Levitated Transportation Stage | WHITESELL, STEVEN H | 1d overdue |
| 17798538 | CHARGED PARTICLE ASSESSMENT TOOL, INSPECTION METHOD | OSENBAUGH-STEWART, ELIZA W | 5d |
| Art Unit | Apps |
|---|---|
| 2881 | 25 |
| 2877 | 20 |
| 2882 | 20 |
| 2851 | 8 |
| 1759 | 7 |
| 2878 | 6 |
| 1737 | 4 |
| 1716 | 3 |
| 3723 | 2 |
| 2668 | 2 |
| App # | Title | Examiner | Art Unit | Statutes | Status | Due in | AI | Filed |
|---|---|---|---|---|---|---|---|---|
| 19011092 | SUBSTRATE HOLDER FOR USE IN A LITHOGRAPHIC APPARATUS | WHITESELL, STEVEN H | — | §102§103Other | Non-Final OA | — | Pending | Jan 06, 2025 |
| 19008794 | APPARATUS AND METHOD FOR PROCESS-WINDOW CHARACTERIZATION | ASFAW, MESFIN T | — | §102 | Non-Final OA | — | Pending | Jan 03, 2025 |
| 19009394 | LITHOGRAPHIC APPARATUS AND METHOD | PERSAUD, DEORAM | — | §103Other | Non-Final OA | — | Pending | Jan 03, 2025 |
| 18876196 | PARAMETERIZED INSPECTION IMAGE SIMULATION | CRAWFORD, JACINTA M | — | §103 | Non-Final OA | — | Pending | Dec 18, 2024 |
| 18876559 | PROJECTION SYSTEM CONTROL | ASFAW, MESFIN T | — | §102§103 | Non-Final OA | — | Pending | Dec 18, 2024 |
| 18876622 | A MULTI-PASS RADIATION DEVICE | DOUMBIA, MOHAMED | 2877 | §103§112 | Non-Final OA | — | Pending | Dec 18, 2024 |
| 18876007 | ILLUMINATION ADJUSTMENT APPARATUSES AND LITHOGRAPHIC APPARATUSES | RIDDLE, CHRISTINA A | — | §102§103§112 | Non-Final OA | — | Pending | Dec 17, 2024 |
| 18875576 | CONTROL METHOD AND CONTROL SYSTEM FOR CONTROLLING A POSITION OF AN OBJECT WITH AN ELECTROMAGNETIC ACTUATOR | ASFAW, MESFIN T | — | §101§102§103 | Non-Final OA | — | Pending | Dec 16, 2024 |
| 18875601 | A PATTERNING DEVICE VOLTAGE BIASING SYSTEM FOR USE IN EUV LITHOGRAPHY | RIDDLE, CHRISTINA A | — | §102§103§112 | Non-Final OA | — | Pending | Dec 16, 2024 |
| 18983297 | ACTUATOR ASSEMBLIES COMPRISING PIEZO ACTUATORS OR ELECTROSTRICTIVE ACTUATORS | WHITESELL, STEVEN H | — | §101§103§112 | Non-Final OA | — | Pending | Dec 16, 2024 |
| 18873597 | FOCUS MEASURMENT AND CONTROL IN METROLOGY AND ASSOCIATED WEDGE ARRANGEMENT | WHITESELL, STEVEN H | — | §103§112 | Non-Final OA | — | Pending | Dec 10, 2024 |
| 18870089 | METROLOGY SYSTEM USING MULTIPLE RADIATION SPOTS | COOK, JONATHON | 2877 | §103§112 | Non-Final OA | — | Pending | Nov 27, 2024 |
| 18962837 | CLEANING A STRUCTURE SURFACE IN AN EUV CHAMBER | RIDDLE, CHRISTINA A | 2882 | §102§103Other | Non-Final OA | — | Pending | Nov 27, 2024 |
| 18870245 | SYSTEM, APPARATUS AND METHOD FOR SELECTIVE SURFACE TREATMENT | PERSAUD, DEORAM | 2882 | §102§103 | Non-Final OA | — | Pending | Nov 27, 2024 |
| 18960519 | CALIBRATION SYSTEM FOR AN EXTREME ULTRAVIOLET LIGHT SOURCE | BOOSALIS, FANI POLYZOS | — | §102§103 | Non-Final OA | — | Pending | Nov 26, 2024 |
| 18869304 | CABLE SLAB, POSITIONING MODULE AND LITHOGRAPHIC APPARATUS | ASFAW, MESFIN T | 2882 | §103 | Non-Final OA | — | Pending | Nov 26, 2024 |
| 18868801 | PLASMA SHIELDING FOR AN ELECTROSTATIC MEMS DEVICE | TANINGCO, MARCUS H | 2884 | §102§103§112 | Non-Final OA | — | Pending | Nov 25, 2024 |
| 18868800 | CALIBRATION METHOD AND APPARATUS | UNDERWOOD, JARREAS C | 2877 | §102§103§112 | Non-Final OA | — | Pending | Nov 25, 2024 |
| 18868977 | METHOD FOR ALIGNING AN ILLUMINATION-DETECTION SYSTEM OF A METROLOGY DEVICE AND ASSOCIATED METROLOGY DEVICE | PERSAUD, DEORAM | 2882 | §102 | Non-Final OA | — | Pending | Nov 25, 2024 |
| 18867005 | METHOD AND SYSTEM FOR REDUCING CHARGING ARTIFACT IN INSPECTION IMAGE | BROUGHTON, KATHLEEN M | — | §103 | Non-Final OA | — | Pending | Nov 19, 2024 |
| 18867001 | SYSTEM AND METHOD FOR DISTORTION ADJUSTMENT DURING INSPECTION | VANCHY JR, MICHAEL J | — | §103 | Non-Final OA | — | Pending | Nov 18, 2024 |
| 18866490 | SYSTEM AND METHOD FOR COUNTING PARTICLES ON A DETECTOR DURING INSPECTION | MAUPIN, HUGH H | — | §103 | Non-Final OA | — | Pending | Nov 15, 2024 |
| 18861173 | MEASUREMENT OF FABRICATION PARAMETERS BASED ON MOIRÉ INTERFERENCE PATTERN COMPONENTS | COOK, JONATHON | 2877 | §102§103 | Non-Final OA | — | Pending | Oct 28, 2024 |
| 18860879 | MECHATRONIC SYSTEM CONTROL METHOD, LITHOGRAPHIC APPARATUS CONTROL METHOD AND LITHOGRAPHIC APPARATUS | NGUYEN, BAO LONG T | — | §103§112 | Non-Final OA | — | Pending | Oct 28, 2024 |
| 18860248 | OPTICAL ARRANGEMENT FOR A METROLOGY SYSTEM | BAGHDASARYAN, HOVHANNES | — | §103 | Non-Final OA | — | Pending | Oct 25, 2024 |
| 18859981 | PASSIVE INTEGRATED OPTICAL SYSTEMS AND METHODS FOR REDUCTION OF SPATIAL OPTICAL COHERENCE | ASFAW, MESFIN T | 2882 | §102§103 | Final Rejection | — | Pending | Oct 24, 2024 |
| 18859655 | MIRROR ASSEMBLY FOR MICROMIRROR ARRAY | WHITESELL, STEVEN H | 1759 | §102§103 | Non-Final OA | — | Pending | Oct 24, 2024 |
| 18859954 | SYSTEM AND METHOD FOR IMPROVING IMAGE QUALITY DURING INSPECTION | CASCAIS, JUSTIN PHILIP | — | §103Other | Non-Final OA | — | Pending | Oct 24, 2024 |
| 18857065 | SYSTEMS, METHODS, AND SOFTWARE FOR MULTILAYER METROLOGY | CODRINGTON, SHANE WRENSFORD | — | §102§103§112 | Non-Final OA | — | Pending | Oct 15, 2024 |
| 18856459 | A LITHOGRAPHIC APPARATUS, AN INSPECTION SYSTEM, AND A DETECTOR HAVING A SQUARE-CORE FIBER | AKANBI, ISIAKA O | 2877 | §103 | Final Rejection | — | Pending | Oct 11, 2024 |
| 18911806 | CHARGED PARTICLE BEAM APPARATUS WITH MULTIPLE DETECTORS AND METHODS FOR IMAGING | MCCORMACK, JASON L | — | §103 | Non-Final OA | — | Pending | Oct 10, 2024 |
| 18855565 | CONFIGURABLE PRINTED OPTICAL ROUTING FOR PARALLEL OPTICAL DETECTION | AKANBI, ISIAKA O | 2877 | §102 | Non-Final OA | — | Pending | Oct 09, 2024 |
| 18855625 | CHARGED-PARTICLE BEAM APPARATUS WITH LARGE FIELD-OF-VIEW AND METHODS THEREOF | LI, LARRY | — | §112 | Non-Final OA | — | Pending | Oct 09, 2024 |
| 18908931 | Imprint Apparatus with Movable Stages | CHIDIAC, NICHOLAS J | 1744 | §103DPOther | Non-Final OA | 76d | AI Ready | Oct 08, 2024 |
| 18907436 | SENSOR SUBSTRATE, APPARATUS, AND METHOD | IPPOLITO, NICOLE MARIE | — | §102 | Non-Final OA | — | Pending | Oct 04, 2024 |
| 18854000 | WAFER EDGE INSPECTION OF CHARGED PARTICLE INSPECTION SYSTEM | LI, LARRY | — | §112 | Non-Final OA | — | Pending | Oct 03, 2024 |
| 18853923 | IMAGING METHOD AND METROLOGY DEVICE | KAUR, JASPREET | — | §101§103 | Non-Final OA | — | Pending | Oct 03, 2024 |
| 18890506 | CHARGED PARTICLE APPARATUS AND METHOD | MCCORMACK, JASON L | — | §102§103§112 | Non-Final OA | — | Pending | Sep 19, 2024 |
| 18848095 | ILLUMINATION ARRANGEMENT FOR A METROLOGY DEVICE AND ASSOCIATED METHOD | AMARA, MOHAMED K | 2877 | §102 | Final Rejection | 22d | AI Ready | Sep 17, 2024 |
| 18848085 | A METHOD FOR DETERMINING A VERTICAL POSITION OF A STRUCTURE ON A SUBSTRATE AND ASSOCIATED APPARATUSES | AHMED, JAMIL | 2877 | §102 | Non-Final OA | 9d overdue | AI Ready | Sep 17, 2024 |
| 18882681 | FULLY AUTOMATED SEM SAMPLING SYSTEM FOR E-BEAM IMAGE ENHANCEMENT | HSIEH, PING Y | — | §103Other | Non-Final OA | — | Pending | Sep 11, 2024 |
| 18844478 | SETUP AND CONTROL METHODS FOR A LITHOGRAPHIC PROCESS AND ASSOCIATED APPARATUSES | ASFAW, MESFIN T | 2882 | §102 | Final Rejection | 30d | Pending | Sep 06, 2024 |
| 18844195 | EUV Light Source Target Metrology | MCCORMACK, JASON L | — | §103§112 | Non-Final OA | — | Pending | Sep 05, 2024 |
| 18843138 | INSPECTION APPARATUS, LINEARLY MOVABLE BEAM DISPLACER, AND METHOD | AYUB, HINA F | 2877 | §102§103 | Non-Final OA | — | Pending | Aug 30, 2024 |
| 18842640 | APPARATUS AND METHODS FOR FILTERING MEASUREMENT RADIATION | WHITESELL, STEVEN H | 1759 | §103 | Final Rejection | 9d overdue | AI Ready | Aug 29, 2024 |
| 18818079 | LASER SYSTEM FOR TARGET METROLOGY AND ALTERATION IN AN EUV LIGHT SOURCE | VANORE, DAVID A | — | §102 | Non-Final OA | — | Pending | Aug 28, 2024 |
| 18808844 | Metrology Apparatus And Method For Determining A Characteristic Of One Or More Structures On A Substrate | ITSKOVICH, MIKHAIL | 2483 | §103 | Non-Final OA | — | Pending | Aug 19, 2024 |
| 18838459 | SYSTEMS AND METHODS FOR DEFECT LOCATION BINNING IN CHARGED-PARTICLE SYSTEMS | ANYIKIRE, CHIKAODILI E | — | §102 | Non-Final OA | — | Pending | Aug 14, 2024 |
| 18838135 | INSPECTION TOOL AND BARRIER FOR USE THEREIN | HANSEN, JONATHAN M | 2877 | §102§103 | Final Rejection | 9d | AI Ready | Aug 13, 2024 |
| 18837576 | IMAGE ANALYSIS BASED ON ADAPTIVE WEIGHTING OF TEMPLATE CONTOURS | BEKELE, MEKONEN T | — | §102§103 | Non-Final OA | — | Pending | Aug 09, 2024 |
| 18835287 | INSPECTION APPARATUS, MOTORIZED APERTURES, AND METHOD BACKGROUND | KIM, PETER B | 2882 | §102§103 | Non-Final OA | 11d overdue | Pending | Aug 01, 2024 |
| 18790520 | EUV LITHOGRAPHY SYSTEM HAVING A GAS-BINDING COMPONENT | PERSAUD, DEORAM | 2882 | §102§103 | Final Rejection | — | Pending | Jul 31, 2024 |
| 18834970 | METROLOGY METHOD AND ASSOCIATED METROLOGY DEVICE | GARCIA, SANTIAGO | — | §102 | Non-Final OA | — | Pending | Jul 31, 2024 |
| 18834131 | FIELD OF VIEW SELECTION FOR METROLOGY ASSOCIATED WITH SEMICONDUCTOR MANUFACTURING | LANTZ, KARSTEN FOSTER | 2664 | §103 | Non-Final OA | — | Pending | Jul 29, 2024 |
| 18834171 | METROLOGY METHOD AND ASSOCIATED METROLOGY DEVICE | TRAN, MAI THI NGOC | — | §102§103 | Non-Final OA | — | Pending | Jul 29, 2024 |
| 18724495 | OBJECT HOLDER, LITHOGRAPHIC APPARATUS COMPRISING SUCH OBJECT HOLDER AND METHODS FOR AN OBJECT HOLDER | NGUYEN, DANNY | 2838 | §103 | Final Rejection | — | Pending | Jun 26, 2024 |
| 18724551 | ELEMENT OF AN AFM TOOL | SMITH, DAVID E | — | §103§112 | Non-Final OA | — | Pending | Jun 26, 2024 |
| 18751031 | SYSTEMS AND METHODS OF CLEANING ELECTRON SOURCES IN CHARGED-PARTICLE BEAM SYSTEMS | SMYTH, ANDREW P | — | §102§103 | Non-Final OA | — | Pending | Jun 21, 2024 |
| 18748694 | METHOD OF PROCESSING A SAMPLE, AND CHARGED PARTICLE ASSESSMENT SYSTEM | MCCORMACK, JASON L | — | §112 | Non-Final OA | — | Pending | Jun 20, 2024 |
| 18720941 | SUBSTRATE COMPRISING A TARGET ARRANGEMENT, ASSOCIATED PATTERNING DEVICE AND METROLOGY METHOD | HANSEN, JONATHAN M | 2877 | §102§103 | Non-Final OA | — | Pending | Jun 17, 2024 |
| 18719902 | METHOD AND APPARATUS FOR LITHOGRAPHIC IMAGING | KIM, PETER B | 2882 | §102§103 | Final Rejection | 53d overdue | Pending | Jun 14, 2024 |
| 18742934 | CHARGED-PARTICLE APPARATUS, MULTI-DEVICE APPARATUS, METHOD OF USING CHARGED-PARTICLE APPARATUS AND CONTROL METHOD | IPPOLITO, NICOLE MARIE | — | §112 | Non-Final OA | — | Pending | Jun 13, 2024 |
| 18741204 | CHARGED PARTICLE ASSESSMENT SYSTEM AND METHOD | IPPOLITO, NICOLE MARIE | — | §112 | Non-Final OA | — | Pending | Jun 12, 2024 |
| 18716468 | APERTURE AND METHOD | GASSEN, CHRISTOPHER J | — | §102§103§112 | Non-Final OA | — | Pending | Jun 04, 2024 |
| 18716007 | TARGET ASYMMETRY MEASUREMENT FOR SUBSTRATE ALIGNMENT IN LITHOGRAPHY SYSTEMS | PEREZ-GUZMAN, CARLOS GABRIEL | — | §102§103 | Non-Final OA | — | Pending | Jun 03, 2024 |
| 18716117 | A FRAMEWORK FOR CONDITION TUNING AND IMAGE PROCESSING FOR METROLOGY APPLICATIONS | SUN, JIANGENG | 2671 | §102§103§112 | Non-Final OA | — | Pending | Jun 03, 2024 |
| 18674282 | PLATFORM FOR CHARGED PARTICLE APPARATUS AND COMPONENTS WITHIN A CHARGED PARTICLE APPARATUS | WANG, JING | — | §102§103§112 | Non-Final OA | — | Pending | May 24, 2024 |
| 18712765 | IDENTIFYING DEVIATING MODULES FROM A REFERENCE POPULATION FOR MACHINE DIAGNOSTICS | AGRAWAL, SHISHIR | — | §103 | Non-Final OA | — | Pending | May 23, 2024 |
| 18713127 | THERMAL CONTROL SYSTEMS, MODELS, AND MANUFACTURING PROCESSES IN LITHOGRAPHY | HARTMAN JR, RONALD D | — | §103 | Non-Final OA | — | Pending | May 23, 2024 |
| 18713108 | CHARGED-PARTICLE BEAM APPARATUS FOR VOLTAGE-CONTRAST INSPECTION AND METHODS THEREOF | NAVARRO, HUGO IVAN | 2858 | §103§112 | Non-Final OA | 45d overdue | AI Ready | May 23, 2024 |
| 18709792 | VALVES WITH REDUCED PARTICLE GENERATION AND INCREASED CYCLE LIFE | BASTIANELLI, JOHN | 3753 | §102§103 | Non-Final OA | 56d | AI Ready | May 13, 2024 |
| 18661389 | ALIGNING A DISTORTED IMAGE | NGUYEN, KIET TUAN | 2881 | §102 | Non-Final OA | — | Pending | May 10, 2024 |
| 18707651 | A LIQUID TARGET MATERIAL SUPPLYING APPARATUS, FUEL EMITTER, RADIATION SOURCE, LITHOGRAPHIC APPARATUS, AND LIQUID TARGET MATERIAL SUPPLYING METHOD | LI, LARRY | 2881 | §103§112 | Non-Final OA | — | Pending | May 06, 2024 |
| 18706592 | WAFER EDGE INSPECTION OF CHARGED PARTICLE INSPECTION SYSTEM | LI, LARRY | 2881 | §112 | Non-Final OA | — | Pending | May 01, 2024 |
| 18705509 | DETERMINING AN ETCH EFFECT BASED ON AN ETCH BIAS DIRECTION | ASFAW, MESFIN T | 2882 | §101§102 | Final Rejection | 60d overdue | Pending | Apr 26, 2024 |
| 18703486 | GENERATING AUGMENTED DATA TO TRAIN MACHINE LEARNING MODELS TO PRESERVE PHYSICAL TRENDS | CODRINGTON, SHANE WRENSFORD | — | §103 | Non-Final OA | — | Pending | Apr 22, 2024 |
| 18639657 | DETECTOR ASSEMBLY, CHARGED PARTICLE DEVICE, APPARATUS, AND METHODS | MCCORMACK, JASON L | 2881 | §112 | Non-Final OA | — | Pending | Apr 18, 2024 |
| 18700125 | ELECTRICAL CONNECTOR FOR HIGH POWER IN A VACUUM ENVIRONMENT AND METHOD | NGUYEN, THANG H | — | §103 | Non-Final OA | — | Pending | Apr 10, 2024 |
| 18699358 | LITHOGRAPHIC APPARATUS AND ASSOCIATED METHODS | RIDDLE, CHRISTINA A | 2882 | §102§103 | Final Rejection | 28d | Pending | Apr 08, 2024 |
| 18618957 | CHARGED PARTICLE APPARATUS AND METHOD | WANG, JING | 2881 | §103§112 | Final Rejection | 13d | AI Ready | Mar 27, 2024 |
| 18691828 | SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATION AND IDENTIFICATION IN A CHARGED PARTICLE SYSTEM | WANG, JING | 2881 | §103 | Final Rejection | — | Pending | Mar 13, 2024 |
| 18690873 | OPTICAL MODULE FOR EXTREME ULTRAVIOLET LIGHT SOURCE | RICKEL, ALEX PARK | 2881 | §103§112 | Non-Final OA | — | Pending | Mar 11, 2024 |
| 18691002 | SOURCE SELECTION MODULE AND ASSOCIATED METROLOGY AND LITHOGRAPHIC APPARATUSES | MENDOZA, ALEXANDRIA ARELLANO | 2877 | §103 | Final Rejection | 121d overdue | Pending | Mar 11, 2024 |
| 18596467 | PATTERNING DEVICE DEFECT DETECTION SYSTEMS AND METHODS | KALISZEWSKI, ALINA ROSE | 2881 | §102§103 | Final Rejection | — | Pending | Mar 05, 2024 |
| 18596540 | SEM IMAGE ENHANCEMENT | MCCORMACK, JASON L | 2881 | §102 | Non-Final OA | — | Pending | Mar 05, 2024 |
| 18687727 | THERMAL CONDITIONING UNIT, SUBSTRATE HANDLING DEVICE AND LITHOGRAPHIC APPARATUS | PERSAUD, DEORAM | 2882 | §102§103 | Non-Final OA | — | Pending | Feb 28, 2024 |
| 18686742 | METROLOGY SYSTEM, LITHOGRAPHIC APPARATUS, AND METHOD | STOCK JR, GORDON J | 2877 | DP | Non-Final OA | 42d overdue | Pending | Feb 26, 2024 |
| 18684558 | METHOD FOR CONVERTING METROLOGY DATA | WASAFF, JOHN S. | — | §101§102§103 | Non-Final OA | — | Pending | Feb 16, 2024 |
| 18684391 | COMPENSATING OPTICAL SYSTEM FOR NONUNIFORM SURFACES, A METROLOGY SYSTEM, LITHOGRAPHIC APPARATUS, AND METHODS THEREOF | STOCK JR, GORDON J | 2877 | §102§103 | Final Rejection | 43d overdue | Pending | Feb 16, 2024 |
| 18291534 | METROLOGY METHOD AND METROLOGY DEVICE | SMITH, MAURICE C | — | §102 | Non-Final OA | — | Pending | Jan 23, 2024 |
| 18578947 | LITHOGRAPHY SYSTEM, SUBSTRATE SAG COMPENSATOR, AND METHOD | PERSAUD, DEORAM | 2882 | §103 | Non-Final OA | — | Pending | Jan 12, 2024 |
| 18578780 | APPARATUS AND METHOD FOR PREPARING AND CLEANING A COMPONENT | RIDDLE, CHRISTINA A | 2882 | §102§103§112 | Final Rejection | 2d overdue | Pending | Jan 12, 2024 |
| 18578299 | METHOD FOR GENERATING MASK PATTERN | WALKE, AMANDA C | — | §103 | Non-Final OA | — | Pending | Jan 10, 2024 |
| 18577678 | IMAGE DISTORTION CORRECTION IN CHARGED PARTICLE INSPECTION | LAM, ANDREW H | 2682 | §103 | Non-Final OA | 40d | AI Ready | Jan 08, 2024 |
| 18407323 | METHOD FOR DECOUPLING SOURCES OF VARIATION RELATED TO SEMICONDUCTOR MANUFACTURING | CHOI, ALICIA M | 2117 | §101 | Final Rejection | — | Pending | Jan 08, 2024 |
| 18576266 | DROPLET DETECTION METROLOGY UTILIZING METROLOGY BEAM SCATTERING | BRYANT, REBECCA CAROLE | 2877 | §102§103 | Non-Final OA | — | Pending | Jan 03, 2024 |
| 18402585 | CHARGED PARTICLE-OPTICAL DEVICE, CHARGED PARTICLE APPARATUS AND METHOD | WANG, JING | 2881 | §103§112 | Non-Final OA | — | Pending | Jan 02, 2024 |
| 18397896 | CHARGED PARTICLE ASSESSMENT SYSTEM AND METHOD OF ALIGNING A SAMPLE IN A CHARGED PARTICLE ASSESSMENT SYSTEM | STOFFA, WYATT A | 2881 | §102§112 | Final Rejection | 31d overdue | AI Ready | Dec 27, 2023 |
| 18571649 | METROLOGY METHOD AND DEVICE | WALKE, AMANDA C | — | §102 | Non-Final OA | — | Pending | Dec 18, 2023 |
| 18571118 | METHOD OF DETERMINING A CORRECTION FOR AT LEAST ONE CONTROL PARAMETER IN A SEMICONDUCTOR MANUFACTURING PROCESS | YANCHUS III, PAUL B | 2115 | §101§102§103 | Non-Final OA | 1d overdue | Pending | Dec 15, 2023 |
| 18570140 | STRUCTURES FOR USE ON A SUBSTRATE HOLDER, SUBSTRATE HOLDER, LITHOGRAPHIC APPARATUS AND METHOD | KIM, PETER B | 2882 | §102§103 | Final Rejection | 8d | Pending | Dec 14, 2023 |
| 18570289 | AN ILLUMINATION SOURCE AND ASSOCIATED METHOD APPARATUS | KIM, PETER B | 2876 | §102§103 | Non-Final OA | — | Pending | Dec 14, 2023 |
| 18569484 | HOLDING DEVICE FOR HOLDING A STRUCTURAL PART AND METHOD FOR MANUFACTURING THE HOLDING DEVICE | SHUM, KENT N | 3723 | §102§103§112 | Non-Final OA | — | Pending | Dec 12, 2023 |
| 18533662 | OBJECT TABLE, A STAGE APPARATUS AND A LITHOGRAPHIC APPARATUS | WHITESELL, STEVEN H | 1759 | §102§103§112 | Final Rejection | — | Pending | Dec 08, 2023 |
| 18567053 | METHOD AND ARRANGEMENT FOR DETERMINING THERMALLY-INDUCED DEFORMATIONS | PERSAUD, DEORAM | 2882 | §101§102§103 | Final Rejection | 28d | Pending | Dec 05, 2023 |
| 18530109 | CHARGED PARTICLE APPARATUS AND METHOD | OSENBAUGH-STEWART, ELIZA W | 2881 | §102§103§112 | Non-Final OA | — | Pending | Dec 05, 2023 |
| 18565759 | METHOD FOR GENERATING ASSIST FEATURES USING MACHINE LEARNING MODEL | HARPER, ELIYAH STONE | — | §102 | Non-Final OA | — | Pending | Nov 30, 2023 |
| 18565951 | INSPECTION DATA FILTERING SYSTEMS AND METHODS | BHATNAGAR, ANAND P | 2668 | §101 | Final Rejection | 100d overdue | Pending | Nov 30, 2023 |
| 18565494 | ETCHING SYSTEMS, MODELS, AND MANUFACTURING PROCESSES | DINH, PAUL | — | §102§103 | Non-Final OA | — | Pending | Nov 29, 2023 |
| 18563841 | MANIPULATION OF CARRIER TRANSPORT BEHAVIOR IN DETECTOR | STOFFA, WYATT A | 2881 | §102 | Non-Final OA | — | Pending | Nov 22, 2023 |
| 18517642 | CHARGED PARTICLE DEVICE AND METHOD | LI, LARRY | 2881 | §103 | Non-Final OA | — | Pending | Nov 22, 2023 |
| 18515952 | Transport System Having a Magnetically Levitated Transportation Stage | WHITESELL, STEVEN H | 1759 | §103 | Final Rejection | 1d overdue | Pending | Nov 21, 2023 |
| 18561892 | METROLOGY MEASUREMENT METHOD AND APPARATUS | RIZVI, AKBAR HASSAN | — | §101§102§103 | Non-Final OA | — | Pending | Nov 17, 2023 |
| 18511454 | PROCESS WINDOW BASED ON DEFECT PROBABILITY | WHITESELL, STEVEN H | 1759 | §101 | Final Rejection | 88d overdue | Pending | Nov 16, 2023 |
| 18559942 | DIFFRACTION GRATING FOR MEASUREMENTS IN EUV-EXPOSURE APPARATUSES | CARLSON, JOSHUA MICHAEL | 2877 | §103§112 | Final Rejection | — | Pending | Nov 09, 2023 |
| 18289765 | METROLOGY METHOD AND ASSOCIATED METROLOGY TOOL | STOCK JR, GORDON J | 2800 | §102 | Non-Final OA | — | Pending | Nov 07, 2023 |
| 18289112 | HYBRID PHOTORESIST COMPOSITION FOR EXTREME ULTRAVIOLET PHOTOLITHOGRAPHY APPLICATIONS | CHU, JOHN S Y | — | §112 | Non-Final OA | — | Pending | Oct 31, 2023 |
| 18287613 | CAUSAL CONVOLUTION NETWORK FOR PROCESS CONTROL | ALAM, MOHAMMED | — | §103 | Non-Final OA | — | Pending | Oct 19, 2023 |
| 18287166 | METHOD FOR DETERMINING A STOCHASTIC METRIC RELATING TO A LITHOGRAPHIC PROCESS | ADAMS, EILEEN M | 2481 | §103 | Final Rejection | — | Pending | Oct 16, 2023 |
| 18286485 | SURFACE TREATMENT DEVICE AND METHOD | JUNG, MICHAEL YOO LIM | 2817 | §102§103§112 | Non-Final OA | — | Pending | Oct 11, 2023 |
| 18284839 | ON SYSTEM SELF-DIAGNOSIS AND SELF-CALIBRATION TECHNIQUE FOR CHARGED PARTICLE BEAM SYSTEMS | VANORE, DAVID A | 2878 | §101§112 | Final Rejection | 28d | AI Ready | Sep 28, 2023 |
| 18475068 | METHOD AND APPARATUS FOR FORMING A PATTERNED LAYER OF CARBON, METHOD OF FORMING A PATTERNED LAYER OF MATERIAL | POWERS, LAURA C | 1785 | §112 | Final Rejection | — | Pending | Sep 26, 2023 |
| 18369619 | FLOOD COLUMN AND CHARGED PARTICLE APPARATUS | CHOI, JAMES J | 2878 | §103 | Final Rejection | 83d | AI Ready | Sep 18, 2023 |
| 18282305 | METHOD AND SYSTEM FOR PREDICTING PROCESS INFORMATION WITH A PARAMETERIZED MODEL | GARBOWSKI, LEIGH M | — | §102§112 | Non-Final OA | — | Pending | Sep 15, 2023 |
| 18281519 | A METHOD FOR MODELING MEASUREMENT DATA OVER A SUBSTRATE AREA AND ASSOCIATED APPARATUSES | NGUYEN, NHA T | — | §103 | Non-Final OA | — | Pending | Sep 11, 2023 |
| 18280266 | DATA FILTER FOR SCANNING METROLOGY | MANG, LAL C | 2857 | §101§103 | Non-Final OA | — | Pending | Sep 04, 2023 |
| 18278881 | METHOD OF PATTERN SELECTION FOR A SEMICONDUCTOR MANUFACTURING RELATED PROCESS | TAT, BINH C | — | §102 | Non-Final OA | — | Pending | Aug 25, 2023 |
| 18233263 | METHOD AND SYSTEM TO MONITOR A PROCESS APPARATUS | PERSAUD, DEORAM | 2882 | §101§102Other | Final Rejection | 12d | Pending | Aug 11, 2023 |
| 18276018 | A MACHINE LEARNING MODEL USING TARGET PATTERN AND REFERENCE LAYER PATTERN TO DETERMINE OPTICAL PROXIMITY CORRECTION FOR MASK | SALEH, ZAID MUHAMMAD | 2668 | §102§103 | Non-Final OA | 14d | Pending | Aug 04, 2023 |
| 18276014 | METHOD TO PREDICT METROLOGY OFFSET OF A SEMICONDUCTOR MANUFACTURING PROCESS | NGUYEN, NHA T | — | §102§103 | Non-Final OA | — | Pending | Aug 04, 2023 |
| 18365130 | PATTERN GROUPING METHOD BASED ON MACHINE LEARNING | BALI, VIKKRAM | 2663 | §103DPOther | Non-Final OA | — | AI Ready | Aug 03, 2023 |
| 18262511 | A METHOD AND SYSTEM FOR PREDICTING ABERRATIONS IN A PROJECTION SYSTEM | REVERMAN, CHAD ANDREW | 2877 | §103 | Final Rejection | — | Pending | Jul 21, 2023 |
| 18259344 | MODULAR AUTOENCODER MODEL FOR MANUFACTURING PROCESS PARAMETER ESTIMATION | ALSHAHARI, SADIK AHMED | 2121 | §101§103§112Other | Final Rejection | 1d overdue | AI Ready | Jun 26, 2023 |
| 18213765 | ELECTRON-OPTICAL DEVICE | CHOI, JAMES J | 2878 | §103 | Non-Final OA | — | Pending | Jun 23, 2023 |
| 18256865 | CHARGED-PARTICLE BEAM APPARATUS WITH BEAM-TILT AND METHODS THEREOF | MCCORMACK, JASON L | 2881 | §103 | Non-Final OA | — | Pending | Jun 09, 2023 |
| 18331866 | APPARATUS AND METHOD FOR DIRECTING CHARGED PARTICLE BEAM TOWARDS A SAMPLE | SMITH, DAVID E | 2881 | §103 | Final Rejection | 54d | AI Ready | Jun 08, 2023 |
| 18265606 | METHOD OF METROLOGY AND ASSOCIATED APPARATUSES | WHITESELL, STEVEN H | 1759 | §103 | Non-Final OA | — | Pending | Jun 06, 2023 |
| 18265431 | FEATURE EXTRACTION METHOD FOR EXTRACTING FEATURE VECTORS FOR IDENTIFYING PATTERN OBJECTS | LIEW, ALEX KOK SOON | 2674 | §102§103 | Non-Final OA | 93d overdue | Pending | Jun 05, 2023 |
| 18039712 | A METHOD OF MONITORING A LITHOGRAPHIC PROCESS | LE, JOHN H | 2857 | §101§102 | Non-Final OA | 5d | Pending | May 31, 2023 |
| 18203172 | INTERFEROMETER SYSTEM, METHOD OF DETERMINING A MODE HOP OF A LASER SOURCE OF AN INTERFEROMETER SYSTEM, METHOD OF DETERMINING A POSITION OF A MOVABLE OBJECT, AND LITHOGRAPHIC APPARATUS | LYONS, MICHAEL A | 2877 | §102§103§112 | Non-Final OA | 8d overdue | Pending | May 30, 2023 |
| 18038206 | SEMICONDUCTOR CHARGED PARTICLE DETECTOR FOR MICROSCOPY | STOFFA, WYATT A | 2881 | §103§112 | Non-Final OA | 71d | Pending | May 22, 2023 |
| 18320157 | INSPECTION METHOD AND INSPECTION TOOL | MCCORMACK, JASON L | 2881 | §103 | Final Rejection | 14d | AI Ready | May 18, 2023 |
| 18035286 | METHOD OF DETERMINING MARK STRUCTURE FOR OVERLAY FINGERPRINTS | ALAM, MOHAMMED | 2851 | §102 | Non-Final OA | — | Pending | May 03, 2023 |
| 18305925 | LITHOGRAPHIC APPARATUS, METHOD FOR UNLOADING A SUBSTRATE AND METHOD FOR LOADING A SUBSTRATE | SAENZ, ALBERTO | 3723 | §103Other | Final Rejection | — | Pending | Apr 24, 2023 |
| 18033028 | A METHOD FOR MODELING MEASUREMENT DATA OVER A SUBSTRATE AREA AND ASSOCIATED APPARATUSES | CHAVEZ, ANTHONY RAY | — | §101§102§103§112 | Non-Final OA | — | Pending | Apr 20, 2023 |
| 18031865 | METHOD FOR GENERATING MASK PATTERN | LEE, ERIC D | 2851 | §102 | Final Rejection | 36d overdue | Pending | Apr 13, 2023 |
| 18123210 | OBJECTIVE LENS ARRAY ASSEMBLY, ELECTRON-OPTICAL SYSTEM, ELECTRON-OPTICAL SYSTEM ARRAY, METHOD OF FOCUSING, OBJECTIVE LENS ARRANGEMENT | CHOI, JAMES J | 2878 | §103 | Non-Final OA | — | Pending | Mar 17, 2023 |
| 18025636 | VACUUM SYSTEM FOR MITIGATING DAMAGE DUE TO A VACUUM PUMP MALFUNCTION | COMLEY, ALEXANDER BRYANT | 3746 | §102§112 | Final Rejection | 3d overdue | Pending | Mar 09, 2023 |
| 18021537 | CHARGED-PARTICLE INSPECTION APPARATUS | MCDONALD, RODNEY GLENN | 1794 | §103 | Final Rejection | — | AI Ready | Feb 15, 2023 |
| 18018034 | SYSTEMS, PRODUCTS, AND METHODS FOR IMAGE-BASED PATTERN SELECTION | NGUYEN, NHA T | 2851 | §102§103 | Non-Final OA | — | Pending | Jan 25, 2023 |
| 18016811 | METHOD AND APPARATUS FOR IDENTIFYING CONTAMINATION IN A SEMICONDUCTOR FAB | GASSEN, CHRISTOPHER J | 2881 | §102§103§112 | Non-Final OA | 43d overdue | Pending | Jan 18, 2023 |
| 18015162 | METHOD AND APPARATUS FOR CONCEPT DRIFT MITIGATION | TANK, ANDREW L | 2141 | §102§103 | Final Rejection | — | Pending | Jan 09, 2023 |
| 18015313 | APPARATUS AND METHOD FOR SELECTING INFORMATIVE PATTERNS FOR TRAINING MACHINE LEARNING MODELS | LU, ZHIYU | 2665 | §103 | Final Rejection | 84d | Pending | Jan 09, 2023 |
| 18014431 | METHOD OF DETERMINING A CORRECTION STRATEGY IN A SEMICONDUCTOR MANUFACTURING PROCESS AND ASSOCIATED APPARATUSES | PAN, YUHUI R | 2116 | §103 | Final Rejection | 13d | Pending | Jan 04, 2023 |
| 18091716 | METHOD FOR DETERMINING AN ETCH PROFILE OF A LAYER OF A WAFER FOR A SIMULATION SYSTEM | TAT, BINH C | 2851 | §102Other | Non-Final OA | — | Pending | Dec 30, 2022 |
| 18013636 | METHOD FOR CLASSIFYING SEMICONDUCTOR WAFERS | TRAN, DANIEL DUC | 2147 | §101§103§112 | Final Rejection | — | Pending | Dec 29, 2022 |
| 18064110 | REPLACEABLE MODULE FOR A CHARGED PARTICLE APPARATUS | OSENBAUGH-STEWART, ELIZA W | 2881 | §102§103§112 | Non-Final OA | 2d overdue | AI Ready | Dec 09, 2022 |
| 17924626 | SYSTEMS, PRODUCTS, AND METHODS FOR GENERATING PATTERNING DEVICES AND PATTERNS THEREFOR | ALAWDI, ANWER AHMED | 2851 | §102§103 | Final Rejection | 53d overdue | Pending | Nov 10, 2022 |
| 17922768 | OPTICAL ELEMENT AND PELLICLE MEMBRANE FOR A LITHOGRAPHIC APPARATUS | ANGEBRANNDT, MARTIN J | 1737 | §102§103 | Final Rejection | 28d | Pending | Nov 01, 2022 |
| 17922580 | SUBSTRATE SUPPORT SYSTEM, LITHOGRAPHIC APPARATUS AND METHOD OF EXPOSING A SUBSTRATE | RIDDLE, CHRISTINA A | 2882 | §103 | Final Rejection | 55d | Pending | Oct 31, 2022 |
| 17968352 | SEPARATION OF CONTRIBUTIONS TO METROLOGY DATA | LIN, ARIC | 2851 | §103 | Non-Final OA | — | Pending | Oct 18, 2022 |
| 17964783 | ENERGY BAND-PASS FILTERING FOR IMPROVED HIGH LANDING ENERGY BACKSCATTERED CHARGED PARTICLE IMAGE RESOLUTION | SMITH, DAVID E | 2881 | §102§103 | Non-Final OA | — | Pending | Oct 12, 2022 |
| 17918087 | PROCESSING REFERENCE DATA FOR WAFER INSPECTION | DULANEY, KATHLEEN YUAN | 2666 | §102 | Non-Final OA | — | Pending | Oct 10, 2022 |
| 17952129 | FLOOD COLUMN, CHARGED PARTICLE TOOL AND METHOD FOR CHARGED PARTICLE FLOODING OF A SAMPLE | CHOI, JAMES J | 2878 | §103 | Non-Final OA | — | Pending | Sep 23, 2022 |
| 17941897 | APERTURE BODY, FLOOD COLUMN AND CHARGED PARTICLE TOOL | KALISZEWSKI, ALINA ROSE | 2881 | §102§103 | Non-Final OA | — | AI Ready | Sep 09, 2022 |
| 17909352 | BEAM ARRAY GEOMETRY OPTIMIZER FOR MULTI-BEAM INSPECTION SYSTEM | KALISZEWSKI, ALINA ROSE | 2881 | §103 | Final Rejection | — | AI Ready | Sep 02, 2022 |
| 17891961 | INSPECTION APPARATUS | CHANG, HANWAY | 2878 | §102§103 | Final Rejection | — | Pending | Aug 19, 2022 |
| 17799806 | SYSTEMS AND METHODS FOR PROCESS METRIC AWARE PROCESS CONTROL | PATEL, DHRUVKUMAR | 2119 | §102§103 | Final Rejection | 9d overdue | Pending | Aug 15, 2022 |
| 17886348 | MASK DEFECT DETECTION | RIDDLE, CHRISTINA A | 2882 | §103§112 | Non-Final OA | — | Pending | Aug 11, 2022 |
| 17798538 | CHARGED PARTICLE ASSESSMENT TOOL, INSPECTION METHOD | OSENBAUGH-STEWART, ELIZA W | 2881 | §103 | Final Rejection | 5d | Pending | Aug 09, 2022 |
| 17796434 | DETERMINING LITHOGRAPHIC MATCHING PERFORMANCE | ALAWDI, ANWER AHMED | 2851 | §103 | Final Rejection | 125d overdue | Pending | Jul 29, 2022 |
| 17796641 | METROLOGY METHOD AND DEVICE FOR MEASURING A PERIODIC STRUCTURE ON A SUBSTRATE | RUSH, ERIC | 2677 | §103§112 | Non-Final OA | 31d overdue | AI Ready | Jul 29, 2022 |
| 17794435 | CHARGED PARTICLE MANIPULATOR DEVICE | OSENBAUGH-STEWART, ELIZA W | 2881 | §102§103§112 | Non-Final OA | 72d overdue | Pending | Jul 21, 2022 |
| 17792464 | PELLICLE MEMBRANE FOR A LITHOGRAPHIC APPARATUS | ANGEBRANNDT, MARTIN J | 1737 | §102§103§112Other | Final Rejection | 33d | Pending | Jul 13, 2022 |
| 17780287 | METHOD AND SYSTEM FOR ENHANCING TARGET FEATURES OF A PATTERN IMAGED ONTO A SUBSTRATE | ALAWDI, ANWER AHMED | 2851 | §103 | Final Rejection | 3d overdue | Pending | May 26, 2022 |
| 17638472 | SEMICONDUCTOR DEVICE GEOMETRY METHOD AND SYSTEM | COLE, BRANDON S | 2128 | §101§103 | Non-Final OA | 30d overdue | Pending | Feb 25, 2022 |
| 17632632 | METHOD AND APPARATUS FOR PHOTOLITHOGRAPHIC IMAGING | WHITE, JAY MICHAEL | 2188 | §101§102§112 | Final Rejection | 86d overdue | Pending | Feb 03, 2022 |
| 17631557 | METHOD FOR TRAINING MACHINE LEARNING MODEL FOR IMPROVING PATTERNING PROCESS | CRUZ, IRIANA | 2681 | §103 | Final Rejection | — | Pending | Jan 31, 2022 |
| 17623829 | SUB-FIELD CONTROL OF A LITHOGRAPHIC PROCESS AND ASSOCIATED APPARATUS | TAN, ALVIN H | 2118 | §103§112 | Non-Final OA | 99d overdue | Pending | Dec 29, 2021 |
| 17607701 | A PATTERNING DEVICE | ANGEBRANNDT, MARTIN J | 1737 | §103 | Non-Final OA | 103d overdue | Pending | Oct 29, 2021 |
| 17471363 | MACHINE-LEARNING BASED DEFECT IDENTIFICATION | DULANEY, BENJAMIN O | 2683 | §102§103 | Non-Final OA | 70d | Pending | Sep 10, 2021 |
| 17431226 | GAUGE SELECTION FOR MODEL CALIBRATION | MIRABITO, MICHAEL PAUL | 2187 | §101§103 | Final Rejection | — | Pending | Aug 16, 2021 |
| 17419689 | METHOD FOR METROLOGY OPTIMIZATION FOR LITHOGRAPHIC SYSTEMS | KIM, EUNHEE | 2188 | §103§112 | Non-Final OA | — | AI Ready | Jun 29, 2021 |
| 17311422 | APPARATUS AND METHOD FOR GROUPING IMAGE PATTERNS TO DETERMINE WAFER BEHAVIOR IN A PATTERNING PROCESS | LEE, HWA S | 2877 | §103 | Non-Final OA | 55d | Pending | Jun 07, 2021 |
| 16971012 | METHOD AND APPARATUS FOR FORMING A PATTERNED LAYER OF MATERIAL | KACKAR, RAM N | 1716 | §103 | Non-Final OA | 4d overdue | Pending | Aug 19, 2020 |
| 16340702 | A PROCESSING APPARATUS AND A METHOD FOR CORRECTING A PARAMETER VARIATION ACROSS A SUBSTRATE | MOORE, KARLA A | 1716 | §103§112 | Final Rejection | — | Pending | Apr 10, 2019 |
| 16340771 | METHODS & APPARATUS FOR CONTROLLING AN INDUSTRIAL PROCESS | LINDSAY, BERNARD G | 2119 | §103 | Non-Final OA | 28d overdue | Pending | Apr 10, 2019 |
| 18562685 | METROLOGY SYSTEMS, TEMPORAL AND SPATIAL COHERENCE SCRAMBLER AND METHODS THEREOF | SULLIVAN, CALEEN O | — | §102§103 | Non-Final OA | — | Pending | Nov 20, 2023 |
| 18376237 | APPARATUS AND METHOD FOR DETERMINING A CONDITION ASSOCIATED WITH A PELLICLE | RIDDLE, CHRISTINA A | 2882 | §103DP | Final Rejection | — | Pending | Oct 03, 2023 |
| 18280459 | DIGITAL HOLOGRAPHIC MICROSCOPE AND ASSOCIATED METROLOGY METHOD | HANSEN, JONATHAN M | 2877 | §102§103 | Non-Final OA | 50d overdue | Pending | Sep 05, 2023 |
| 17912202 | SYSTEMS AND METHODS FOR FORMING STRUCTURES ON A SURFACE | CHACKO DAVIS, DABORAH | 1737 | §102§103§112 | Final Rejection | 44d overdue | Pending | Sep 16, 2022 |
| 17791641 | LITHOGRAPHIC APPARATUS AND METHOD FOR DRIFT COMPENSATION | WHITESELL, STEVEN H | 1759 | §103 | Final Rejection | — | Pending | Jul 08, 2022 |
| 17438021 | ELECTROSTATIC CLAMP FOR A LITHOGRAPHIC APPARATUS | NUCKOLS, TIFFANY Z | 1716 | §103 | Non-Final OA | — | Pending | Sep 10, 2021 |
IP Author helps IP teams respond to office actions faster with AI-generated responses, examiner analytics, and prosecution intelligence.
Start Free Trial